Teaching digital system test
author
Oyeniran, Adeboye Stephen
Ubar, Raimund-Johannes
Kruus, Margus
statement of authorship
Adeboye Stephen Oyeniran, Raimund Ubar, Margus Kruus
source
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
location of publication
[S.l.]
publisher
IEEE Computer Society
year of publication
2017
pages
[6] p
conference name, date
The 27th EAEEIE Annual Conference, June 7-9, 2017
conference location
Grenoble, France
subject term
süsteemide modelleerimine
mikroprotsessorid
rikked
diagnostika (tehnika)
testimine
keyword
microprocessor
fault models
test generation
fault simulation
software-based self-test
high-level decision diagram
notes
EAEEIE = European Association for Education in Electrical and Information Engineering
TalTech department
arvutisüsteemide instituut
language
inglise