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Ubar, Raimund-Johannes (author)
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101
book article
Calculation of the diagnosibility of digital circuits without using fault models
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 159-162 : ill
book article
102
journal article
Canonical representations of high-level decision diagrams
Karputkin, Anton
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Tombak, Mati
Estonian journal of engineering
2010
/
1, p. 39-55 : ill
journal article
103
journal article
Case study in testing digital systems
Ubar, Raimund-Johannes
Baltic electronics
1995
/
1, p. 24-27
journal article
104
journal article
CEBE - Centre for Integrated Electronic Systems and Biomedical Engineering
Fridolin, Ivo
;
Min, Mart
;
Ubar, Raimund-Johannes
The parliament magazine's research review : European research & innovation
2009
/
p. 35
journal article
105
journal article
Centre for Integrated Electronic Systems and Biomedical Engineering - CEBE
Ubar, Raimund-Johannes
Estonian journal of engineering
2010
/
1, p. 7-10 : ill
journal article
106
book article
Challenges for future system-on-chip design
Hollstein, Thomas
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Glesner, Manfred
Circuit Paradigm in the 21st Century : ECCTD '01 : proceedings of the 15th European Conference on Circuit Theory and Design : Helsinki University of Technology, Finland, 28th-31st August 2001. Vol 3
2001
/
p. 173-176
book article
107
book article
CMOS defects analysis using DefSim measurement environment
Pleskacz, Witold A.
;
Borejko, Tomasz
;
Walkanis, A.
;
Stopjakova, Viera
;
Jutman, Artur
;
Ubar, Raimund-Johannes
Informal Digest of Papers : Eleventh IEEE European Test Symposium : ETS 2006 : 21-24 May 2006, Southampton, United Kingdom
2006
/
p. 241-246 : ill
book article
108
book article
Code coverage analysis for concurrent programming languages using high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
Proceedings of the 12th European Workshop on Dependable Computing : EWDC 2009 : Toulouse, France, May 14-15, 2009
2009
/
[4] p. : ill
https://hal.archives-ouvertes.fr/hal-00381559
book article
109
book article
Code coverage analysis using high-level decision diagrams [Electronic resource]
Raik, Jaan
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Ellervee, Peeter
2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 2008
2008
/
p. 201-207 : ill. [CD-ROM]
https://ieeexplore.ieee.org/document/4538786
book article
110
book article
Collaborative distributed computing in the field of digital electronics testing
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
Balanced Automation Systems for Future Manufacturing Networks : 9th IFIP WG 5.5 International Conference : BASYS 2010 : Valencia, Spain, July 21-23, 2010 : proceedings
2010
/
p. 145-152
book article
111
book article
Collaborative distributed fault simulation for digital electronic circuits
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
Intelligent Distributed Computing IV : proceedings of the 4th International Symposium on Intelligent Distributed Computing - IDC 2010 : Tangier, Morocco, September 2010
2010
/
p. 67-76
book article
112
book article
Combinational fault simulation in sequential circuits
Ubar, Raimund-Johannes
;
Kõusaar, Jaak
;
Gorev, Maksim
;
Devadze, Sergei
2015 IEEE International Symposium on Circuits and Systems : 24-27 May 2015, Lisboa, Portugal : [proceedings]
2015
/
p. 2876-2879 : ill
book article
113
book article
Combined fault-model free cause-effect and effect-cause fault diagnosis in block-level digital networks
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
ASQED'09 : 1st Asia Symposium on Quality Electronic Design : Kuala Lumpur, Malaisia, July 15-16, 2009
2009
/
p. 385-390
https://ieeexplore.ieee.org/document/5206232
book article
114
book article
Combined pseudo-exhaustive and deterministic testing of array multipliers
Oyeniran, Adeboye Stephen
;
Azad, Siavoosh Payandeh
;
Ubar, Raimund-Johannes
2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 21st edition, 24th-26th May, Cluj-Napoca, Romania : proceedings
2018
/
6 p. : ill
https://doi.org/10.1109/AQTR.2018.8402708
book article
115
book article
Combining dynamic slicing and mutation operators for ESL correction
Repinski, Urmas
;
Hantson, Hanno
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th-June 1st, 2012, Annecy, France
2012
/
[6] p. : ill
https://ieeexplore.ieee.org/document/6233020
book article
116
journal article
Combining functional and structural approaches in test generation for digital systems
Ubar, Raimund-Johannes
Microelectronics reliability
1998
/
3, p. 317-329 : ill
journal article
117
book article
Combining learning, training and research in laboratory course for design and test
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
2000
/
p. 221-224 : ill
https://www.researchgate.net/publication/242397131_Combining_Learning_Training_and_Research_in_Laboratory_Course_for_Design_and_Test
book article
118
book article
Combining symbolic techniques with topological approach in test generation
Ubar, Raimund-Johannes
Proceedings of the 3rd Workshop on Mixed Design of Integrated Circuits and Systems, Lodz, May 1996
1996
/
p. 377-382
book article
119
book article
Compaction of decision diagrams for describing multi-process VHDL descriptions
Leveugle, R.
