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Ubar, Raimund-Johannes (TTÜ author)

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51

book article

Arvutite diagnostika uurimissuuna kujunemisest EestisUbar, Raimund-JohannesKõrgema tehnilise hariduse ja tehnilise mõtte areng Eestis1988 / lk. 110-127

book article
52

book article

Assembling low-level tests to high-level symbolic test framesJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings [of the] 15th NORCHIP Conference, Tallinn, 10-11 November 19971997 / p. 275-280: ill

book article
53

book article

Assertion checking with PSL and high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesDigest of papers IEEE 8th Workshop on RTL and High Level Testing : WRTLT'07 : October 12-13, 2007, Beijing, China2007 / p. 105-110 : ill https://pld.ttu.ee/~maksim/phd_papers/%5B12%5D%20wrtlt%2707.pdf

book article
54

book article

Assessment of diagnostic test for automated bug localizationTihhomirov, Valentin; Tšepurov, Anton; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesLATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]2013 / [6] p. : ill

book article
55

book article

Assessment of student's design results in e-learning-scenarios [Electronic resource]Wuttke, Heinz-Dietrich; Ubar, Raimund-Johannes; Henke, Karsten; Jutman, Artur8th International Conference on Technology Based Higher Education and Training : 10th to 13th July, 2007, KKR Hotel Kumamoto, Kumamoto, Japan : [proceedings]2007 / [6] p. [CD-ROM]

book article
56

newspaper article

Assotsiatsioon EUROCHIP avas ukse Tallinna TehnikaülikoolileUbar, Raimund-JohannesTehnikaülikool1993 / 17. märts, lk. 1-2

newspaper article
57

book article

Asynchronous e-learning resources for hardware design issuesJutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of the International Conference on Computer Systems and Technologies (e-learning) : CompSysTech'04 : Rousse, Bulgaria, 17-18 June2004 / p. IV.11-1 - IV.11-6 : ill https://www.researchgate.net/publication/234797327_Asynchronous_e-learning_resources_for_hardware_design_issues

book article
58

book article

At-speed functional built-in self-test methodology for processors [Electronic resource]Ubar, Raimund-Johannes; Indus, Viljar; Kalmend, OliverProceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka2012 / p. 168-172 : ill [CD-ROM]

book article
59

book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

book article
60

dissertation

At-speed testing and test quality evaluation for high-performance pipelined systems Töökiirusel testimine ja testi kvaliteedi hindamine kõrgjõudlus-konveierarhitektuuriga süsteemideleGorev, Maksim2015 https://digi.lib.ttu.ee/i/?3953

dissertation
61

journal article

Aufstellung von Testfolgen für logische SchaltungenPlakk, Mari; Ubar, Raimund-JohannesInternationales wissenschaftliches Kolloquium1979 / S. 93-96 https://www.ester.ee/record=b2936968*est

journal article
62

book article

Aukartus teaduse eesUbar, Raimund-JohannesRaimund-Johannes Ubar. Bibliograafia2016 / lk. 47-56

book article
63

newspaper article

Aukartus teaduse ees : [essee]. Nikolai Alumäe medalUbar, Raimund-JohannesSirp2014 / lk. 3-5 : fot https://www.sirp.ee/s1-artiklid/c21-teadus/aukartus-teaduse-ees/

newspaper article
64

book article

Automated correction of design errors by edge redirection on high-level decision diagramsKarputkin, Anton; Ubar, Raimund-Johannes; Tombak, Mati; Raik, Jaan13th International Symposium on Quality Electronic Design (ISQED), 20122012 / p. 686-693 : ill https://ieeexplore.ieee.org/document/6113980

book article
65

journal article

Automated design error debug using high-level decision diagrams and mutation operatorsRaik, Jaan; Repinski, Urmas; Tšepurov, Anton; Hantson, Hanno; Ubar, Raimund-Johannes; Jenihhin, MaksimMicroprocessors and microsystems2013 / p. 505-513 : ill

journal article
66

journal article

Automated design error localization in RTL designsJenihhin, Maksim; Tšepurov, Anton; Tihhomirov, Valentin; Raik, Jaan; Hantson, Hanno; Ubar, Raimund-Johannes; Bartsch, Günter; Meza Escobar, Jorge Hernan; Wuttke, Heinz-DietrichIEEE design & test of computers2014 / p. 83-92 : ill http://dx.doi.org/10.1109/MDAT.2013.2271420

journal article
67

journal article

Automated software-based in-field self-test program synthesisJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonInternational journal of microelectronics and computer science2017 / p. 57-64 : ill

journal article
68

book article

Automated software-based self-test generation for microprocessorsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonProceedings of the 24st International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2017 : Bydgoszcz, Poland, June 19-21, 20142017 / p. 453-458 : ill https://doi.org/10.23919/MIXDES.2017.8005252

book article
69

book article

Automated test bench generation for high-level synthesis flow ABELITEViilukas, Taavi; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Baranov, SamaryProceedings of IEEE East-West Design & Test Symposium (EWDTS'2011) : Sevastopol, Ukraine, September 9-12, 20112011 / p. 13-16 : ill https://ieeexplore.ieee.org/document/6116601

book article
70

book article

Automated test program synthesis for digital systems with high-level decision diagramsUbar, Raimund-JohannesProc. of 7th International Conference2005 / p. 171-180

book article
71

book article

Automatic diagnosis of simple design errorsUbar, Raimund-Johannes; Borrione, DominiqueTIMA annual report 19981999 / p. 97-98

book article
72

book article

Automatic diagnosis of simple design errorsUbar, Raimund-Johannes; Borrione, DominiqueTechniques of Informatics and Microelectronics for Computer Architecture1999 / p. 91

book article
73

book article

Automatic generation of EFSMs and HLDDs for functional ATPGTšepurov, Anton; Guglielmo, Giuseppe di; Raik, Jaan; Ubar, Raimund-Johannes; Viilukas, TaaviBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 143-146 : ill

book article
74

book article

Automatic SoC level test path synthesis based on partial functional modelsTšertov, Anton; Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei2011 Asian Test Symposium (ATS) : New Delhi, India2011 / p. 532-538 https://ieeexplore.ieee.org/document/6114730

book article
75

book article

Automatic test generation system for VLSIJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 19971997 / p. 255-258

book article

Number of records 831, displaying 51 - 75

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1. Ubar, Raimund-Johannes 1941
2. Palm, Raimund
3. Räämet, Raimund 1918-2004
4. Aare, Johannes 1915-2000
5. Aavik, Eduard-Johannes
6. Ahrenschild, Johannes (-1936)
7. Alaots, Johannes
8. Aljak, Arnold Johannes
9. Allik, Erich-Johannes
10. Avik, Eduard Johannes 1891-1942
11. Drechsler, Wolfgang Johannes Max
12. Ehala, Johannes 1986
13. Hint, Johannes 1914-1985
14. Johannes, Ille 1939
15. Johannson, Johannes
16. Johanson, Johannes
17. Juhans, Johannes 1874-1956
18. Kajander, Aleksi Oskar Johannes 1994
19. Kiiwet, Johannes
20. Kiivet, Johannes 1879-1967
21. Kivit, Johannes
22. Kollist, Johannes 1884-1937
23. Kollist, Johannes Theodor
24. Korv, August Johannes 1911-1981
25. Krimmer, Robert Johannes
26. Käpp, Martin Johannes
27. Langel, Johannes 1900-1985
28. Langell, Johannes
29. Livländer, Robert Johannes
30. Lutsar, Richard-Johannes
31. Madise, Johannes 1920-?
32. Maltenek, Evald Leonhard Johannes
33. Matsulevitš, Johannes
34. Meitre, Johannes 1906-1978
35. Messer, Johannes
36. Muru, Johannes 1995
37. Mäll, Johannes 1911-1981
38. Mühlman, Johannes
39. Mühlmann, Johannes 1888-1936
40. Notermans, Antonius Johannes Hubertus 1959
41. Nuudi, Johannes 1895-1975
42. Palo, Johannes 1925-1960
43. Pals, Johannes 1903-1941
44. Pello, Johannes 1958
45. Pervik, Johannes 1892-1958
46. Pervik, Johannes-Eduard
47. Presmann, Johannes 1942
48. Putk, Aksel-Johannes 1928-1999
49. Püümann, Mait Johannes
50. Renter, Olav-Johannes
51. Roes, Johannes 1914
52. Russwurm, Johannes
53. Russvurm, Johannes 1855-1939
54. Russvurm, Johannes Carl Gysbert Immanuel
55. Sakeus, Johannes 1880-1934
56. Taimsalu, Johannes 1891-1942
57. Teiman, Johannes
58. Teimann, Johannes Rudolf (kuni 22.05.1935)
59. Tomson, Johannes
60. Tuulre, Feliks Johannes 1908-1987
61. Veerus, Johannes Voldemar 1897-1972
62. Verus, Johannes Voldemar
63. Vuhk, Oskar Johannes

1. Ubar, Raimund-Johannes, 1941-
2. Hagelberg, Raimund, 1927-2012
3. Räämet, Raimund, 1918-2004
4. Aare, Johannes, 1915-2000
5. Aavik, Johannes, 1880-1973
6. Avik, Eduard Johannes, 1891-1942
7. Bender, Naatan Johannes
8. Erm, Johannes, 1998-
9. Granö, Johannes Gabriel
10. Hint, Johannes, 1914-1985
11. Johannes Paulus II, paavst, 1920-2005
12. Kert, Johannes
13. Kiivet, Johannes, 1879-1967
14. Kollist, Johannes
15. Käis, Johannes
16. Lang, Johannes
17. Maide, Johannes Voldemar
18. Mossov, Johannes
19. Pals, Johannes, 1903-1941
20. Pello, Johannes
21. Putk, Aksel-Johannes
22. Rammul, Aleksander Johannes, 1875-1949
23. Steinbrunn, Johannes
24. Taimsalu, Johannes, 1891-1942
25. Talu, Martin Johannes
26. Veerus, Johannes Voldemar, 1897-1972
27. Veski, Johannes Voldemar, 1873-1968
28. Voll, Johannes

1. Johannes Mittus, vasevalamise tööstus

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