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Ubar, Raimund-Johannes (TalTech author)
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151
book article
Defect-oriented test generation using probabilistic estimation
Cibakova, Tatiana
;
Fischerova, Maria
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 2000
2001
/
p. 131-136 : ill
book article
152
book article
Defects, faults and fault models
Gramatova, Elena
;
Fisherova, Maria
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
Handbook of testing electronic systems
2005
/
p. 26-96 : ill
book article
153
book article
DefSim - the defective IC
Pleskacz, Witold A.
;
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
DATE 2007 : Design Automation and Test in Europe : Nice, France, April 16-20, 2007
2007
/
p. s96 (2 p.)
book article
154
book article
DefSim: CMOS defects on chip for research and education
Pleskacz, Witold A.
;
Borejko, Tomasz
;
Walkanis, A.
;
Stopjakova, Viera
;
Jutman, Artur
;
Ubar, Raimund-Johannes
7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings
2006
/
p. 74-79 : ill
book article
155
book article
DefSim: measurement environment for CMOS defects
Borejko, Tomasz
;
Jutman, Artur
;
Pleskacz, Witold A.
;
Ubar, Raimund-Johannes
2006 25th International Conference on Microelectronics : Belgrade, Serbia and Montenegro, 14-17 May 2006 : proceedings. Volume 2
2006
/
p. 679-682
https://ieeexplore.ieee.org/document/1651048
book article
156
book article
DefSim-based exercises for studying defects in CMOS gates
Jutman, Artur
;
Pleskacz, Witold A.
;
Boiko, Nikolai
;
Ubar, Raimund-Johannes
EWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden
2006
/
p. 23-26 : ill
book article
157
book article
Delay testing of asynchronous NoC interconnects
Bengtsson, Tomas
;
Jutman, Artur
;
Kumar, Shashi
;
Ubar, Raimund-Johannes
Proceedings of the 12th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2005 : Krakow, Poland, 22-25 June, 2005. Vol. 1 of 2
2005
/
p. 419-424 : ill
book article
158
book article
Department of Computer Engineering
Keevallik, Andres
;
Ubar, Raimund-Johannes
Research activities / Tallinn Technical University
1993
/
p. 75-78
https://www.ester.ee/record=b1053754*est
book article
159
book article
Dependability evaluation in fault-tolerant systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ellervee, Peeter
Computer Science Meets Automation : 10-13 September 2007 : proceedings. Volume II
2007
/
p. 147-152 : ill
https://www.db-thueringen.de/receive/dbt_mods_00008864
book article
160
book article
Description of digital objects with alternative graphs for test generation purposes
Ubar, Raimund-Johannes
;
Lohuaru, Tõnu
Fault Tolerant Systems and Diagnostics : XI. International Conference ; Proceedings ; Suhl, June 6-9, 1988
1988
/
p. [?]
book article
161
book
Design and test technology for dependable systems-on-chip
2011
https://www.ester.ee/record=b4467408*est
book
162
journal article
Design error diagnosis in digital circuits with stuck-at fault model
Jutman, Artur
;
Ubar, Raimund-Johannes
Microelectronics reliability
2000
/
2, p. 307-320 : ill
journal article
163
book article
Design error diagnosis in digital circuits without error model
Ubar, Raimund-Johannes
;
Borrione, Dominique
VLSI : systems on a chip : IFIP TC10 WG10.5 Tenth International Conference on Very Large Scale Integration (VLSI'99) : December 1-4, 1999, Lisboa, Portugal
1999
/
p. 281-292 : ill
https://www.researchgate.net/publication/292157544_Design_Error_Diagnosis_in_Digital_Circuits_without_Error_Model
book article
164
book article
Design error diagnosis in scan-path designs
Ubar, Raimund-Johannes
2nd IEEE Latin American Test Workshop : LATW 2001 : Cancun, Mexico, February 11-14, 2001 : digest of papers
2001
/
p. 162-168 : ill
book article
165
book article
Design error diagnosis using backtrace algorithm on decision diagrams
Repinski, Urmas
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Tšepurov, Anton
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis
2010
/
p. 93-96
book article
166
journal article
Design error diagnosis with re-synthesis in combinational circuits
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2003
/
1, p. 73-82 : ill
https://link.springer.com/article/10.1023/A:1021948013402
journal article
167
book article
Design error localization in digital circuits by stuck-at fault test patterns
Jutman, Artur
;
Ubar, Raimund-Johannes
[MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 2
2000
/
p. 723-726
https://ieeexplore.ieee.org/document/838792
book article
168
book article
Design technologies for system-on-chip : fault simulation in complex digital designs
Hahanov, V.