;
Saucier, Gabriele
;
Ubar, Raimund-Johannes
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 195-198: ill
book article
120
book article
Comparative analysis of sequential circuit test generation approaches
Raik, Jaan
;
Krivenko, Anna
;
Ubar, Raimund-Johannes
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 225-228 : ill
book article
121
book article
Comparison of genetic and random techniques for test pattern generation
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 163-166: ill
book article
122
book article
Comparison of two approaches to improve functional BIST fault coverage
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Gorev, Maksim
;
Mägi, Gunnar
BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia
2014
/
p. 105-108 : ill
book article
123
book article
Complex delay fault reasoning with sequential 7-valued algebra
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Aleksejev, Igor
2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 2015
2015
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2015.7102403
book article
124
book article
Computer-aided module-level text generation for digital devices on the basis of thin alternative graph-model
Pall, M.
;
Ubar, Raimund-Johannes
Preprints the 2nd IFAC/IFIP Symposium on Software for Computer Control, SOCOCO, Prague, Czechoslovakia, June 11-15, 1979 ; Vol. 2
1979
/
p. [?]
https://www.ester.ee/record=b2041567*est
book article
125
book article
Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p. : ill
https://doi.org/10.1109/BEC.2018.8600967
book article
Number of records 834, displaying
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CV
61
1.
Ubar, Raimund-Johannes 1941
2.
Räämet, Raimund 1918-2004
3.
Aare, Johannes 1915-2000
4.
Aavik, Eduard-Johannes
5.
Ahrenschild, Johannes (-1936)
6.
Alaots, Johannes
7.
Aljak, Arnold Johannes
8.
Allik, Erich-Johannes
9.
Avik, Eduard Johannes 1891-1942
10.
Drechsler, Wolfgang Johannes Max
11.
Ehala, Johannes 1986
12.
Hint, Johannes 1914-1985
13.
Johannes, Ille 1939
14.
Johannson, Johannes
15.
Johanson, Johannes
16.
Juhans, Johannes 1874-1956
17.
Kajander, Aleksi Oskar Johannes 1994
18.
Kiiwet, Johannes
19.
Kiivet, Johannes 1879-1967
20.
Kivit, Johannes
21.
Kollist, Johannes 1884-1937
22.
Kollist, Johannes Theodor
23.
Korv, August Johannes 1911-1981
24.
Krimmer, Robert Johannes
25.
Käpp, Martin Johannes
26.
Langel, Johannes 1900-1985
27.
Langell, Johannes
28.
Livländer, Robert Johannes
29.
Lutsar, Richard-Johannes
30.
Madise, Johannes 1920-?
31.
Maltenek, Evald Leonhard Johannes
32.
Matsulevitš, Johannes
33.
Meitre, Johannes 1906-1978
34.
Messer, Johannes
35.
Muru, Johannes 1995
36.
Mäll, Johannes 1911-1981
37.
Mühlman, Johannes
38.
Mühlmann, Johannes 1888-1936
39.
Notermans, Antonius Johannes Hubertus 1959
40.
Nuudi, Johannes 1895-1975
41.
Palo, Johannes 1925-1960
42.
Pals, Johannes 1903-1941
43.
Pello, Johannes 1958
44.
Pervik, Johannes 1892-1958
45.
Presmann, Johannes 1942
46.
Putk, Aksel-Johannes 1928-1999
47.
