Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation
heading
Oyeniran, A.S., Azad, S.P., Ubar, R.-J.
statement of authorship
Adeboye Stephen Oyeniran, Siavoosh Payandeh Azad, Raimund Ubar
source
2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings
location of publication
Piscataway
publisher
year of publication
pages
5 p.: ill
conference name, date
2018 IEEE International Symposium on Circuits and Systems (ISCAS), 27-30 May, 2018
conference location
Florence, Italy
subject term
WOS
kvartiil
category (general)
category (sub)
subject of form
keyword
ISBN
978-1-5386-4881-0
notes
Bibliogr.: 28 ref
availibility
ei leidu TTÜ Raamatukogus
scientific publication
teaduspublikatsioon
classifier
TTÜ department
TTÜ department code
ia
country
us
language
inglise
report field
aasta2018i
editor's notes
PMi 100419
Oyeniran, A.S., Azad, S.P., Ubar, R.-J. Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation // 2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings. Piscataway : IEEE, 2018. 5 p.: ill.