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Jenihhin, Maksim (author)
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151
book article
RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems design
Gürsoy, Cemil Cem
;
Cardoso Medeiros, Guilherme
;
Chen, Juanho
;
Balakrishnan, Aneesh
;
Lai, Xinhui
;
Bagbaba, Ahmet Cagri
;
Raik, Jaan
;
Jenihhin, Maksim
DATE 2019
2019
/
1 p. : ill
https://doi.org/10.5281/zenodo.3362529
https://past.date-conference.com/
book article
152
book article
RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systems
Jenihhin, Maksim
;
Raik, Jaan
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings
2020
/
art. 19690741 , 6 p
https://doi.org/10.23919/DATE48585.2020.9116558
book article
153
book article
SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators
Taheri, Mahdi
;
Daneshtalab, Masoud
;
Raik, Jaan
;
Jenihhin, Maksim
;
Pappalardo, Salvatore
;
Jimenez, Paul
;
Deveautour, Bastien
;
Bosio, Alberto
2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) : 03-05 April 2024, Kielce, Poland
2024
/
p. 19–24 : ill
https://doi.org//10.1109/DDECS60919.2024.10508925
book article
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
154
book article
A scalable technique to identify true critical paths in sequential circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany
2017
/
p. 152-157 : ill
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553
book article
155
book article
Sequential circuits BIST synthesis from signal specifications
Raik, Jaan
;
Jenihhin, Maksim
;
Adelbert, Rain
Proceedings 23rd NORCHIP Conference : Oulu, Finland, 21-22 November 2005
2005
/
p. 196-199 : ill
https://ieeexplore.ieee.org/document/1597023
book article
156
dissertation
Simulation-based hardware verification with high-level decision diagrams = Simuleerimisel põhinev riistvara verifitseerimine kõrgtaseme otsustusdiagrammidel
Jenihhin, Maksim
2008
https://www.ester.ee/record=b2431332*est
dissertation
157
book article
Simulation-based verification with APRICOT framework using high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
East-West Design & Test Symposium : Moscow, September 18-21, 2009
2009
/
p. 13-16 : ill
book article
158
book article
Software-based mitigation for memory address decoder aging
Kraak, D. H. P.
;
Gürsoy, Cemil Cem
;
Jenihhin, Maksim
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704595
book article
159
book article
Software-level TMR approach for on-board data processing in space applications
Janson, Karl
;
Treudler, Carl Johann
;
Hollstein, Thomas
;
Raik, Jaan
;
Jenihhin, Maksim
;
Fey, Goerschwin
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 147-152 : ill
https://doi.org/10.1109/DDECS.2018.00033
book article
160
book article EST
/
book article ENG
Special session : approximation and fault resiliency of DNN accelerators
Ahmadilivani, Mohammad Hasan
;
Barbareschi, Mario
;
Barone, Salvatore
;
Bosio, Alberto
;
Daneshtalab, Masoud
;
Torca, Salvatore Della
;
Gavarini, Gabriele
;
Jenihhin, Maksim
;
Raik, Jaan
;
Taheri, Mahdi
2023 IEEE 41st VLSI Test Symposium (VTS) : proceedings
2023
/
10 p. : ill
https://doi.org/10.1109/VTS56346.2023.10140043
Conference proceeding at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
161
book article EST
/
book article ENG
Special session : AutoSoC - a suite of open-source automotive SoC benchmarks
Silva, Felipe Augusto da
;
Bagbaba, Ahmet Cagri
;
Ruospo, Annachiara
;
Jenihhin, Maksim
2020 IEEE 38th VLSI TEST SYMPOSIUM (VTS) - VTS 2020 : proceedings
2020
/
9 p. : ill
https://doi.org/10.1109/VTS48691.2020.9107599
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Related publications
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
162
book article
Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCs
Selg, Hardi
;
Shibin, Konstantin
;
Tsertov, Anton
;
Jenihhin, Maksim
;
Ellervee, Peeter
;
Raik, Jaan
2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
2024
https://doi.org/10.1109/DFT63277.2024.10753541
Article at Scopus
book article
163
book article EST
/
book article ENG
Special session: reliability assessment recipes for DNN accelerators
Ahmadilivani, Mohammad Hasan
;
Bosio, Alberto
;
Deveautour, Bastien
;
Dos Santos, Fernando Fernandes
;
Guerrero-Balaguera, Juan-David
;
Jenihhin, Maksim
;
Kritikakou, Angeliki
;
Sierra, Robert Limas
;
Raik, Jaan
;
Taheri, Mahdi
42nd IEEE VLSI Test Symposium, VTS 2024
2024
/
11 p. : ill
https://doi.org/10.1109/VTS60656.2024.10538707
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
164
book article
SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 223-228 : ill
book article
165
book
Structural decision diagrams in digital test : theory and applications
