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test generation (keyword)
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1
book article
Aspect-oriented testing of a rehabilitation system
Sarna, Külli
;
Vain, Jüri
VALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France
2014
/
p. 73-78 : ill
book article
2
book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
3
book article
Exploiting aspects in model-based testing
Sarna, Külli
;
Vain, Jüri
FOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German
2012
/
p. 45-47 : ill
https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing
book article
4
book article EST
/
book article ENG
GUARD: An ABC-GA hybrid approach utilizing mAchine LeaRning and dimensionality reduction for hardware Trojan detection
Hosseini, Mostafa
;
Azarpeyvand, Ali
;
Bagheri, Foad
;
Ghasempouri, Tara
2025 IEEE East-West Design & Test Symposium (EWDTS)
2025
/
8 p
http://doi.org/10.1109/EWDTS67441.2025.11303691
book article EST
/
book article ENG
5
book article
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
book article
6
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
7
book article
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
book article
8
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
9
book article
Multiple control fault testing in digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/AQTR.2016.7501287
book article
10
book article
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
book article
11
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
12
book article EST
/
book article ENG
PATROL: an evolutionary APproach to Automatic Test Pattern Generation for hardware TROjan detection leveraging PSO-GA hybrid techniques
Hosseini, Mostafa
;
Azarpeyvand, Ali
;
Ghasempouri, Tara
Proceedings of the 2024 IEEE 33rd Asian Test Symposium : ATS 2024 : Ahmedabad, India, 17-20 December 2024
2024
/
6 p.
https://doi.org/10.1109/ATS64447.2024.10915294
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
13
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
14
book article
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
book article
15
book article
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
book article
16
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
Number of records 16, displaying
1 - 16
keyword
225
1.
behaviour level test generation
2.
functional test generation
3.
Hierarchical Multi-level Test Generation
4.
highlevel test generation
5.
implementation-independent test generation
6.
offline test generation
7.
provably correct test generation
8.
test generation
9.
test generation and fault diagnosis
10.
adaptive test strategy generation
11.
automated test pattern generation
12.
automatic test case generation
13.
automatic test pattern generation
14.
automatic test program generation
15.
high-level test data generation
16.
Test Group Generation for Detecting Multiple Faults
17.
test program generation
18.
Activity-based demand generation
19.
automated code generation
20.
automatic code generation
21.
Automatic generation control
22.
automatic GUI model generation
23.
building and urban form generation
24.
business model generation
25.
code generation
26.
data set generation
27.
decentralized key generation
28.
disaster alert generation
29.
distributed electricity generation
30.
distributed generation
31.
Distributed Generation (DG)
32.
distributed generation systems
33.
distributed power generation
34.
distrubuted power generation
35.
droplet generation
36.
droplet generation rate control
37.
electric power generation
38.
electricity generation
39.
energy generation
40.
extreme penetration level of non synchronous generation
41.
feasible path generation
42.
fifth generation computer
43.
food waste generation
44.
fourth generation district heating
45.
frequent item generation
46.
generation
47.
generation and transmission expansion planning
48.
Generation Costs
49.
generation of electric energy
50.
generation scheduling
51.
generation succession
52.
heat generation
53.
hydroelectric power generation
54.
hydrogen generation
55.
I–III generation
56.
job generation
57.
knowledge generation
58.
multisine generation
59.
next generation 4D printing
60.
next generation sequencing
61.
Next-generation probiotics
62.
next-generation sequencing
63.
oil-shale power generation
64.
pattern Generation
65.
photovoltaic (PV) generation
66.
photovoltaic generation dispatch
67.
power generation
68.
power generation dispatch
69.
power generation economics
70.
power generation planning
71.
PV generation
72.
PV power generation
73.
Renewable energy generation
74.
renewable generation
75.
residual generation
76.
rule generation
77.
Scenario Generation
78.
