Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
digitaalintegraallülitused (subject term)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
74
Look more..
(1/1)
Export
export all inquiry results
(74)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
51
book article
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
book article
52
dissertation
Optimization of built-in self-test in digital systems = Sisseehitatud enesetestimise optimeerimine digitaalsüsteemides
Kruus, Helena
2011
dissertation
53
book article
Overview of the modular system for inference of finite state machines
Spitšakova, Margarita
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 95-98 : ill
book article
54
book
Parallel processing in FPGA-based digital circuits and systems
Sklyarov, Valery
;
Skliarova, Iouliia
2013
http://www.ester.ee/record=b2946103*est
book
55
book article
Practical works for on-line teaching design and test of digital circuits
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Hahanov, V.
;
Skvortsova, O.
The 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume III
2002
/
p. 1223-1226 : ill
http://dx.doi.org/10.1109/ICECS.2002.1046474
book article
56
book article
Representing logical inference steps with digital circuits
Matsak, Erika
Human interface and the management of information : information and interaction
2009
/
p. 178-184
https://link.springer.com/chapter/10.1007/978-3-642-02559-4_20
book article
57
book article
Research on digital system design and test at Tallinn University of Technology
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Hollstein, Thomas
;
Jervan, Gert
;
Jutman, Artur
;
Kruus, Margus
;
Raik, Jaan
Research in Estonia : present and future
2011
/
p. 184-205 : ill
book article
58
book
Riistvara kirjeldamiskeel - VHDL : metoodiline materjal
Tammemäe, Kalle
2003
http://www.ester.ee/record=b1605950*est
book
59
book
Riistvara kirjeldamiskeel VHDL : metoodiline materjal
Tammemäe, Kalle
2002
http://www.ester.ee/record=b1605950*est
book
60
dissertation
Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemid
Kostin, Sergei
2012
https://www.ester.ee/record=b2757857*est
dissertation
61
journal article
Sisseehitatud isetestimine digitaalsüsteemides
Kruus, Helena
A & A
2011
/
lk. 32-37 : ill
https://artiklid.elnet.ee/record=b2472216*est
journal article
62
book article
Structural fault collapsing by superposition of BDDs for test generation in digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
Proceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA
2010
/
p. 250-257 : ill
https://ieeexplore.ieee.org/document/5450451
book article
63
dissertation
Test program generation for microprocessor systems
Dušina, Julia
1993
https://www.ester.ee/record=b2090526*est
dissertation
64
book article
Testing strategies for networks on chip
Ubar, Raimund-Johannes
;
Raik, Jaan
Networks on chip
2003
/
p. 131-152 : ill
https://link.springer.com/chapter/10.1007/0-306-48727-6_7
book article
65
book article
3D parallel fault simulation
Gorev, Maksim
;
Ubar, Raimund-Johannes
Proceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere
2014
/
p. 39-42 : ill
book article
66
book article
Timing simulation of digital circuits with binary decision diagrams
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Peng, Z.
Design, Automation and Test in Europe : Conference and Exhibition 2001 : Munich, Germany, March 13-16, 2001 : proceedings
2001
/
p. 460-466 : ill
https://ieeexplore.ieee.org/document/915063
book article
67
book article
True path tracing in structurally synthesized BDDs for testability analysis of digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
Euromicro Conference on Digital System Design : DSD 2019 : 28 - 30 August 2019 Kallithea, Chalkidiki, Greece : proceedings
2019
/
p. 492-499 : ill
https://doi.org/10.1109/DSD.2019.00077
book article
68
book article
Using constraint solver in Test Pattern Generation Tool
Viilukas, Taavi
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 14-17 : ill
book article
69
book article
Web-based framework for parallel distributed test [Electronic resource]
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 2008
2008
/
p. 271-274 : ill. [CD-ROM]
https://ieeexplore.ieee.org/document/4538800
book article
70
dissertation
Исследование и разработка методов управления поиском дефектов в цифровых схемах : автореферат .... кандидата технических наук (05.13.01)
Evartson, Teet
1986
https://www.ester.ee/record=b1301665*est
dissertation
71
book article
Оценка тенденции использования некоторых видов микросхем
Maltsev, Jüri
;
Ševtšenko, S.
Тезисы докладов республиканской научно-технической конференции, посвященной Дню радио. [1], Секция: Информационно-измерительная техника
1981
/
с. 25-26
https://www.ester.ee/record=b1310782~S1*est
book article
72
journal article
Построение полных контролирующих тестов комбинационных схем
Ubar, Raimund-Johannes
Eesti NSV Teaduste Akadeemia toimetised. Füüsika. Matemaatika = Известия Академии наук Эстонской ССР. Физика. Математика = Proceedings of Academy of Sciences of the Estonian SSR. Physics. Mathematics
1982
/
lk. 418-427; ill.
https://www.ester.ee/record=b1264310*est
journal article
73
journal article
Построение тестов цыфровых схем при помощи модели Алтернативных графов
Plakk, Mari
;
Ubar, Raimund-Johannes
Автоматика и телемеханика
1980
/
с. 152-163 : илл
https://www.ester.ee/record=b1515055*est
journal article
74
book
Проектирование контролепригодных дискретных систем : учебное пособие
Ubar, Raimund-Johannes
1988
https://www.ester.ee/record=b1225400*est
book
Number of records 74, displaying
51 - 74
previous
1
2
3
next
subject term
1
1.
digitaalintegraallülitused
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT