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Kassikuld võib osutuda elektroonikatööstuses kullast kallimaksKristmann, Katriinnovaator.err.ee2024 Kassikuld võib osutuda elektroonikatööstuses kullast kallimaks

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27

newspaper article

Keemia tee klaasist ränisse : tänavune Nobeli keemiaauhind seab õigluse jalule keemiateoreetikute ja arvutikeemikute hulgasStrandberg, MarekSirp2013 / lk. 26 https://www.sirp.ee/s1-artiklid/c21-teadus/2013-10-17-20-15-58-2/

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28

newspaper article

Kleenukesed päikeseelemendid aitaks vältida ränipaneele ootavat kriisiSibinski, Maciejnovaator.err.ee2024 Kleenukesed päikeseelemendid aitaks vältida ränipaneele ootavat kriisi

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29

book article

Modeling of charge carrier non-isothermal transport parameters in siliconVelmre, Enn; Udal, AndresBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 71-74: ill

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30

journal article

Modelling of charge carrier non-isothermal transport in silicon and silicon carbideVelmre, Enn; Udal, AndresProceedings of the Estonian Academy of Sciences. Engineering2000 / 2, p. 144-154 : ill https://artiklid.elnet.ee/record=b1004044*est

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31

journal article EST / journal article ENG

Modular synthesis of (Borylmethyl)silanes through orthogonal functionalization of a carbon atomChowdhury, Rajdip; Elek, Gábor Zoltán; Meana-Baamonde, B.; Mendoza, AbrahamOrganic letters2023 / p. 1935-1940 : ill https://doi.org/10.1021/acs.orglett.3c00474 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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32

newspaper article

Must räni tõi helged lootusedKrustok, JüriEesti Päevaleht2000 / 19. veebr., lk. 23 https://artiklid.elnet.ee/record=b1637055*est

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33

book article

Point defects interaction with extended defects and impurities and its influence on the Si-SiO2 system propertiesKropman, Daniel; Arbu, Uno; Kärner, T.; Ugaste, Ülo; Mellikov, Enn; Kauk, Marit; Heinmaa, I.; Samoson, Ago; Medvid, A.Gettering and defect engineering in semiconductor technology. XI2005 / p. 333-338 : ill https://www.researchgate.net/publication/243760197_Point_Defects_Interaction_with_Extended_Defects_and_Impurities_and_Its_Influence_on_the_Si-SiO_2_System_Properties

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34

book article

Point defects interaction with extended defects in the Si-SiO2 system [Electronic resource]Kropman, Daniel; Kärner, T.; Abru, Uno; Ugaste, Ülo; Mellikov, EnnProceedings IVC-16 : Venice, 20042004 / p. SS1-TuP394 [CD-ROM] https://www.researchgate.net/publication/243760197_Point_Defects_Interaction_with_Extended_Defects_and_Impurities_and_Its_Influence_on_the_Si-SiO_2_System_Properties

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35

journal article

Porphyrin-based hybrid nanohelices : cooperative effect between molecular and supramolecular chirality on amplified optical activityAnfar, Zakaria; Kuppan, Balamurugan; Scalabre, Antoine; Nag, Rahul; Pouget, Emilie; Nlate, Sylvain; Magna, Gabriele; Di Filippo, Ilaria; Monti, Donato; Naitana, Mario L.; Stefanelli, Manuela; Nikonovich, Tatsiana; Borovkov, Victor; Aav, Riina; Paolesse, Roberto; Oda, ReikoThe journal of physical chemistry B2024 / p. 1550-1556 https://doi.org/10.1021/acs.jpcb.3c07153

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36

journal article EST / journal article ENG

Predictable quantum efficient detector. I, Photodiodes and predicted responsivitySildoja, Meelis; Manoocheri, Farshid; Merimaa, Mikko; Ikonen, Erkki; Müller, Ingmar; Werner, Lutz; Gran, Jarle; Kübarsepp, Toomas; Smid, Marek; Rastello, Maria LuisaMetrologia2013 / p. 385-394 : ill https://doi.org/10.1088/0026-1394/50/4/385 https://cris.vtt.fi/en/publications/predictable-quantum-efficient-detector-i-photodiodes-and-predicte Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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37

journal article

Production of silicon free master alloys in EstoniaGorkunov, Valeri; Munter, ReinScientific proceedings of Riga Technical University. 1. [series], Material science and applied chemistry2007 / p. 111-121

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38

newspaper article

Päikeseenergeetika tulevikku kujundavad kilepinnad ja tandempaneelidPiir, Raitnovaator.err.ee2023 Päikeseenergeetika tulevikku kujundavad kilepinnad ja tandempaneelid

