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26

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Elektroonikaaparatuuri töökindluse arvutamine : metoodiline juhend1977 https://www.ester.ee/record=b1266100*est

book

27

book

Elektroonikaseadmete raalprojekteerimineLehtla, Madis2002 http://www.ester.ee/record=b1729819*est

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28

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Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668

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29

journal article

Fehlerbestimmung in kombinatorischen Scaltungen durch Lösung der Booleschen DifferentialgleichungenUbar, Raimund-JohannesNachrichtentechnik, Elektronik : technisch-wissenschaftlishe Zeitschrift für die gesamte elektronische Nachrichtentechnik1978 / p. 330-334 : ill https://www.ester.ee/record=b1550811*est

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30

journal article

GIGA: failure prediction of ESD protection devicesFreidin, Boris; Udal, AndresThe Bug Exterminator : a monthly publication of Silvaco International1992 / 11, p. 1-3

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31

journal article

Häälemoonuti algajale ufoloogileSinivee, VeljoArvutikasutaja2004 / 5, lk. 10-12 : ill https://artiklid.elnet.ee/record=b1062084*est

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32

book article

Hybrid BIST optimization for core-based systems with test pattern broadcastingUbar, Raimund-Johannes; Jenihhin, Maksim; Jervan, Gert; Peng, ZeboDELTA 2004 : second IEEE International Workshop on Electronic Design, Test and Applications : 28-30 January 2004, Perth, Australia : proceedings2004 / p. 3-8 : ill https://ieeexplore.ieee.org/document/1409808

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33

book article

Internet-based software for teaching test of digital circuitsUbar, Raimund-Johannes; Orasson, Elmet; Wuttke, Heinz-Dietrich23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 659-662 : ill https://ieeexplore.ieee.org/document/1003344

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34

book article

Internet-based software for teaching test of digital circuitsUbar, Raimund-Johannes; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Evartson, Teet; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 4th European Workshop on Microelectronics Education : EWME 2002, Spain, May 23-24, 20022002 / p. 317-320 : ill https://ieeexplore.ieee.org/document/1003344

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35

book article

Invited paper: System-Wide Fault Management based on IEEE P1687 IJTAGJutman, Artur; Devadze, Sergei; Aleksejev, Jevgeni6th International Workshop on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC) : 20-22 June 2011, Montpeillier, France2011 / [4] p.: ill https://ieeexplore.ieee.org/document/5981520

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36

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IST project REASON : handbook of testing electronic systemsNovak, Ondrej; Gramatova, Elena; Ubar, Raimund-JohannesIEEE Proceedings of the 5th European Dependable Computing Conference : EDCC-5 : Budapest, 20052005 / p. 15-18

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37

newspaper article

Kas tunned end hästi? Või on sind hetk tagasi tabanud tervisehäire? Seda ei ütle tulevikus esimesena arst, vaid kõikvõimalikud meditsiini- ja keskkonnaandurid [Võrguväljaanne]digi.geenius.ee2022 "Kas tunned end hästi? Või on sind hetk tagasi tabanud tervisehäire? Seda ei ütle tulevikus esimesena arst, vaid kõikvõimalikud meditsiini- ja keskkonnaandurid"

newspaper article

38

journal article

Kasutuselt kõrvaldatud personaalarvutites sisalduva plasti ringlussevõttKers, Jaan; Küttis, Taavi; Kaupmees, ElenKeskkonnatehnika2006 / 7, lk. 18-21 : ill https://artiklid.elnet.ee/record=b1019684*est

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39

journal article

Kõigile meeldivad targad tooted - tehkem siis rohkem koos- ja arendustööd!Sarv, Mari ÖöMente et Manu2018 / lk. 36-37 : fot https://www.ttu.ee/ttu-uudised/ajaleht-mente-et-manu/mente-et-manu/ http://www.ester.ee/record=b1242496*est https://artiklid.elnet.ee/record=b2836035*est

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40

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Learning digital test and diagnostics via internet [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Kruus, Margus; Orasson, Elmet; Devadze, Sergei; Wuttke, Heinz-DietrichInternational journal of computing & information sciences2006 / 2, p. 86-96 : ill

journal article

41

book article

Low noise LDO architecture with consideration for low voltage operationMihhailov, Juri; Strik, Viktor; Strik, Sergei; Rang, ToomasBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 41-44 : ill

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42

dissertation

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseksBagbaba, Ahmet Cagri2022 https://doi.org/10.23658/taltech.9/2022 https://digikogu.taltech.ee/et/Item/58b0b89d-b1ba-4a73-ba53-850910d697b5 https://www.ester.ee/record=b5491885*est

dissertation

Seotud publikatsioonid 10

43

book article

A modified frequency error estimator for the block adaptive Fourier analyzerRonk, AntsThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 103-106 : ill https://www.ester.ee/record=b2150914*est

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44

book article

More than depth : developing pressure sensing systems for aquatic environmentsSchletterer, Martin; Tuhtan, Jeffrey Andrew; Fuentes-Pérez, Juan Francisco; Kruusmaa, MaarjaHydroSenSoft, International Symposium and Exhibition on Hydro-Environment Sensors and Software : 1-3 March 2017, Madrid, Spain2017 / p. 1-7 : ill

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45

journal article

Mustamäe mändide alt Iraagi kõrbesse : [Andres Taklaja firmast Rantelon]Aru, ErikForbes2013 / lk. 24-26 : portr

journal article

46

book article

Nanoscale and microscale simulations of N-N junction heterostructures of 3C-4H silicon carbideRashid, Muhammad Haroon; Koel, Ants; Rang, Toomas; Gähwiler, Reto; Grosberg, Martin; Jõemaa, RaunoMaterials and contact characterisation VIII2017 / p. 235-248 : ill http://dx.doi.org/10.2495/MC170241

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47

book article

Numerical simulation of electrothermal effects in ESD protection devicesHellstrom, S.; Freidin, Boris; Velmre, Enn; Udal, AndresTechn. Dig. of the 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 1992, Oct. 5-8, Schwabisch Gmünd, Germany1992

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48

journal article

Optilise ja raadiokiirguse registreerimine vastuvõtja elektroonika seisukohastTaklaja, AndresSide. Raadio. Televisioon : infoseeria 101979 / lk. 16-18 https://www.ester.ee/record=b1232303*est

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49

book article

Optimierte Steuerung der Fehlersuche auf digitalen LeiterplattenThomä, E.; Ubar, Raimund-JohannesProceedings of the 27th International Conference, Technical University of Ilmenau, October, 19821982 / p. 65-68

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50

book article

Optimization of FSMs network by new encoding strategyFomina, Jelena; Sudnitsõn, Aleksander; Vasiliev, RomanBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 119-122 : ill

book article

elektroonikaaparatuur (subject term)

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