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test generation (keyword)
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1
book article
Aspect-oriented testing of a rehabilitation system
Sarna, Külli
;
Vain, Jüri
VALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France
2014
/
p. 73-78 : ill
book article
2
book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
3
book article
Exploiting aspects in model-based testing
Sarna, Külli
;
Vain, Jüri
FOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German
2012
/
p. 45-47 : ill
https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing
book article
4
book article
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
book article
5
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
6
book article
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
book article
7
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
8
book article
Multiple control fault testing in digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/AQTR.2016.7501287
book article
9
book article
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
book article
10
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
11
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
12
book article
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
book article
13
book article
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
book article
14
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
Number of records 14, displaying
1 - 14
keyword
217
1.
behaviour level test generation
2.
functional test generation
3.
Hierarchical Multi-level Test Generation
4.
highlevel test generation
5.
implementation-independent test generation
6.
offline test generation
7.
provably correct test generation
8.
test generation
9.
test generation and fault diagnosis
10.
adaptive test strategy generation
11.
automated test pattern generation
12.
automatic test case generation
13.
automatic test pattern generation
14.
automatic test program generation
15.
high-level test data generation
16.
Test Group Generation for Detecting Multiple Faults
17.
test program generation
18.
Activity-based demand generation
19.
automated code generation
20.
automatic code generation
21.
Automatic generation control
22.
automatic GUI model generation
23.
building and urban form generation
24.
business model generation
25.
code generation
26.
data set generation
27.
decentralized key generation
28.
disaster alert generation
29.
distributed electricity generation
30.
distributed generation
31.
Distributed Generation (DG)
32.
distributed generation systems
33.
distributed power generation
34.
distrubuted power generation
35.
droplet generation
36.
droplet generation rate control
37.
electric power generation
38.
electricity generation
39.
energy generation
40.
extreme penetration level of non synchronous generation
41.
feasible path generation
42.
fifth generation computer
43.
fourth generation district heating
44.
frequent item generation
45.
generation
46.
generation and transmission expansion planning
47.
Generation Costs
48.
generation of electric energy
49.
generation scheduling
50.
generation succession
51.
heat generation
52.
hydroelectric power generation
53.
hydrogen generation
54.
I–III generation
55.
job generation
56.
knowledge generation
57.
multisine generation
58.
next generation 4D printing
59.
next generation sequencing
60.
Next-generation probiotics
61.
next-generation sequencing
62.
oil-shale power generation
63.
pattern Generation
64.
photovoltaic (PV) generation
65.
photovoltaic generation dispatch
66.
power generation
67.
power generation dispatch
68.
power generation economics
69.
power generation planning
70.
PV generation
71.
PV power generation
72.
Renewable energy generation
73.
renewable generation
74.
residual generation
75.
Second generation bioethanol
76.
second generation of tribology models
77.
second generation sequencing
78.
signal generation
79.
silver generation
80.
solar power generation
81.
space generation advisory council
82.
template based sql generation
83.
trajectory generation
84.
waste generation
85.
wave generation
86.
white light generation
87.
wind energy generation
88.
wind generation
89.
wind power generation
90.
16S rRNA gene amplicon next-generation sequencing
91.
4GDH (4th generation district heating)
92.
4th generation district heating
93.
5th generation district heating
94.
accelerated shelf-life test
95.
antigen test
96.
Applications in Test Engineering
97.
ASTM G65 dry sand rubber wheel abrasion test
98.
Automated Synthesis of Software-based Self-test
99.
automated test environment
100.
Auvergne test-bed
101.
battery test
102.
behavioral test
103.
bending test
104.
bit-error rate test
105.
Board and System Test
106.
board test
107.
bounds test
108.
built-in self-test
109.
capillary condensation redistribution test
110.
chi-square test
111.
closed bottle test
112.
cognitive screening test
113.
compartment fire test
114.
compartment test
115.
cone penetration test (CPT)
116.
COVID-19 antigen test
117.
cutting test
118.
cybersecurity test bed
119.
DDR4 interconnect test
120.
design and test
121.
design-for-test
122.
deterministic test sequences
123.
diagnostic test
124.
digital test
125.
Digital test and testable design
126.
double-pulse test
127.
drawing test
128.
dry droplet antimicrobial test
129.
embedded test
130.
fan pressurisation test
131.
final test result prediction
132.
four-point bending test
133.
FPGA based test
134.
FPGA-Assisted Test
135.
FPGA-centric test
136.
functional self-test
137.
Granger causality test
138.
hardness test
139.
high-level synthesis for test
140.
high-speed serial link test
141.
IEEE 9 bus test system
142.
in situ tensile test in SEM
143.
industrial field test
144.
in-situ tensile test in SEM
145.
Johansen cointegration test
146.
Kolmogorov-Smirnov test
147.
load test
148.
logic built-in self-test
149.
Luria alternating series test
150.
Mann–Kendall test
151.
memory interconnect test
152.
microprocessor test
153.
Model test
154.
multiplier test
155.
orthogonal test
156.
package test analysis
157.
parallel design and test
158.
performance test
159.
piezocone penetration test (CPTu)
160.
Point Load Test index
161.
pressurisation test
162.
processor-centric board test
163.
progressive damage test
164.
pseudo-exhaustive test
165.
purity test
166.
rolling thin film oven test
167.
rtioco-based timed test sequences
168.
seasonal Mann Kendall test
169.
seismic piezocone penetration test
170.
self-test
171.
self-test architectures
172.
sentence writing test
173.
serial sevens test
174.
ship towing test tank
175.
similar material simulation test
176.
small-scale fire test
177.
small‐scale test
178.
software based self-test
179.
software-based self-test
180.
software-based self-test (SBST)
181.
soil phosphorus (P) test
182.
standard test method
183.
static load test
184.
static-dynamic probing test (SDT)
185.
stress test
186.
system level test
187.
teaching design and test of systems
188.
tensile test
189.
tensile test
190.
test
191.
test and evaluation platform
192.
test automation
193.
test bench
194.
test coverage
195.
test driven development
196.
test driven modelling
197.
test embankment
198.
test equipment
199.
test groups
200.
test model design
201.
test optimization
202.
test packets
203.
test path synthesis
204.
test patterns
205.
test point insertion
206.
test reference year
207.
test replication
208.
test scenario description language
209.
test-bed
210.
test-chips
211.
test-house
212.
test-pattern
213.
test-suite reduction
214.
Three-point bending test
215.
unit root test
216.
usability platform test
217.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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