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76
book article
Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Raik, Jaan
2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway
2015
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2015.7364406
book article
77
journal article
Sisseehitatud isetestimine digitaalsüsteemides
Kruus, Helena
A & A
2011
/
lk. 32-37 : ill
https://artiklid.elnet.ee/record=b2472216*est
journal article
78
book article
Structural fault collapsing by superposition of BDDs for test generation in digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
Proceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA
2010
/
p. 250-257 : ill
https://ieeexplore.ieee.org/document/5450451
book article
79
dissertation
Test program generation for microprocessor systems
Dušina, Julia
1993
https://www.ester.ee/record=b2090526*est
dissertation
80
book article
Testability calculation for digital circuits with decision diagrams
Ubar, Raimund-Johannes
3rd IEEE Latin American Test Workshop : LATW'02, Montevideu, Uruguay, February 10-13, 2002 : digest of papers
2002
/
p. 137-143 : ill
https://dblp.org/rec/conf/latw/Ubar02.html
book article
81
book article
Testability guided hierarchical test generation with decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Nõmmeots, Tanel
20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002
2002
/
p. 265-271
https://www.semanticscholar.org/paper/Testability-Guided-Hierarchical-Test-Generation-Ubar-Raik/c6301ac35d003c92f3867f26e2e75b87e1ad9b47
book article
82
book article
Testing strategies for networks on chip
Ubar, Raimund-Johannes
;
Raik, Jaan
Networks on chip
2003
/
p. 131-152 : ill
https://link.springer.com/chapter/10.1007/0-306-48727-6_7
book article
83
book article
3D parallel fault simulation
Gorev, Maksim
;
Ubar, Raimund-Johannes
Proceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere
2014
/
p. 39-42 : ill
book article
84
book article
Timing simulation of digital circuits with binary decision diagrams
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Peng, Z.
Design, Automation and Test in Europe : Conference and Exhibition 2001 : Munich, Germany, March 13-16, 2001 : proceedings
2001
/
p. 460-466 : ill
https://ieeexplore.ieee.org/document/915063
book article
85
book article
True path tracing in structurally synthesized BDDs for testability analysis of digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
Euromicro Conference on Digital System Design : DSD 2019 : 28 - 30 August 2019 Kallithea, Chalkidiki, Greece : proceedings
2019
/
p. 492-499 : ill
https://doi.org/10.1109/DSD.2019.00077
book article
86
book article
Using constraint solver in Test Pattern Generation Tool
Viilukas, Taavi
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 14-17 : ill
book article
87
book article
Web-based framework for parallel distributed test [Electronic resource]
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 2008
2008
/
p. 271-274 : ill. [CD-ROM]
https://ieeexplore.ieee.org/document/4538800
book article
88
dissertation
Исследование и разработка методов управления поиском дефектов в цифровых схемах : автореферат .... кандидата технических наук (05.13.01)
Evartson, Teet
1986
https://www.ester.ee/record=b1301665*est
dissertation
89
book article
Оценка тенденции использования некоторых видов микросхем
Maltsev, Jüri
;
Ševtšenko, S.
Тезисы докладов республиканской научно-технической конференции, посвященной Дню радио. [1], Секция: Информационно-измерительная техника
1981
/
с. 25-26
https://www.ester.ee/record=b1310782~S1*est
book article
90
journal article
Построение полных контролирующих тестов комбинационных схем
Ubar, Raimund-Johannes
Eesti NSV Teaduste Akadeemia toimetised. Füüsika. Matemaatika = Известия Академии наук Эстонской ССР. Физика. Математика = Proceedings of Academy of Sciences of the Estonian SSR. Physics. Mathematics
1982
/
lk. 418-427; ill.
https://www.ester.ee/record=b1264310*est
journal article
91
journal article
Построение тестов цыфровых схем при помощи модели Алтернативных графов
Plakk, Mari
;
Ubar, Raimund-Johannes
Автоматика и телемеханика
1980
/
с. 152-163 : илл
https://www.ester.ee/record=b1515055*est
journal article
92
book
Проектирование контролепригодных дискретных систем : учебное пособие
Ubar, Raimund-Johannes
1988
https://www.ester.ee/record=b1225400*est
book
Number of records 92, displaying
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