;
Ubar, Raimund-Johannes
Автоматизированные системы управления и приборы автоматики, 2003
2003
/
p. 16-35
book article
169
journal article
Design-for-destability-based external test and diagnosis of mesh-like network- on-a-chips
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
IET computers and digital techniques
2009
/
5, p. 476-486 : ill
http://dx.doi.org/10.1049/iet-cdt.2008.0096
journal article
170
book article
Deterministic defect-oriented test generation for combinational circuits
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Sudbrock, Joachim
;
Kuzmicz, Wieslaw
;
Pleskacz, Witold A.
LATW 2005 : 6th IEEE Latin-American Test Workshop : March 30 - April 2, 2005, Salvador, Bahia, Brazil : [digest of papers]
2005
/
p. 325-330 : ill
book article
171
book article
DfT for application of external test patterns in a Network-on-a-Chip
Govind, Vineeth
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 25-28 : ill
book article
172
book article
Diagnosis and correction of multiple design errors using critical path tracing and mutation analysis
Hantson, Hanno
;
Repinski, Urmas
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
LATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador
2012
/
[6 p.] : ill
https://ieeexplore.ieee.org/document/6261234
book article
173
book article
Diagnostic modeling of digital systems with low- and high-level decision diagrams
Ubar, Raimund-Johannes
LATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]
2013
/
[1] p
book article
174
book article
Diagnostic modeling of digital systems with multi-level decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
;
Jenihhin, Maksim
Design and test technology for dependable systems-on-chip
2011
/
p. 92-118 : ill
https://www.researchgate.net/publication/344994231_Diagnostic_Modeling_of_Digital_Systems_with_Multi-Level_Decision_Diagrams
book article
175
book article
Diagnostic modeling of microprocessors with high-level decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
;
Jenihhin, Maksim
;
Brik, Marina
;
Istenberg, Martin
;
Wuttke, Heinz-Dietrich
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 147-150 : ill
book article
Number of records 829, displaying
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CV
66
1.
Ubar, Raimund-Johannes
2.
Palm, Raimund
3.
Räämet, Raimund 1918-2004
4.
Aare, Johannes 1915-2000
5.
Aavik, Eduard-Johannes
6.
Ahrenschild, Johannes (-1936)
7.
Alaots, Johannes
8.
Aljak, Arnold Johannes
9.
Allik, Erich-Johannes
10.
Avik, Eduard Johannes 1891-1942
11.
Drechsler, Wolfgang Johannes Max
12.
Ehala, Johannes
13.
Hint, Johannes 1914-1985
14.
Johannes, Ille
15.
Johannson, Johannes
16.
Johanson, Johannes
17.
Juhans, Johannes 1874-1956
18.
Kajander, Aleksi Oskar Johannes
19.
Kiiwet, Johannes
20.
Kiivet, Johannes 1879-1967
21.
Kivit, Johannes
22.
Kollist, Johannes 1884-1937
23.
Kollist, Johannes Theodor
24.
Korv, August Johannes 1911-1981
25.
Krimmer, Robert Johannes
26.
Käpp, Martin Johannes
27.
Langel, Johannes 1900-1985
28.
Langell, Johannes
29.
Livländer, Robert Johannes
30.
Lutsar, Richard-Johannes
31.
Madise, Johannes 1920-?
32.
Maltenek, Evald Leonhard Johannes
33.
Matsulevitš, Johannes
34.
Meitre, Johannes 1906-1978
35.
Messer, Johannes
36.
Muru, Johannes
37.
Mäll, Johannes 1911-1981
38.
Mühlman, Johannes
39.
Mühlmann, Johannes 1888-1936
40.
Notermans, Antonius Johannes Hubertus
41.
Nuudi, Johannes 1895-1975
42.
Palo, Johannes 1925-1960
43.
Pals, Johannes 1903-1941
44.
Pello, Johannes
45.
Pervik, Johannes 1892-1958
46.
Pervik, Johannes-Eduard
47.
Presmann, Johannes 1942-2013
48.
Putk, Aksel-Johannes 1928-1999
49.
Püümann, Mait Johannes
50.
Renter, Olav-Johannes
51.
Roes, Johannes
52.
Russwurm, Johannes
53.
