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1
book article
Aspect-oriented testing of a rehabilitation system
Sarna, Külli
;
Vain, Jüri
VALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France
2014
/
p. 73-78 : ill
book article
2
book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
3
book article
Exploiting aspects in model-based testing
Sarna, Külli
;
Vain, Jüri
FOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German
2012
/
p. 45-47 : ill
https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing
book article
4
book article
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
book article
5
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
6
book article
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
book article
7
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
8
book article
Multiple control fault testing in digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/AQTR.2016.7501287
book article
9
book article
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
book article
10
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
11
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
12
book article
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
book article
13
book article
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
book article
14
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
Number of records 14, displaying
1 - 14
keyword
218
1.
behaviour level test generation
2.
functional test generation
3.
Hierarchical Multi-level Test Generation
4.
highlevel test generation
5.
implementation-independent test generation
6.
offline test generation
7.
provably correct test generation
8.
test generation
9.
test generation and fault diagnosis
10.
adaptive test strategy generation
11.
automated test pattern generation
12.
automatic test case generation
13.
automatic test pattern generation
14.
automatic test program generation
15.
high-level test data generation
16.
Test Group Generation for Detecting Multiple Faults
17.
test program generation
18.
Activity-based demand generation
19.
automated code generation
20.
automatic code generation
21.
Automatic generation control
22.
automatic GUI model generation
23.
building and urban form generation
24.
business model generation
25.
code generation
26.
data set generation
27.
decentralized key generation
28.
disaster alert generation
29.
distributed electricity generation
30.
distributed generation
31.
Distributed Generation (DG)
32.
distributed generation systems
33.
distributed power generation
34.
distrubuted power generation
35.
droplet generation
36.
droplet generation rate control
37.
electric power generation
38.
electricity generation
39.
energy generation
40.
extreme penetration level of non synchronous generation
41.
feasible path generation
42.
fifth generation computer
43.
fourth generation district heating
44.
frequent item generation
45.
generation
46.
generation and transmission expansion planning
47.
Generation Costs
48.
generation of electric energy
49.
generation scheduling
50.
generation succession
51.
heat generation
52.
hydroelectric power generation
53.
hydrogen generation
54.
I–III generation
55.
job generation
56.
knowledge generation
57.
multisine generation
58.
next generation 4D printing
59.
next generation sequencing
60.
Next-generation probiotics
61.
next-generation sequencing
62.
oil-shale power generation
63.
pattern Generation
64.
photovoltaic (PV) generation
65.
photovoltaic generation dispatch
66.
power generation
67.
power generation dispatch
68.
power generation economics
69.
power generation planning
70.
PV generation
71.
PV power generation
72.
Renewable energy generation
73.
renewable generation
74.
residual generation
75.
rule generation
76.
Second generation bioethanol
77.
second generation of tribology models
78.
second generation sequencing
79.
signal generation
80.
silver generation
81.
solar power generation
82.
space generation advisory council
83.
template based sql generation
84.
trajectory generation
85.
waste generation
86.
wave generation
87.
white light generation
88.
wind energy generation
89.
wind generation
90.
wind power generation
91.
16S rRNA gene amplicon next-generation sequencing
92.
4GDH (4th generation district heating)
93.
4th generation district heating
94.
5th generation district heating
95.
accelerated shelf-life test
96.
antigen test
97.
Applications in Test Engineering
98.
ASTM G65 dry sand rubber wheel abrasion test
99.
Automated Synthesis of Software-based Self-test
100.
automated test environment
101.
Auvergne test-bed
102.
battery test
103.
behavioral test
104.
bending test
105.
bit-error rate test
106.
Board and System Test
107.
board test
108.
bounds test
109.
built-in self-test
110.
capillary condensation redistribution test
111.
chi-square test
112.
closed bottle test
113.
cognitive screening test
114.
compartment fire test
115.
compartment test
116.
cone penetration test (CPT)
117.
COVID-19 antigen test
118.
cutting test
119.
cybersecurity test bed
120.
DDR4 interconnect test
121.
design and test
122.
design-for-test
123.
deterministic test sequences
124.
diagnostic test
125.
digital test
126.
Digital test and testable design
127.
double-pulse test
128.
drawing test
129.
dry droplet antimicrobial test
130.
embedded test
131.
fan pressurisation test
132.
final test result prediction
133.
four-point bending test
134.
FPGA based test
135.
FPGA-Assisted Test
136.
FPGA-centric test
137.
functional self-test
138.
Granger causality test
139.
hardness test
140.
high-level synthesis for test
141.
high-speed serial link test
142.
IEEE 9 bus test system
143.
in situ tensile test in SEM
144.
industrial field test
145.
in-situ tensile test in SEM
146.
Johansen cointegration test
147.
Kolmogorov-Smirnov test
148.
load test
149.
logic built-in self-test
150.
Luria alternating series test
151.
Mann–Kendall test
152.
memory interconnect test
153.
microprocessor test
154.
Model test
155.
multiplier test
156.
orthogonal test
157.
package test analysis
158.
parallel design and test
159.
performance test
160.
piezocone penetration test (CPTu)
161.
Point Load Test index
162.
pressurisation test
163.
processor-centric board test
164.
progressive damage test
165.
pseudo-exhaustive test
166.
purity test
167.
rolling thin film oven test
168.
rtioco-based timed test sequences
169.
seasonal Mann Kendall test
170.
seismic piezocone penetration test
171.
self-test
172.
self-test architectures
173.
sentence writing test
174.
serial sevens test
175.
ship towing test tank
176.
similar material simulation test
177.
small-scale fire test
178.
small‐scale test
179.
software based self-test
180.
software-based self-test
181.
software-based self-test (SBST)
182.
soil phosphorus (P) test
183.
standard test method
184.
static load test
185.
static-dynamic probing test (SDT)
186.
stress test
187.
system level test
188.
teaching design and test of systems
189.
tensile test
190.
tensile test
191.
test
192.
test and evaluation platform
193.
test automation
194.
test bench
195.
test coverage
196.
test driven development
197.
test driven modelling
198.
test embankment
199.
test equipment
200.
test groups
201.
test model design
202.
test optimization
203.
test packets
204.
test path synthesis
205.
test patterns
206.
test point insertion
207.
test reference year
208.
test replication
209.
test scenario description language
210.
test-bed
211.
test-chips
212.
test-house
213.
test-pattern
214.
test-suite reduction
215.
Three-point bending test
216.
unit root test
217.
usability platform test
218.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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