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39

book article

Rapid prototyping of silicon structures by aid of laser and abrasive-jet machiningKruusing, Arvi; Leppävuori, Seppo; Uusimäki, Antti; Uusimäki, M.Design, Test and Microfabrication of MEMS and MOEMS : 30 March-1 April, 1999, Paris, France1999 / p. 870-878 : ill https://opticalengineering.spiedigitallibrary.org/conference-proceedings-of-spie/3680/0000/Rapid-prototyping-of-silicon-structures-by-aid-of-laser-and/10.1117/12.341285.full

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40

journal article

Recombination behaviour at the ultra-thin polypyrrole film/silicon interface investigated by in-situ pulsed photoluminescenceIntelmann, Carl Matthias; Hinrichs, Karsten; Sõritski, Vitali; Yang, Florent; Rappich, JörgJapanese journal of applied physics2008 / 2, p. 554-557 https://iopscience.iop.org/article/10.1143/JJAP.47.554

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41

journal article

Relationships between essential and non-essential elements in plants with different nutritional strategies and silicon absorption capacities : [manuscript]Monei, Nthati Lilian; Benyr, V.; Heilmeier, Hermann; Hitch, Michael William; Wiche, OliverThe international journal of environment & health2023

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42

book article EST / book article ENG

Review of - SiC wide-bandgap heterostructure properties as an alternate semiconductor materialPatankar, Udayan Sunil; Rajput Priti, J.; Koel, Ants; Nitnaware, V.N.International Conference on Inventive Research in Material Science and Technology, ICIRMCT 2018 : March 23-24, 20182018 / art. 020011 https://doi.org/10.1063/1.5038690 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

43

journal article EST / journal article ENG

Selective laser melting of commercially pure siliconLai, Zhouyi; Guo, Ting; Zhang, Shengting; Kollo, Lauri; Attar, Hooyar; Wang, Zhi; Prashanth, Konda GokuldossJournal Wuhan University of Technology, Materials Science Edition2022 / p. 1155 - 1165 https://doi.org/10.1007/s11595-022-2647-3 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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44

book

Silica granulates in concrete - dispersion and durability aspectsLagerblad, Björn; Utkin, Pjotr1993 https://www.ester.ee/record=b1025989*est

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45

journal article

Szilicium planar technologiai eljaras szamitögepes stimulaciojaRang, Toomas; Tarnay, K.; Masszi, F.Finommechanika, mikrotechnika: az Optikai, Akusztikai és Filmtechnikai Egyesület, a Híradástechnikai Tudományos Egyesület és a Méréstechnikai és Automatizálási Tudományos Egyesület lapja1979 / p. 257-260

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46

journal article

Strain relaxation mechanism in the Si-SiO2 system and its influence on the interface propertiesKropman, Daniel; Mellikov, Enn; Öpik, Andres; Lott, Kalju; Volobujeva, Olga; Kärner, T.; Heinmaa, I.; Laas, Tõnu; Medvid, A.Physica B : condensed matter2009 / 23/24, p. 5153-5155 : ill

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Stress relaxation mechanism by strain in the Si-SiO2 system and its influence on the interface propertiesKropman, Daniel; Seeman, Viktor; Dolgov, Sergei; Heinmaa, Ivo; Medvid, ArturPhysica Status Solidi (C) Current Topics in Solid State Physics2016 / p. 790 - 792 https://doi.org/10.1002/pssc.201600051 Journal metrics at Scopus Article at Scopus Article at WOS

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48

journal article

Study of ion implanted Fe depth distribution in Si after pulsed ion beam treatmentAngelov, Christo; Georgiev, S.; Amov, Blagoj; Goranova, E.; Mikli, Valdek; Dezsi, I.; Kotai, E.Journal of optoelectronics and advanced materials2007 / 2, p. 307-310 https://www.researchgate.net/publication/289186791_Study_of_the_ion_implanted_Fe_depth_distribution_in_Si_after_pulsed_ion_beam_treatment

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49

book article

Technonomics of manufacturing of silicon microsystems on WSIBubennikov, Alexander N.; Bubennikov, Alexander A.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 29-32: ill

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journal article EST / journal article ENG

The role of silicon in the hot dip galvanizing processSepper, Sirli; Peetsalu, Priidu; Kulu, Priit; Saarna, Mart; Mikli, ValdekProceedings of the Estonian Academy of Sciences2016 / p. 159-165 : ill https://artiklid.elnet.ee/record=b2768226*est https://doi.org/10.3176/proc.2016.2.11 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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