Russvurm, Johannes 1855-1939
54.
Russvurm, Johannes Carl Gysbert Immanuel
55.
Sakeus, Johannes 1880-1934
56.
Soosaar, Arvid Johannes
57.
Taimsalu, Johannes 1891-1942
58.
Teiman, Johannes
59.
Teimann, Johannes Rudolf (kuni 22.05.1935)
60.
Tomson, Johannes
61.
Tuulre, Feliks Johannes 1908-1987
62.
Veerus, Johannes
63.
Veerus, Johannes Voldemar 1897-1972
64.
Weisberg, Karl-Johannes
65.
Verus, Johannes Voldemar
66.
Vuhk (Vuht), Oskar Johannes
author
62
1.
Ubar, Raimund-Johannes
2.
Hagelberg, Raimund
3.
Räämet, Raimund
4.
Aare, Johannes
5.
Allas, Johannes-Emmanuel
6.
Avik, Eduard Johannes
7.
Bauer, Johannes
8.
Bender, Naatan Johannes
9.
Buchmann, Johannes
10.
Deelstra, Johannes
11.
Edvardsson, Johannes
12.
Ehala, Johannes
13.
Einolander, Johannes
14.
Engelmayer, Johannes
15.
Gotzmann, Johannes
16.
Helander, Johannes
17.
Hint, Johannes
18.
Hüsse, Johannes
19.
Johannes, Anu
20.
Johannes, Ellen
21.
Johannes, Ille
22.
Johannes, Kaljo-Mihkel
23.
Järv, Johannes
24.
Kadak, Johannes
25.
Kajander, Aleksi Oskar Johannes
26.
Karstensen, Johannes
27.
Kerkhoven, Eduard Johannes
28.
Kiivet, Johannes
29.
Krimmer, Robert Johannes
30.
Kukebal, Johannes
31.
Matsulevitš, Johannes
32.
Meitre, Johannes
33.
Miller, Johannes
34.
Muru, Johannes
35.
Mühlman, Johannes
36.
Norberg, Johannes
37.
Notermans, Antonius Johannes Hubertus
38.
Ortlepp, Johannes
39.
Parikas, Johannes
40.
Pello, Johannes
41.
Pervik, Johannes-Eduard
42.
Piiper, Johannes
43.
Presmann, Johannes
44.
Putk, Aksel-Johannes
45.
Pätsch, Johannes
46.
Pötschke, Johannes
47.
Saar, Johannes
48.
Sautter, Johannes
49.
Sinisalo, Touko Johannes
50.
Steinbrunn, Johannes
51.
Sutt, Johannes
52.
Zeiringer, Johannes Paul
53.
Taimsalu, Johannes
54.
Talu, Martin Johannes
55.
Tammekänd, Johannes
56.
Tilk, Johannes
57.
Tralla, Johannes
58.
Veerus, Johannes
59.
Vibur, Johannes Ferdinand
60.
Vind, Johannes
61.
Voll, Johannes
62.
Voltri, Johannes
name of the person
29
1.
Ubar, Raimund-Johannes, 1941-
2.
Hagelberg, Raimund, 1927-2012
3.
Räämet, Raimund, 1918-2004
4.
Aare, Johannes, 1915-2000
5.
Aavik, Johannes, 1880-1973
6.
Avik, Eduard Johannes, 1891-1942
7.
Bender, Naatan Johannes
8.
Erm, Johannes, 1998-
9.
Granö, Johannes Gabriel
10.
Hint, Johannes, 1914-1985
11.
Johannes Paulus II, paavst, 1920-2005
12.
Kert, Johannes
13.
Kiivet, Johannes, 1879-1967
14.
Kollist, Johannes
15.
Käbin, Johannes (Ivan), 1905-1999
16.
Käis, Johannes
17.
Lang, Johannes
18.
Maide, Johannes Voldemar
19.
Mossov, Johannes
20.
Pals, Johannes, 1903-1941
21.
Pello, Johannes
22.
Putk, Aksel-Johannes
23.
Rammul, Aleksander Johannes, 1875-1949
24.
Steinbrunn, Johannes
25.
Taimsalu, Johannes, 1891-1942
26.
Talu, Martin Johannes
27.
Veerus, Johannes Voldemar, 1897-1972
28.
Veski, Johannes Voldemar, 1873-1968
29.
Voll, Johannes
subject term
1
1.
Johannes Mittus, vasevalamise tööstus
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