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test generation (keyword)
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1
book article
Aspect-oriented testing of a rehabilitation system
Sarna, Külli
;
Vain, Jüri
VALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France
2014
/
p. 73-78 : ill
book article
2
book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
3
book article
Exploiting aspects in model-based testing
Sarna, Külli
;
Vain, Jüri
FOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German
2012
/
p. 45-47 : ill
https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing
book article
4
book article
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
book article
5
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
6
book article
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
book article
7
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
8
book article
Multiple control fault testing in digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/AQTR.2016.7501287
book article
9
book article
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
book article
10
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
11
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
12
book article
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
book article
13
book article
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
book article
14
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
Number of records 14, displaying
1 - 14
keyword
215
1.
behaviour level test generation
2.
functional test generation
3.
Hierarchical Multi-level Test Generation
4.
highlevel test generation
5.
implementation-independent test generation
6.
offline test generation
7.
provably correct test generation
8.
test generation
9.
test generation and fault diagnosis
10.
adaptive test strategy generation
11.
automated test pattern generation
12.
automatic test case generation
13.
automatic test pattern generation
14.
automatic test program generation
15.
high-level test data generation
16.
Test Group Generation for Detecting Multiple Faults
17.
test program generation
18.
Activity-based demand generation
19.
automated code generation
20.
automatic code generation
21.
Automatic generation control
22.
automatic GUI model generation
23.
building and urban form generation
24.
business model generation
25.
code generation
26.
data set generation
27.
decentralized key generation
28.
disaster alert generation
29.
distributed electricity generation
30.
distributed generation
31.
Distributed Generation (DG)
32.
distributed generation systems
33.
distributed power generation
34.
distrubuted power generation
35.
droplet generation
36.
droplet generation rate control
37.
electric power generation
38.
electricity generation
39.
energy generation
40.
extreme penetration level of non synchronous generation
41.
feasible path generation
42.
fifth generation computer
43.
fourth generation district heating
44.
frequent item generation
45.
generation
46.
generation and transmission expansion planning
47.
Generation Costs
48.
generation of electric energy
49.
generation succession
50.
heat generation
51.
hydroelectric power generation
52.
hydrogen generation
53.
I–III generation
54.
job generation
55.
multisine generation
56.
next generation 4D printing
57.
next generation sequencing
58.
Next-generation probiotics
59.
next-generation sequencing
60.
oil-shale power generation
61.
pattern Generation
62.
photovoltaic (PV) generation
63.
photovoltaic generation dispatch
64.
power generation
65.
power generation dispatch
66.
power generation economics
67.
power generation planning
68.
PV generation
69.
PV power generation
70.
Renewable energy generation
71.
renewable generation
72.
residual generation
73.
Second generation bioethanol
74.
second generation of tribology models
75.
second generation sequencing
76.
signal generation
77.
silver generation
78.
solar power generation
79.
space generation advisory council
80.
template based sql generation
81.
trajectory generation
82.
waste generation
83.
wave generation
84.
white light generation
85.
wind energy generation
86.
wind generation
87.
wind power generation
88.
16S rRNA gene amplicon next-generation sequencing
89.
4GDH (4th generation district heating)
90.
4th generation district heating
91.
5th generation district heating
92.
accelerated shelf-life test
93.
antigen test
94.
Applications in Test Engineering
95.
ASTM G65 dry sand rubber wheel abrasion test
96.
Automated Synthesis of Software-based Self-test
97.
automated test environment
98.
Auvergne test-bed
99.
battery test
100.
behavioral test
101.
bending test
102.
bit-error rate test
103.
Board and System Test
104.
board test
105.
bounds test
106.
built-in self-test
107.
capillary condensation redistribution test
108.
chi-square test
109.
closed bottle test
110.
cognitive screening test
111.
compartment fire test
112.
compartment test
113.
cone penetration test (CPT)
114.
COVID-19 antigen test
115.
cutting test
116.
cybersecurity test bed
117.
DDR4 interconnect test
118.
design and test
119.
design-for-test
120.
deterministic test sequences
121.
diagnostic test
122.
digital test
123.
Digital test and testable design
124.
double-pulse test
125.
drawing test
126.
dry droplet antimicrobial test
127.
embedded test
128.
fan pressurisation test
129.
final test result prediction
130.
four-point bending test
131.
FPGA based test
132.
FPGA-Assisted Test
133.
FPGA-centric test
134.
functional self-test
135.
Granger causality test
136.
hardness test
137.
high-level synthesis for test
138.
high-speed serial link test
139.
IEEE 9 bus test system
140.
in situ tensile test in SEM
141.
industrial field test
142.
in-situ tensile test in SEM
143.
Johansen cointegration test
144.
Kolmogorov-Smirnov test
145.
load test
146.
logic built-in self-test
147.
Luria alternating series test
148.
Mann–Kendall test
149.
memory interconnect test
150.
microprocessor test
151.
Model test
152.
multiplier test
153.
orthogonal test
154.
package test analysis
155.
parallel design and test
156.
performance test
157.
piezocone penetration test (CPTu)
158.
Point Load Test index
159.
pressurisation test
160.
processor-centric board test
161.
progressive damage test
162.
pseudo-exhaustive test
163.
purity test
164.
rolling thin film oven test
165.
rtioco-based timed test sequences
166.
seasonal Mann Kendall test
167.
seismic piezocone penetration test
168.
self-test
169.
self-test architectures
170.
sentence writing test
171.
serial sevens test
172.
ship towing test tank
173.
similar material simulation test
174.
small-scale fire test
175.
small‐scale test
176.
software based self-test
177.
software-based self-test
178.
software-based self-test (SBST)
179.
soil phosphorus (P) test
180.
standard test method
181.
static load test
182.
static-dynamic probing test (SDT)
183.
stress test
184.
system level test
185.
teaching design and test of systems
186.
tensile test
187.
tensile test
188.
test
189.
test and evaluation platform
190.
test automation
191.
test bench
192.
test coverage
193.
test driven development
194.
test driven modelling
195.
test embankment
196.
test equipment
197.
test groups
198.
test model design
199.
test optimization
200.
test packets
201.
test path synthesis
202.
test patterns
203.
test point insertion
204.
test reference year
205.
test replication
206.
test scenario description language
207.
test-bed
208.
test-chips
209.
test-house
210.
test-pattern
211.
test-suite reduction
212.
Three-point bending test
213.
unit root test
214.
usability platform test
215.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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