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Avalik kiri Eesti elektrist : [Eesti elektrijaamade erastamisest NRG-le : Eesti Teaduste Akadeemia 36 akadeemiku pöördumine]Aarna, Olav; Lille, Ülo; Saarma, Mart; Saarma, Mart; Tamm, Boris, inform.; Ubar, Raimund-Johannes; Ernits, Peeter; Veiderma, MihkelPostimees2001 / lk. 24 https://www.ester.ee/record=b1072778*est https://artiklid.elnet.ee/record=b2295176*est

newspaper article

77

book article

Back-traced deductive-parallel fault simulation for digital systemsHahanov, Vladimir; Ubar, Raimund-Johannes; Hyduke, StanleyProceedings : Euromicro Symposium on Digital System Design : Belek-Antalya, Turkey, September 1st to 6th, 20032003 / p. 370-377 : ill https://ieeexplore.ieee.org/document/1231969

book article

78

book article

Back-tracing and event-driven techniques in high-level simulation with decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Morawiec, AdamISCAS 2000 Geneva : The 2000 IEEE International Symposium on Circuits and Systems : Emerging Technologies for the 21st Century : May 28-31, 2000 : proceedings. Vol. 12000 / p. I-208 - I-211

book article

79

newspaper article

Balti Ülikoolide Sõprade SeltsUbar, Raimund-JohannesTehnikaülikool1992 / 18. dets., lk. 2

newspaper article

80

book

BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia)Rang, Toomas; Min, Mart; Ubar, Raimund-Johannes1994

book

81

book

BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedingsRang, Toomas; Min, Mart; Ubar, Raimund-Johannes1996 https://www.ester.ee/record=b2150914*est

book

82

book article

Behavioral level modeling of digital systems for testing purposesUbar, Raimund-Johannes42nd International Conference, Ilmenau, Germany, September 22-25, 1997. Part 11997 / p. 510-515

book article

83

book article

A benchmark suite for evaluating the efficiency of test toolsKruus, Helena; Ubar, Raimund-Johannes; Ellervee, Peeter; Gorev, Maksim; Pesonen, Vadim; Devadze, Sergei; Orasson, Elmet; Brik, Marina; Min, Mart; Annus, Paul; Kruus, Margus; Meigas, KaljuBEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 / p. 85-88 : ill

book article

84

journal article

Berechnung von Booleschen Ableitungen bei der Testsatzanalyse für digitale SchaltungenUbar, Raimund-JohannesNachrichtentechnik, Elektronik : technisch-wissenschaftlishe Zeitschrift für die gesamte elektronische Nachrichtentechnik1977 / p. 21-23 : ill https://www.ester.ee/record=b1550811*est

journal article

85

book article

Berechnung von tests für die Fehlerdiagnose in DigitalsystemUbar, Raimund-JohannesInternationales wissenschaftliches Kolloquium, 21. 1. November bis 5. November 1976, H. 2: Vortragsreihe A 2: Entwurf, Analyse und Einsatz von informationsverarbeitenden Systemen: IWK1976 / p. [?]

book article

86

journal article

Beschreibung digitaler Einrichtungen mit alternativen Graphen für die FehlerdiagnoseUbar, Raimund-JohannesNachrichtentechnik, Elektronik : technisch-wissenschaftlishe Zeitschrift für die gesamte elektronische Nachrichtentechnik1980 / p. 96-102 : ill https://www.ester.ee/record=b1550811*est

journal article

87

book article

Bibliograafia : [Raimund-Johannes Ubar]Raimund-Johannes Ubar. Bibliograafia2016 / lk. [97]-243

book article

88

book article

BIST analyzer : a training platform for SoC testing [Electronic resource]Jutman, Artur; Tšertov, Anton; Tšepurov, Anton; Aleksejev, Igor; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 20072007 / p. S3H-8-S3H-13 : ill. [CD-ROM] http://dx.doi.org/10.1109/FIE.2007.4418125

book article

89

book article

Block-level fault model-free debug and diagnosis in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 12th EUROMICRO Conference on Digital System Design, Architectures, Methods and Tools : Patras, Greece, August 27-29, 20092009 / p. 229-232 https://ieeexplore.ieee.org/document/5350128

book article

90

book article

Boolean derivatives and multi-valued simulation on binary decision diagramsUbar, Raimund-JohannesProceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 19971997 / p. 115-120

book article

91

book article

Boolean fault dignosis with structurally synthesized BDDsUbar, Raimund-JohannesRecent progress in the Boolean domain2014 / p. 303-331 : ill

book article

92

book article

Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei; Wuttke, Heinz-DietrichInternational Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal2007 / [7] p. : ill. [CD-ROM] http://icee2007.dei.uc.pt/proceedings/papers/429.pdf

book article

93

book article

Built-in self diagnosis with multiple signature analyzers in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 29-34 : ill

book article

94

book article

CAD für Digitaltechnik - eine Programmfamilie für den Entwurf von Testmustern zum Test von DigitalschaltungenUbar, Raimund-JohannesIBM Hochschulkongress '92: Offene Grenzen - offene Systeme, Dresden, 30.09-2.10.19921992 / S.IV9 1-14

book article

95

book article

CAD software for digital test and diagnosticsJervan, Gert; Markus, Antti; Paomets, Priidu; Raik, Jaan; Ubar, Raimund-JohannesProceedings of International Conference on Design and Diagnostics of Electronic Circuits and Systems, Ostrava, Czech Republik, May 12-14, 19971997 / p. 35-40

book article

96

book article

A CAD system for teaching digital testUbar, Raimund-Johannes; Ivask, Eero; Paomets, Priidu; Raik, JaanBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 369-372: ill

book article

97

book article

Calculation of LFSR seed and polynomial pair for BIST applicationsJutman, Artur; Tšertov, Anton; Ubar, Raimund-JohannesInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja2008 / p. 105-108 : ill

book article

98

book article

Calculation of LFSR seed and polynomial pair for BIST applications [Electronic resource]Jutman, Artur; Tšertov, Anton; Ubar, Raimund-Johannes2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 20082008 / p. 275-279 : ill. [CD-ROM]

book article

99

journal article EST / journal article ENG

Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanMicroprocessors and microsystems2020 / art. 103117, 12 p https://doi.org/10.1016/j.micpro.2020.103117 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

100

book article

Calculation of testability measures on structurally synthesized binary decision diagramsUbar, Raimund-Johannes; Heinlaid, J.; Raik, Jaan; Raun, L.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 179-182: ill

book article

Ubar, Raimund-Johannes (author)

types of item

CV 63

author 57

name of the person 28

subject term 1