Second generation bioethanol
79.
second generation of tribology models
80.
second generation sequencing
81.
signal generation
82.
silver generation
83.
sixth-generation (6G)
84.
solar power generation
85.
space generation advisory council
86.
template based sql generation
87.
trajectory generation
88.
waste generation
89.
wave generation
90.
WEEE generation
91.
white light generation
92.
wind energy generation
93.
wind generation
94.
wind power generation
95.
16S rRNA gene amplicon next-generation sequencing
96.
4GDH (4th generation district heating)
97.
4th generation district heating
98.
5th generation district heating
99.
accelerated shelf-life test
100.
antigen test
101.
Applications in Test Engineering
102.
ASTM G65 dry sand rubber wheel abrasion test
103.
Automated Synthesis of Software-based Self-test
104.
automated test environment
105.
Auvergne test-bed
106.
battery test
107.
behavioral test
108.
bending test
109.
bit-error rate test
110.
Board and System Test
111.
board test
112.
bounds test
113.
built-in self-test
114.
capillary condensation redistribution test
115.
chi-square test
116.
closed bottle test
117.
cognitive screening test
118.
compartment fire test
119.
compartment test
120.
cone penetration test (CPT)
121.
COVID-19 antigen test
122.
cutting test
123.
cybersecurity test bed
124.
DDR4 interconnect test
125.
design and test
126.
design-for-test
127.
deterministic test sequences
128.
diagnostic test
129.
digital test
130.
Digital test and testable design
131.
double-pulse test
132.
drawing test
133.
dry droplet antimicrobial test
134.
Embedded figures test
135.
embedded test
136.
fan pressurisation test
137.
final test result prediction
138.
four-point bending test
139.
FPGA based test
140.
FPGA-Assisted Test
141.
FPGA-centric test
142.
functional self-test
143.
Granger causality test
144.
hardness test
145.
high-level synthesis for test
146.
high-speed serial link test
147.
IEEE 9 bus test system
148.
in situ tensile test in SEM
149.
industrial field test
150.
in-situ tensile test in SEM
151.
Johansen cointegration test
152.
Kolmogorov-Smirnov test
153.
load test
154.
logic built-in self-test
155.
Luria alternating series test
156.
Mann–Kendall test
157.
Mann-Kendall trend test
158.
memory interconnect test
159.
microprocessor test
160.
Model test
161.
multiplier test
162.
orthogonal test
163.
package test analysis
164.
parallel design and test
165.
performance test
166.
piezocone penetration test (CPTu)
167.
Point Load Test index
168.
pressurisation test
169.
processor-centric board test
170.
progressive damage test
171.
pseudo-exhaustive test
172.
purity test
173.
real-time room temperature test
174.
rolling thin film oven test
175.
rtioco-based timed test sequences
176.
seasonal Mann Kendall test
177.
seismic piezocone penetration test
178.
self-test
179.
self-test architectures
180.
sentence writing test
181.
serial sevens test
182.
ship towing test tank
183.
similar material simulation test
184.
small-scale fire test
185.
small‐scale test
186.
software based self-test
187.
software-based self-test
188.
software-based self-test (SBST)
189.
soil phosphorus (P) test
190.
standard test method
191.
static load test
192.
static-dynamic probing test (SDT)
193.
stress test
194.
system level test
195.
teaching design and test of systems
196.
tensile test
197.
tensile test
198.
test
199.
test and evaluation platform
200.
test automation
201.
test bench
202.
test coverage
203.
test driven development
204.
test driven modelling
205.
test embankment
206.
test equipment
207.
test groups
208.
test model design
209.
test optimization
210.
test packets
211.
test path synthesis
212.
test patterns
213.
test point insertion
214.
test reference year
215.
test replication
216.
test scenario description language
217.
test-bed
218.
test-chips
219.
test-house
220.
test-pattern
221.
test-suite reduction
222.
Three-point bending test
223.
unit root test
224.
usability platform test
225.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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