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Ubar, Raimund-Johannes (author)
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226
book article
E-learning tools for teaching self-test of digital electronics
Jutman, Artur
;
Gramatova, Elena
;
Pikula, T.
;
Ubar, Raimund-Johannes
15 EAEEIE International Conference on Innovation in Education for Electrical and Information Engineering : Sofia, Bulgaria, May 27-29, 2004
2004
/
p. 267-272 : ill
book article
227
book article
Electronics Competence Centre at Tallinn Technical University
Ubar, Raimund-Johannes
;
Vainomaa, Kaido
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 2
1994
/
p. 597-602: ill
book article
228
journal article
Electronics Competence Centre at the Tallinn Technical University
Ubar, Raimund-Johannes
Baltic electronics
1995
/
2, p. 9-11
journal article
229
book article
Electronics design and test
Ubar, Raimund-Johannes
;
Kruus, Margus
;
Rang, Toomas
Public service review : European Union. 13
2007
/
p. 52-53
book article
230
newspaper article
Elektroonika ja arvutustehnika vabariiklikust sihtprogrammist
Ubar, Raimund-Johannes
Arvutustehnika ja Andmetöötlus
1994
/
1, lk. 1-6
newspaper article
231
journal article
Elektroonika kompetentsuskeskus avas uksed kasutajatele Tallinna Tehnikaülikoolis
Ubar, Raimund-Johannes
Tallinna Ülikoolid
1996
/
1. veebr., lk. 2-3: ill
journal article
232
journal article
Elektroonika kompetentsuskeskus Tallinna Tehnikaülikooli juures
Ubar, Raimund-Johannes
Arvutustehnika ja Andmetöötlus
1994
/
2, lk. 33-36 ; 3, lk. 28-33
journal article
233
journal article
Elektroonika kompetentsuskeskus Tallinna Tehnikaülikoolis
Ubar, Raimund-Johannes
Sõnumileht
1996
/
13. veebr., lk. 17
journal article
234
journal article
Elektroonika kompetentsuskeskusest Tallinna Tehnikaülikooli juures
Ubar, Raimund-Johannes
Arvutustehnika ja Andmetöötlus
1996
/
1, lk. 2-4
journal article
235
book article
Elektroonika kui Eesti innovatsioonisüsteemi infrastruktuur
Min, Mart
;
Rang, Toomas
;
Ubar, Raimund-Johannes
Eesti teadlaste kongress, 11.-15. augustini 1996. a. Tallinnas : ettekannete kokkuvõtted
1996
/
lk. 265
https://www.ester.ee/record=b1052731*est
book article
236
journal article
Elektroonikadisaini uued paradigmad
Ubar, Raimund-Johannes
A & A
1998
/
5, lk. 5-10
journal article
237
journal article
Elektroonikatööstuse 50 miljonit
Ubar, Raimund-Johannes
Luup
1999
/
1, lk. 23-25: ill
journal article
238
book article
Embedded diagnosis in digital systems
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2008 26th International Conference on Microelectronics : Niš, Serbia, 11-14 May 2008 : proceedings. Vol. 2
2008
/
p. 421-424 : ill
book article
239
journal article
Embedded fault diagnosis in digital systems with BIST
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Microprocessors and microsystems
2008
/
5/6, p. 279-287 : ill
journal article
240
book article
Energy minimization for hybrid BIST in a system-on-chip test environment
Ubar, Raimund-Johannes
;
Shchenova, Tatjana
;
Jervan, Gert
;
Peng, Zebo
European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings
2005
/
p. 2-7 : ill
book article
241
book article
Enhancing hierarchical ATPG with a functional fault model for multiplexers [Electronic resource]
Raik, Jaan
;
Ubar, Raimund-Johannes
7th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 18-21, 2004, Stará Lesná, Slovakia : proceedings
2004
/
p. 219-222 : ill. [CD-ROM]
book article
242
journal article
Environment for FPGA-based fault emulation
Ellervee, Peeter
;
Raik, Jaan
;
Tammemäe, Kalle
;
Ubar, Raimund-Johannes
Proceedings of the Estonian Academy of Sciences. Engineering
2006
/
3-2, p. 323-335 : ill
journal article
243
book article
Environment for innovative university research training in the field of digital test
Oyeniran, Adeboye Stephen
;
Ademilua, Tolulope
;
Kruus, Margus
;
Ubar, Raimund-Johannes
2021 30th Annual Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE)
2021
https://doi.org/10.1109/EAEEIE50507.2021.9531003
book article
244
journal article
Environment for the analysis of functional self-test quality in digital systems
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Kruus, Helena
;
Aarna, Margit
;
Devadze, Sergei
Proceedings of the Estonian Academy of Sciences
2014
/
p. 151-162 : ill
https://artiklid.elnet.ee/record=b2673964*est
journal article
245
book article
Equivalent transformations of structurally synthesized BDDs and applications
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Viies, Vladimir
2019 8th Mediterranean Conference on Embedded Computing (MECO)
2019
/
6 p. : ill
https://doi.org/10.1109/MECO.2019.8760283
book article
246
book article
Evolutionary approach to test generation for functional BIST
Skobtsov, Y.A.
