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126

book article

Comparison of genetic and random techniques for test pattern generationIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 163-166: ill

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127

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Comparison of two approaches to improve functional BIST fault coverageKostin, Sergei; Ubar, Raimund-Johannes; Gorev, Maksim; Mägi, GunnarBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 105-108 : ill

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128

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Complex delay fault reasoning with sequential 7-valued algebraKõusaar, Jaak; Ubar, Raimund-Johannes; Aleksejev, Igor2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102403

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129

book article

Computer-aided module-level text generation for digital devices on the basis of thin alternative graph-modelPall, M.; Ubar, Raimund-JohannesPreprints the 2nd IFAC/IFIP Symposium on Software for Computer Control, SOCOCO, Prague, Czechoslovakia, June 11-15, 1979 ; Vol. 21979 / p. [?] https://www.ester.ee/record=b2041567*est

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130

book article

Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]Jürimägi, Lembit; Ubar, Raimund-JohannesBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p. : ill https://doi.org/10.1109/BEC.2018.8600967

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131

book article

Constraint-based hierarchical untestability identification for synchronous sequential circuitsRaik, Jaan; Rannaste, Anna; Jenihhin, Maksim; Viilukas, Taavi; Ubar, Raimund-Johannes; Fujiwara, HideoSixteenth IEEE European Test Symposium : 23-27 May 2011, Trondheim2011 / p. 147-152

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132

book article

Constraint-based hierarchical untestability identification for syncronous sequential circuitsViilukas, Taavi; Raik, Jaan; Ubar, Raimund-Johannes; Rannaste, Anna; Jenihhin, Maksim; Fujiwara, HideoInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 139-142 : ill

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133

book article

Constraint-based test pattern generation at the register-transfer levelViilukas, Taavi; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes; Krivenko, AnnaProceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria2010 / p. 352-357 : ill http://dx.doi.org/10.1109/DDECS.2010.5491752

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134

book article

A constraint-driven gate-level test generatorRaik, Jaan; Ubar, Raimund-Johannes; Jervan, Gert; Krupnova, HelenaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 237-240: ill

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135

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Constraints analysis in hierarchical test generation for digital systemsUbar, Raimund-Johannes; Krupnova, HelenaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 313-318: ill

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136

journal article

Construction of the tests of combinational circuit failures by analyzing the orthogonal disjunctive normal forms represented by the alternative graphsMatrosova, A.Yu.; Pleshkov, A.G.; Ubar, Raimund-JohannesAutomation and remote control2005 / p. 313-327 : ill http://dx.doi.org/10.1007/s10513-005-0054-9

journal article

137

book article

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan2014 17th Euromicro Conference on Digital System Design : DSD 2014 : 27-29 August 2014, Verona, Italy : proceedings2014 / p. 108-113 : ill

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138

book article

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, JaanProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 61-66 : ill

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139

book article

Cycle-based simulation algorithms for digital systems using high-level decision diagramsMorawiec, Adam; Ubar, Raimund-Johannes; Raik, JaanDesign, Automation and Test in Europe : Conference and Exhibition 2000 : Paris, France, March 27-30, 2000 : proceedings2000 / p. 743

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140

book article

Cycle-based simulation with decision diagramsUbar, Raimund-Johannes; Morawiec, Adam; Raik, JaanDesign, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings1999 / p. 454-458: ill

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141

book article

DECIDER : a decision diagram based hierarchical test generation systemJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Szczyrk, Poland, September 2-4, 19981998 / p. 269-273

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142

journal article

DECIDER : a system for hierarchical test pattern generationRaik, Jaan; Ubar, Raimund-JohannesRadioelectronics and informatics2003 / p. 40-45 : ill

journal article

143

book article

A decision diagram based hierarchical test pattern generatorJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 159-162: ill

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144

journal article

Decision diagrams - from a mathematical notion to engineering applicationsStankovic, Radomir S.; Ubar, Raimund-Johannes; Astola, JaakkoFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 281-301 : ill http://dx.doi.org/10.2298/FUEE1103281S

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145

book article

Decision diagrams and digital testUbar, Raimund-JohannesECMS 2003 : 6th International Workshop on Electronics, Control, Measurment and Signals : Liberec, Czechia, June 2-4, 20032003 / p. 266-273 : ill

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146

book article

Decision diagrams and digital testUbar, Raimund-Johannes41th International Conference on Microelectronics, Devices and Materials : MIDEM 2005 : Ribno at Bled, Slovenia : invited plenary paper2005 / p. 15-26

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147

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Decision diagrams for diagnostic modelingUbar, Raimund-JohannesMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 43

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148

book article

Deductive fault simulation on structurally synthesized BDDsAarna, Margit; Ubar, Raimund-Johannes; Raik, JaanBEC 2004 : Baltic Electronics Conference : Post-Graduate Student Session : Tallinn University of Technology, October 3-6, 2004, Tallinn, Estonia2004 / p. 11 : ill

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149

book article

Defect oriented fault coverage of 100stuck-at fault test setsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 20002000 / p. 511-516 : ill

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150

book article

Defect-oriented BIST quality analysisKruus, Helena; Ubar, Raimund-Johannes; Raik, JaanBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 153-156 : ill

book article

Ubar, Raimund-Johannes (author)

types of item

author 55

CV 55

name of the person 27

subject term 1