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1

book article

Aspect-oriented testing of a rehabilitation systemSarna, Külli; Vain, JüriVALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France2014 / p. 73-78 : ill

book article
2

book article

At-speed functional built-in self-test methodology for processors [Electronic resource]Ubar, Raimund-Johannes; Indus, Viljar; Kalmend, OliverProceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka2012 / p. 168-172 : ill [CD-ROM]

book article
3

book article

Exploiting aspects in model-based testingSarna, Külli; Vain, JüriFOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German2012 / p. 45-47 : ill https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing

book article
4

book article

High-level test data generation for software based self-test in microprocessorsOyeniran, Adeboye Stephen; Jasnetski, Artjom; Tšertov, Anton; Ubar, Raimund-Johannes2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 20172017 / p. 86-91 : ill https://doi.org/10.1109/MECO.2017.7977167

book article
5

book article

High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

book article
6

book article

Implementation-independent functional test for transition delay faults in microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia2020 / p. 646-650 https://doi.org/10.1109/DSD51259.2020.00105

book article
7

book article

Implementation-independent functional test generation for RISC microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 82-87 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920323

book article
8

book article

Multiple control fault testing in digital systems with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings2016 / [6] p. : ill http://dx.doi.org/10.1109/AQTR.2016.7501287

book article
9

book article

A novel random approach to diagnostic test generationOsimiry, Emmanuel Ovie; Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark2016 / [4] p. : ill https://doi.org/10.1109/NORCHIP.2016.7792915

book article
10

book article EST / book article ENG

On test generation for microprocessors for extended class of functional faultsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers2020 / p. 21-44 https://doi.org/10.1007/978-3-030-53273-4 Conference proceedings at Scopus Article at Scopus

book article EST / book article ENG
11

book article

Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE2013 / p. 36-41 : ill [CD-ROM]

book article
12

book article

Teaching advanced test issues in digital electronicsUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichProceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic2005 / p. S2B-1 - S2B-6 : ill http://dx.doi.org/10.1109/ITHET.2005.1560318

book article
13

book article

Teaching digital system testOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Kruus, MargusThe 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble2017 / [6] p

book article
14

book article

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

book article

Number of records 14, displaying 1 - 14

1. behaviour level test generation
2. functional test generation
3. highlevel test generation
4. implementation-independent test generation
5. offline test generation
6. provably correct test generation
7. test generation
8. test generation and fault diagnosis
9. adaptive test strategy generation
10. automated test pattern generation
11. automatic test case generation
12. automatic test pattern generation
13. automatic test program generation
14. high-level test data generation
15. test program generation
16. Activity-based demand generation
17. automatic code generation
18. Automatic generation control
19. automatic GUI model generation
20. building and urban form generation
21. business model generation
22. code generation
23. data set generation
24. disaster alert generation
25. distributed electricity generation
26. distributed generation
27. Distributed Generation (DG)
28. distributed generation systems
29. distributed power generation
30. distrubuted power generation
31. droplet generation
32. droplet generation rate control
33. electric power generation
34. electricity generation
35. energy generation
36. extreme penetration level of non synchronous generation
37. feasible path generation
38. fifth generation computer
39. fourth generation district heating
40. frequent item generation
41. generation
42. generation and transmission expansion planning
43. Generation Costs
44. generation of electric energy
45. generation succession
46. heat generation
47. hydroelectric power generation
48. hydrogen generation
49. I–III generation
50. job generation
51. multisine generation
52. next generation 4D printing
53. next generation sequencing
54. Next-generation probiotics
55. next-generation sequencing
56. oil-shale power generation
57. pattern Generation
58. photovoltaic (PV) generation
59. photovoltaic generation dispatch
60. power generation
61. power generation dispatch
62. power generation economics
63. power generation planning
64. PV generation
65. PV power generation
66. Renewable energy generation
67. renewable generation
68. residual generation
69. Second generation bioethanol
70. second generation of tribology models
71. second generation sequencing
72. signal generation
73. silver generation
74. solar power generation
75. space generation advisory council
76. template based sql generation
77. trajectory generation
78. waste generation
79. wave generation
80. white light generation
81. wind energy generation
82. wind generation
83. wind power generation
84. 16S rRNA gene amplicon next-generation sequencing
85. 4GDH (4th generation district heating)
86. 4th generation district heating
87. 5th generation district heating
88. accelerated shelf-life test
89. antigen test
90. ASTM G65 dry sand rubber wheel abrasion test
91. automated test environment
92. Auvergne test-bed
93. battery test
94. behavioral test
95. bending test
96. bit-error rate test
97. Board and System Test
98. board test
99. bounds test
100. built-in self-test
101. capillary condensation redistribution test
102. chi-square test
103. closed bottle test
104. cognitive screening test
105. compartment fire test
106. compartment test
107. cone penetration test (CPT)
108. COVID-19 antigen test
109. cutting test
110. cybersecurity test bed
111. DDR4 interconnect test
112. design and test
113. design-for-test
114. deterministic test sequences
115. diagnostic test
116. digital test
117. Digital test and testable design
118. double-pulse test
119. drawing test
120. dry droplet antimicrobial test
121. embedded test
122. fan pressurisation test
123. final test result prediction
124. four-point bending test
125. FPGA based test
126. FPGA-Assisted Test
127. FPGA-centric test
128. functional self-test
129. Granger causality test
130. hardness test
131. high-level synthesis for test
132. high-speed serial link test
133. IEEE 9 bus test system
134. in situ tensile test in SEM
135. industrial field test
136. in-situ tensile test in SEM
137. Johansen cointegration test
138. Kolmogorov-Smirnov test
139. load test
140. logic built-in self-test
141. Luria alternating series test
142. Mann–Kendall test
143. memory interconnect test
144. microprocessor test
145. Model test
146. multiplier test
147. orthogonal test
148. package test analysis
149. parallel design and test
150. performance test
151. piezocone penetration test (CPTu)
152. Point Load Test index
153. pressurisation test
154. processor-centric board test
155. progressive damage test
156. pseudo-exhaustive test
157. purity test
158. rtioco-based timed test sequences
159. seasonal Mann Kendall test
160. seismic piezocone penetration test
161. self-test
162. self-test architectures
163. sentence writing test
164. serial sevens test
165. ship towing test tank
166. similar material simulation test
167. small-scale fire test
168. small‐scale test
169. software based self-test
170. software-based self-test
171. software-based self-test (SBST)
172. soil phosphorus (P) test
173. standard test method
174. static load test
175. static-dynamic probing test (SDT)
176. stress test
177. system level test
178. teaching design and test of systems
179. tensile test
180. test
181. test and evaluation platform
182. test bench
183. test coverage
184. test driven development
185. test driven modelling
186. test embankment
187. test equipment
188. test groups
189. test model design
190. test optimization
191. test packets
192. test path synthesis
193. test patterns
194. test point insertion
195. test reference year
196. test replication
197. test scenario description language
198. test-bed
199. test-chips
200. test-house
201. test-pattern
202. test-suite reduction
203. Three-point bending test
204. unit root test
205. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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