;
Ivanov, D.E.
;
Skobtsov, V.Y.
;
Ubar, Raimund-Johannes
;
Raik, Jaan
Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005
2005
/
p. 151-155 : ill
https://artiklid.elnet.ee/record=b1018764*est
book article
247
book article
Evolutionary approach to the functional test generation for digital circuits
Skobtsov, Y.A.
;
Ivanov, D.E.
;
Skobtsov, V.Y.
;
Ubar, Raimund-Johannes
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 229-232 : ill
book article
248
journal article
Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuits
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Devadze, Sergei
;
Raik, Jaan
International journal of microelectronics and computer science
2018
/
p. 9−18
https://ijmcs.dmcs.pl/web/guest/vol.-9-no.-1
https://ijmcs.dmcs.pl/documents/10630/345460/IJMCS_1_2018_2.pdf
journal article
249
book article
Exact static compaction of independent test sequences
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 315-318 : ill
book article
250
book article
Exact static compaction of sequential circuit tests using branch-and-bound and search state registration
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
ETW'02 : 7th IEEE European Test Workshop, Gorfu Greece, May 26-29, 2002 : informal digest
2002
/
p. 19-20
book article
Number of records 834, displaying
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56
1.
Ubar, Raimund-Johannes
2.
Hagelberg, Raimund
3.
Räämet, Raimund
4.
Aare, Johannes
5.
Avik, Eduard Johannes
6.
Bauer, Johannes
7.
Bender, Naatan Johannes
8.
Buchmann, Johannes
9.
Deelstra, Johannes
10.
Ehala, Johannes
11.
Engelmayer, Johannes
12.
Gotzmann, Johannes
13.
Helander, Johannes
14.
Hint, Johannes
15.
Hüsse, Johannes
16.
Johannes, Anu
17.
Johannes, Ellen
18.
Johannes, Ille
19.
Johannes, Kaljo-Mihkel
20.
Järv, Johannes
21.
Kadak, Johannes
22.
Kajander, Aleksi Oskar Johannes
23.
Karstensen, Johannes
24.
Kerkhoven, Eduard Johannes
25.
Kiivet, Johannes
26.
Krimmer, Robert Johannes
27.
Kukebal, Johannes
28.
Meitre, Johannes
29.
Miller, Johannes
30.
Mühlman, Johannes
31.
Norberg, Johannes
32.
Notermans, Antonius Johannes Hubertus
33.
Ortlepp, Johannes
34.
Parikas, Johannes
35.
Pello, Johannes
36.
Pervik, Johannes-Eduard
37.
Piiper, Johannes
38.
Presmann, Johannes
39.
Putk, Aksel-Johannes
40.
Pätsch, Johannes
41.
Saar, Johannes
42.
Sautter, Johannes
43.
Sinisalo, Touko Johannes
44.
Steinbrunn, Johannes
45.
Sutt, Johannes
46.
Zeiringer, Johannes Paul
47.
Taimsalu, Johannes
48.
Talu, Martin Johannes
49.
Tammekänd, Johannes
50.