Püümann, Mait Johannes
48.
Renter, Olav-Johannes
49.
Roes, Johannes 1914
50.
Russwurm, Johannes
51.
Russvurm, Johannes 1855-1939
52.
Russvurm, Johannes Carl Gysbert Immanuel
53.
Sakeus, Johannes 1880-1934
54.
Taimsalu, Johannes 1891-1942
55.
Teiman, Johannes
56.
Teimann, Johannes Rudolf (kuni 22.05.1935)
57.
Tomson, Johannes
58.
Tuulre, Feliks Johannes 1908-1987
59.
Veerus, Johannes Voldemar 1897-1972
60.
Verus, Johannes Voldemar
61.
Vuhk, Oskar Johannes
author
57
1.
Ubar, Raimund-Johannes
2.
Hagelberg, Raimund
3.
Räämet, Raimund
4.
Aare, Johannes
5.
Allas, Johannes-Emmanuel
6.
Avik, Eduard Johannes
7.
Bauer, Johannes
8.
Bender, Naatan Johannes
9.
Buchmann, Johannes
10.
Deelstra, Johannes
11.
Ehala, Johannes
12.
Engelmayer, Johannes
13.
Gotzmann, Johannes
14.
Helander, Johannes
15.
Hint, Johannes
16.
Hüsse, Johannes
17.
Johannes, Anu
18.
Johannes, Ellen
19.
Johannes, Ille
20.
Johannes, Kaljo-Mihkel
21.
Järv, Johannes
22.
Kadak, Johannes
23.
Kajander, Aleksi Oskar Johannes
24.
Karstensen, Johannes
25.
Kerkhoven, Eduard Johannes
26.
Kiivet, Johannes
27.
Krimmer, Robert Johannes
28.
Kukebal, Johannes
29.
Meitre, Johannes
30.
Miller, Johannes
31.
Mühlman, Johannes
32.
Norberg, Johannes
33.
Notermans, Antonius Johannes Hubertus
34.
Ortlepp, Johannes
35.
Parikas, Johannes
36.
Pello, Johannes
37.
Pervik, Johannes-Eduard
38.
Piiper, Johannes
39.
Presmann, Johannes
40.
Putk, Aksel-Johannes
41.
Pätsch, Johannes
42.
Saar, Johannes
43.
Sautter, Johannes
44.
Sinisalo, Touko Johannes
45.
Steinbrunn, Johannes
46.
Sutt, Johannes
47.
Zeiringer, Johannes Paul
48.
Taimsalu, Johannes
49.
Talu, Martin Johannes
50.
Tammekänd, Johannes
51.
Tilk, Johannes
52.
Tralla, Johannes
53.
Veerus, Johannes
54.
Vibur, Johannes Ferdinand
55.
Vind, Johannes
56.
Voll, Johannes
57.
Voltri, Johannes
name of the person
28
1.
Ubar, Raimund-Johannes, 1941-
2.
Hagelberg, Raimund, 1927-2012
3.
Räämet, Raimund, 1918-2004
4.
Aare, Johannes, 1915-2000
5.
Aavik, Johannes, 1880-1973
6.
Avik, Eduard Johannes, 1891-1942
7.
Bender, Naatan Johannes
8.
Erm, Johannes, 1998-
9.
Granö, Johannes Gabriel
10.
Hint, Johannes, 1914-1985
11.
Johannes Paulus II, paavst, 1920-2005
12.
Kert, Johannes
13.
Kiivet, Johannes, 1879-1967
14.
Kollist, Johannes
15.
Käis, Johannes
16.
Lang, Johannes
17.
Maide, Johannes Voldemar
18.
Mossov, Johannes
19.
Pals, Johannes, 1903-1941
20.
Pello, Johannes
21.
Putk, Aksel-Johannes
22.
Rammul, Aleksander Johannes, 1875-1949
23.
Steinbrunn, Johannes
24.
Taimsalu, Johannes, 1891-1942
25.
Talu, Martin Johannes
26.
Veerus, Johannes Voldemar, 1897-1972
27.
Veski, Johannes Voldemar, 1873-1968
28.
Voll, Johannes
subject term
1
1.
Johannes Mittus, vasevalamise tööstus
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