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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

book article
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journal article

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est

journal article
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book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. high-level test data generation
10. highlevel test generation
11. implementation-independent test generation
12. offline test generation
13. provably correct test generation
14. test generation
15. test generation and fault diagnosis
16. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
17. Apollo program
18. automatic program synthesis
19. Baltic-wide HELCOM COMBINE monitoring program
20. college program
21. master program
22. monitoring program
23. NATO. Science for Peace and Security Program
24. probabilistic relational program logic
25. program
26. program analysis
27. program equivalence
28. program management
29. program packages
30. program transformation
31. program verification
32. SNAP program
33. stufy program
34. Activity-based demand generation
35. automatic code generation
36. Automatic generation control
37. automatic GUI model generation
38. building and urban form generation
39. business model generation
40. code generation
41. data set generation
42. decentralized key generation
43. disaster alert generation
44. distributed electricity generation
45. distributed generation
46. Distributed Generation (DG)
47. distributed generation systems
48. distributed power generation
49. distrubuted power generation
50. droplet generation
51. droplet generation rate control
52. electric power generation
53. electricity generation
54. energy generation
55. extreme penetration level of non synchronous generation
56. feasible path generation
57. fifth generation computer
58. fourth generation district heating
59. frequent item generation
60. generation
61. generation and transmission expansion planning
62. Generation Costs
63. generation of electric energy
64. generation succession
65. heat generation
66. hydroelectric power generation
67. hydrogen generation
68. I–III generation
69. job generation
70. multisine generation
71. next generation 4D printing
72. next generation sequencing
73. Next-generation probiotics
74. next-generation sequencing
75. oil-shale power generation
76. pattern Generation
77. photovoltaic (PV) generation
78. photovoltaic generation dispatch
79. power generation
80. power generation dispatch
81. power generation economics
82. power generation planning
83. PV generation
84. PV power generation
85. Renewable energy generation
86. renewable generation
87. residual generation
88. Second generation bioethanol
89. second generation of tribology models
90. second generation sequencing
91. signal generation
92. silver generation
93. solar power generation
94. space generation advisory council
95. template based sql generation
96. trajectory generation
97. waste generation
98. wave generation
99. white light generation
100. wind energy generation
101. wind generation
102. wind power generation
103. 16S rRNA gene amplicon next-generation sequencing
104. 4GDH (4th generation district heating)
105. 4th generation district heating
106. 5th generation district heating
107. accelerated shelf-life test
108. antigen test
109. ASTM G65 dry sand rubber wheel abrasion test
110. automated test environment
111. Auvergne test-bed
112. battery test
113. behavioral test
114. bending test
115. bit-error rate test
116. Board and System Test
117. board test
118. bounds test
119. built-in self-test
120. capillary condensation redistribution test
121. chi-square test
122. closed bottle test
123. cognitive screening test
124. compartment fire test
125. compartment test
126. cone penetration test (CPT)
127. COVID-19 antigen test
128. cutting test
129. cybersecurity test bed
130. DDR4 interconnect test
131. design and test
132. design-for-test
133. deterministic test sequences
134. diagnostic test
135. digital test
136. Digital test and testable design
137. double-pulse test
138. drawing test
139. dry droplet antimicrobial test
140. embedded test
141. fan pressurisation test
142. final test result prediction
143. four-point bending test
144. FPGA based test
145. FPGA-Assisted Test
146. FPGA-centric test
147. functional self-test
148. Granger causality test
149. hardness test
150. high-level synthesis for test
151. high-speed serial link test
152. IEEE 9 bus test system
153. in situ tensile test in SEM
154. industrial field test
155. in-situ tensile test in SEM
156. Johansen cointegration test
157. Kolmogorov-Smirnov test
158. load test
159. logic built-in self-test
160. Luria alternating series test
161. Mann–Kendall test
162. memory interconnect test
163. microprocessor test
164. Model test
165. multiplier test
166. orthogonal test
167. package test analysis
168. parallel design and test
169. performance test
170. piezocone penetration test (CPTu)
171. Point Load Test index
172. pressurisation test
173. processor-centric board test
174. progressive damage test
175. pseudo-exhaustive test
176. purity test
177. rolling thin film oven test
178. rtioco-based timed test sequences
179. seasonal Mann Kendall test
180. seismic piezocone penetration test
181. self-test
182. self-test architectures
183. sentence writing test
184. serial sevens test
185. ship towing test tank
186. similar material simulation test
187. small-scale fire test
188. small‐scale test
189. software based self-test
190. software-based self-test
191. software-based self-test (SBST)
192. soil phosphorus (P) test
193. standard test method
194. static load test
195. static-dynamic probing test (SDT)
196. stress test
197. system level test
198. teaching design and test of systems
199. tensile test
200. test
201. test and evaluation platform
202. test automation
203. test bench
204. test coverage
205. test driven development
206. test driven modelling
207. test embankment
208. test equipment
209. test groups
210. test model design
211. test optimization
212. test packets
213. test path synthesis
214. test patterns
215. test point insertion
216. test reference year
217. test replication
218. test scenario description language
219. test-bed
220. test-chips
221. test-house
222. test-pattern
223. test-suite reduction
224. Three-point bending test
225. unit root test
226. usability platform test
227. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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