Tilk, Johannes
51.
Tralla, Johannes
52.
Veerus, Johannes
53.
Vibur, Johannes Ferdinand
54.
Vind, Johannes
55.
Voll, Johannes
56.
Voltri, Johannes
CV
56
1.
Ubar, Raimund-Johannes 1941
2.
Räämet, Raimund 1918-2004
3.
Aare, Johannes 1915-2000
4.
Ahrenschild, Johannes (-1936)
5.
Alaots, Johannes
6.
Aljak, Arnold Johannes
7.
Allik, Erich-Johannes
8.
Avik, Eduard Johannes
9.
Drechsler, Wolfgang Johannes Max
10.
Ehala, Johannes 1986
11.
Hint, Johannes 1914-1985
12.
Johannes, Ille 1939
13.
Johannson, Johannes
14.
Johanson, Johannes
15.
Juhans, Johannes 1874-1956
16.
Kajander, Aleksi Oskar Johannes 1994
17.
Kiiwet, Johannes
18.
Kiivet, Johannes 1879-1967
19.
Kivit, Johannes
20.
Kollist, Johannes 1884-1937
21.
Kollist, Johannes Theodor
22.
Korv, August Johannes 1911-1981
23.
Krimmer, Robert Johannes
24.
Käpp, Martin Johannes
25.
Langel, Johannes 1900-1985
26.
Langell, Johannes
27.
Livländer, Robert Johannes
28.
Madise, Johannes 1920
29.
Meitre, Johannes 1906-1978
30.
Messer, Johannes
31.
Muru, Johannes 1995
32.
Mäll, Johannes 1911-1981
33.
Mühlman, Johannes
34.
Mühlmann, Johannes 1888-1936
35.
Notermans, Antonius Johannes Hubertus 1959
36.
Nuudi, Johannes 1895-1975
37.
Palo, Johannes 1925-1960
38.
Pals, Johannes 1903-1941
39.
Pello, Johannes 1958
40.
Pervik, Johannes 1892-1958
41.
Presmann, Johannes 1942
42.
Putk, Aksel-Johannes 1928-1999
43.
Püümann, Mait Johannes
44.
Roes, Johannes 1914
45.
Russwurm, Johannes
46.
Russvurm, Johannes 1855-1939
47.
Russvurm, Johannes Carl Gysbert Immanuel
48.
Sakeus, Johannes 1880-1934
49.
Taimsalu, Johannes 1891-1942
50.
Teiman, Johannes
51.
Teimann, Johannes Rudolf (kuni 22.05.1935)
52.
Tomson, Johannes
53.
Tuulre, Feliks Johannes 1908-1987
54.
Veerus, Johannes Voldemar 1897-1972
55.
Verus, Johannes Voldemar
56.
Vuhk, Oskar Johannes
name of the person
27
1.
Ubar, Raimund-Johannes, 1941-
2.
Hagelberg, Raimund, 1927-2012
3.
Räämet, Raimund, 1918-2004
4.
Aare, Johannes, 1915-2000
5.
Aavik, Johannes, 1880-1973
6.
Avik, Eduard Johannes, 1891-1942
7.
Bender, Naatan Johannes
8.
Granö, Johannes Gabriel
9.
Hint, Johannes, 1914-1985
10.
Johannes Paulus II, paavst, 1920-2005
11.
Kert, Johannes
12.
Kiivet, Johannes, 1879-1967
13.
Kollist, Johannes
14.
Käis, Johannes
15.
Lang, Johannes
16.
Maide, Johannes Voldemar
17.
Mossov, Johannes
18.
Pals, Johannes, 1903-1941
19.
Pello, Johannes
20.
Putk, Aksel-Johannes
21.
Rammul, Aleksander Johannes, 1875-1949
22.
Steinbrunn, Johannes
23.
Taimsalu, Johannes, 1891-1942
24.
Talu, Martin Johannes
25.
Veerus, Johannes Voldemar, 1897-1972
26.
Veski, Johannes Voldemar, 1873-1968
27.
Voll, Johannes
subject term
1
1.
Johannes Mittus, vasevalamise tööstus
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