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implementation-independent test generation (keyword)
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book article
Implementation-independent test generation for a large class of faults in RISC processor modules
Jenihhin, Maksim
;
Oyeniran, Adeboye Stephen
;
Raik, Jaan
;
Ubar, Raimund-Johannes
24th Euromicro Conference on Digital System Design (DSD)
2021
https://doi.org/10.1109/DSD53832.2021.00090
book article
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keyword
44
1.
implementation-independent test generation
2.
Implementation-Independent Testing of Microprocessors
3.
adaptive test strategy generation
4.
automated test pattern generation
5.
automatic test case generation
6.
automatic test pattern generation
7.
automatic test program generation
8.
behaviour level test generation
9.
functional test generation
10.
Hierarchical Multi-level Test Generation
11.
high-level test data generation
12.
highlevel test generation
13.
offline test generation
14.
provably correct test generation
15.
test generation
16.
test generation and fault diagnosis
17.
Test Group Generation for Detecting Multiple Faults
18.
test program generation
19.
data-independent acquisition
20.
distributed independent reinforcement learning
21.
fast independent component analysis
22.
load-independent voltage output
23.
CDIO implementation
24.
design and implementation of Performance Management Systems
25.
Europe and digital implementation
26.
FPGA implementation
27.
fractional control implementation
28.
hardware implementation
29.
implementation
30.
implementation challenges
31.
implementation of change
32.
implementation of IFRS
33.
implementation of IFRS for small and medium-sized entities (SMEs)
34.
implementation of IFRS for SMEs
35.
implementation of innovations
36.
implementation of International Financial Reporting Standards (IFRS)
37.
implementation process
38.
implementation technology
39.
PLM implementation
40.
PLM implementation strategy
41.
policy implementation
42.
software implementation
43.
technology implementation
44.
tool-supported implementation
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