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jenihhin, Maksim
;
Jutman, Artur
2024
https://doi.org/10.1007/978-3-031-44734-1
https://www.ester.ee/record=b5734441*est
book
166
journal article EST
/
journal article ENG
A survey on UAV computing platforms : a hardware reliability perspective
Ahmed, Foisal
;
Jenihhin, Maksim
Sensors
2022
/
art. 6286
https://doi.org/10.3390/s22166286
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
167
dissertation
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
Balakrishnan, Aneesh
2022
https://doi.org/10.23658/taltech.11/2022
https://digikogu.taltech.ee/et/Item/a594d3ec-0e6b-4a78-819a-fe1f47992612
dissertation
Related publications
9
Modeling gate-level abstraction hierarchy using graph convolutional neural networks to predict functional de-rating factors
On the estimation of complex circuits functional failure rate by machine learning techniques
Challenges of reliability assessment and enhancement in autonomous systems
The validation of graph model-based, gate level low-dimensional feature data for machine learning applications
Understanding multidimensional verification : where functional meets non-functional
Enabling cross-layer reliability and functional safety assessment through ML-based compact models
Composing graph theory and deep neural networks to evaluate SEU type soft error effects
Gate-level graph representation learning : a step towards the improved stuck-at faults analysis
Modeling soft-error reliability under variability
168
journal article EST
/
journal article ENG
A systematic literature review on hardware reliability assessment methods for deep neural networks
Ahmadilivani, Mohammad Hasan
;
Taheri, Mahdi
;
Raik, Jaan
;
Daneshtalab, Masoud
;
Jenihhin, Maksim
ACM Computing Surveys
2024
/
art. 141, 39 p. : ill
https://doi.org/10.1145/3638242
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Related publications
2
Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
169
book article
SystemC-based loose models : RTL abstraction for design understanding
Abrar, Syed Saif
;
Jenihhin, Maksim
;
Raik, Jaan
Workshop on Design Automation for Understanding Hardware Designs DUHDe 2015 : Grenoble, March 13, 2015
2015
/
p. 1-6
book article
170
book article
SystemC-based loose models for simulation speed-up by abstraction of RTL IP cores
Abrar, Syed Saif
;
Jenihhin, Maksim
;
Raik, Jaan
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 71-74 : ill
http://dx.doi.org/10.1109/DDECS.2015.39
book article
171
book article
zamiaCAD : open source platform for advanced hardware design
Tšepurov, Anton
;
Jenihhin, Maksim
;
Raik, Jaan
DATE 2011 University Booth : Design Automation and Test in Europe : Grenoble, France, March 14-18, 2011
2011
/
[2] p.: ill
book article
172
book article
zamiaCAD : shall we dance?
Jenihhin, Maksim
Open Source Tools for Verification : DVClub 14 January 2013
2013
/
1 p
book article
173
book article
zamiaCAD : understand, develop and debug hardware designs
Jenihhin, Maksim
;
Tihhomirov, Valentin
;
Saif Abrar, Syed
;
Raik, Jaan
;
Bartsch, Günter
DUHDe : 1st Workshop on Design Automation for Understanding Hardware Designs : March 28, 2014 : Friday Workshop at DATE 2014, Dresden, Germany
2014
/
p. 1-6
book article
174
newspaper article
TalTech panustab kosmosevaldkonda kiipide, päikesepaneelide ja satelliitidega
Normak, Liisu Kirke
Trialoog
2025
https://trialoog.taltech.ee/taltech-panustab-kosmosevaldkonda-kiipide-paikesepaneelide-ja-satelliitidega/
newspaper article
175
book article
Temporally extended high-level decision diagrams for PSL assertions simulation
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Proceedings : Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May 2008, Verbania, Italy
2008
/
p. 61-68 : ill
https://ieeexplore.ieee.org/document/4556029
book article
Number of records 198, displaying
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1.
Jenihhin, Maksim
2.
Andrijaškin, Maksim
3.
Antonov, Maksim
4.
Butsenko, Maksim
5.
Dolinin, Maksim
6.
Gorev, Maksim
7.
Kuleša, Maksim
8.
Maksim, I.
9.
Maksim, Tiit
10.
Mõttus, Maksim
11.
Ošeka, Maksim
12.
Radzvilovits, Maksim
13.
Ruchkin, Maksim
14.
Saat, Maksim
15.
Sitnikov, Maksim
16.
Säkki, Maksim
17.
Zelenski, Maksim
CV
9
1.
Jenihhin, Maksim
2.
Antonov, Maksim
3.
Butsenko, Maksim
4.
Gazizov, Maksim 1918-?
5.
Oseka, Maksim
6.
Osheka, Maksim
7.
Ošeka, Maksim
8.
Saat, Maksim
9.
Säkki, Maksim
name of the person
7
1.
Jenihhin, Maksim
2.
Antonov, Maksim
3.
Butsenko, Maksim
4.
Gorev, Maksim
5.
Gorki, Maksim, pseud., 1868-1936
6.
Ošeka, Maksim
7.
Saat, Maksim
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