Searching - TalTech Research Portal

display

sort

1

book article

A generic synthesizable NoC switch with a scalable testbenchGovind, Vineeth; Raik, Jaan; Ubar, Raimund-JohannesBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 91-94 : ill

book article

2

journal article

A healthier chip?Ubar, Raimund-Johannes; Fridolin, Ivo; Meigas, Kalju; Min, MartPublic service review : European Union2010 / p. 132-133 : ill

journal article

3

book article

A new approach to build a low-level malicious fault list starting from high-level description and alternative graphsBenso, A.; Prinetto, Paolo; Rebaudengo, M.; Sonza, M.; Ubar, Raimund-JohannesProceedings IEEE European Design & Test Conference, Paris, March 17-20, 19971997 / p. 560-565

book article

4

book article

A new evolutionary-technique-based approach to optimize pseudo-random TPG for logic BISTJutman, Artur; Aleksejev, Jevgeni; Ubar, Raimund-JohannesMEET/MARIND'2002 : proceedings of First International Congress on Mechanical and Electrical Engineering and Technology and Fourth International Conference on Marine Industry, 07-11 October 2002, Varna Bulgaria. Volume 12002 / p. 247-252 : ill

book article

5

book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

book article

6

journal article

A new testability calculation method to guide RTL test generationRaik, Jaan; Nõmmeots, Tanel; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2005 / 1, p. 71-82 : ill https://link.springer.com/article/10.1007/s10836-005-5288-5

journal article

7

book article

A novel artificial neural networks based automatic adaptive fault detection technique for analog circuitsPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 167-170 : ill

book article

8

book article

A PC-based CAD system for training digital testUbar, Raimund-Johannes; Buldas, Ahto; Paomets, Priidu; Raik, Jaan; Tulit, ViljarThe Fifth EUROCHIP Workshop on VLSI Design Training, 17-18-19 October 1994, Dresden, Germany1994 / p. 152-157: ill

book article

9

book article

A proposal for optimisation of low-powered FSM testingBrik, Marina; Fomina, Jelena; Ubar, Raimund-JohannesProceedings of IEEE East-West Design & Test Workshop (EWDTW'05) : Odessa, Ukraine, September 15-19, 20052005 / p. 15-20

book article

10

book article

A scalable static test set compaction method for sequential circuitsAleksejev, Igor; Raik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 87-92 : ill

book article

11

book article

A scalable technique to identify true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, JaanProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 152-157 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

book article

12

book article

A system for teaching basic and advanced topics of IEEE 1149.1 boundary scan standard (extended abstract)Jutman, Artur; Rosin, Vjatšeslav; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of 16th EAEEIE Conference on Innovation in Education for Electrical and Information Engineering (EIE) : Lappeenranta, Finland, 6th-8th June 20052005 / [2] p. : ill

book article

13

book article

A tool for advanced learning of LFSR-based testing principlesJutman, Artur; Tšertov, Anton; Ubar, Raimund-JohannesBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 175-178 : ill

book article

14

book article

A tool for random test generation targeting high diagnostic resolutionOsimiry, Emmanuel Ovie; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 79-82 : ill http://www.ester.ee/record=b2150914*est

book article

15

book article

A tool for teaching pseudo-random TPG principlesJutman, Artur; Tšertov, Anton; Ubar, Raimund-JohannesProceedings of the 17th EAEEIE Annual Conference on Innovation in Education for Electrical and Information Engineering : Craiova, Romania, June 1st-3rd, 20062006 / p. 182-187 : ill

book article

16

book article

Aastad, mis möödusid linnulennulUbar, Raimund-JohannesRaimund-Johannes Ubar. Bibliograafia2016 / lk. 13-44 : ill., fot

book article

17

book article

About robustness of test patterns regarding multiple faultsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanLATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador2012 / p. 86-91 : ill

book article

18

book article

About the fragility of truth in the dialogue between science and societyUbar, Raimund-JohannesEstonian Academy of Sciences year book = Annales Academiae Scientiarum Estonicae 20172018 / p. 58-60 https://www.ester.ee/record=b1874722*est

book article

19

journal article

Accurate dialysis dose evaluation and extrapolation algorithms during online optical dialysis monitoringFridolin, Ivo; Karai, Deniss; Kostin, Sergei; Ubar, Raimund-JohannesIEEE transactions on biomedical engineering2013 / p. 1371-1377 : ill

journal article

20

book article

Accurate NBTI-induced gate delay modeling based on intensive SPICE simulationsKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 21-26 : ill

book article

21

book article

Action-based learning system for teaching digital electronics and testUbar, Raimund-Johannes; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 3rd European Workshop on Microelectronics Education : France, May 18AMP19, 20002000 / p. 107-110 : ill

book article

22

book article

Advanced technical education in the age of cyber physical systemsVierhaus, Heinrich Theodor; Schölzel, Mario; Raik, Jaan; Ubar, Raimund-Johannes10th European Workshop on Microelectronics Education : EWME 2014 : May 14-16, 2014, Tallinn, Estonia2014 / p. 193-198 : ill

book article

23

newspaper article

Akadeemia hädad ja Eesti TeadusfondUbar, Raimund-Johannes; Martinson, HelleKultuurileht1994 / 6. mai, lk. 6

newspaper article

24

book article

Akadeemik Raimund-Johannes Ubari peokõne "Kõrgharidus on võime näha puude taga metsa" : [Tallinna Tehnikaülikooli 90. aastapäeva pidulikul koosolekul 17. septembril 2008 TTÜ aulas]Ubar, Raimund-JohannesTallinna Tehnikaülikooli aastaraamat 20082009 / lk. 138-142

book article

25

newspaper article

Akadeemilisest tagasisidest ja teaduseusustUbar, Raimund-JohannesPostimees1994 / 11. juuli

newspaper article

Ubar, Raimund-Johannes (author)

types of item

author 55

CV 55

name of the person 27

subject term 1