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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

book article
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journal article

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est

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book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. Hierarchical Multi-level Test Generation
10. high-level test data generation
11. highlevel test generation
12. implementation-independent test generation
13. offline test generation
14. provably correct test generation
15. test generation
16. test generation and fault diagnosis
17. Test Group Generation for Detecting Multiple Faults
18. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
19. Apollo program
20. automatic program synthesis
21. Baltic-wide HELCOM COMBINE monitoring program
22. college program
23. master program
24. monitoring program
25. NATO. Science for Peace and Security Program
26. probabilistic relational program logic
27. program
28. program analysis
29. program debugging
30. program equivalence
31. program management
32. program packages
33. program transformation
34. program verification
35. SNAP program
36. stufy program
37. Activity-based demand generation
38. automatic code generation
39. Automatic generation control
40. automatic GUI model generation
41. building and urban form generation
42. business model generation
43. code generation
44. data set generation
45. decentralized key generation
46. disaster alert generation
47. distributed electricity generation
48. distributed generation
49. Distributed Generation (DG)
50. distributed generation systems
51. distributed power generation
52. distrubuted power generation
53. droplet generation
54. droplet generation rate control
55. electric power generation
56. electricity generation
57. energy generation
58. extreme penetration level of non synchronous generation
59. feasible path generation
60. fifth generation computer
61. fourth generation district heating
62. frequent item generation
63. generation
64. generation and transmission expansion planning
65. Generation Costs
66. generation of electric energy
67. generation succession
68. heat generation
69. hydroelectric power generation
70. hydrogen generation
71. I–III generation
72. job generation
73. multisine generation
74. next generation 4D printing
75. next generation sequencing
76. Next-generation probiotics
77. next-generation sequencing
78. oil-shale power generation
79. pattern Generation
80. photovoltaic (PV) generation
81. photovoltaic generation dispatch
82. power generation
83. power generation dispatch
84. power generation economics
85. power generation planning
86. PV generation
87. PV power generation
88. Renewable energy generation
89. renewable generation
90. residual generation
91. Second generation bioethanol
92. second generation of tribology models
93. second generation sequencing
94. signal generation
95. silver generation
96. solar power generation
97. space generation advisory council
98. template based sql generation
99. trajectory generation
100. waste generation
101. wave generation
102. white light generation
103. wind energy generation
104. wind generation
105. wind power generation
106. 16S rRNA gene amplicon next-generation sequencing
107. 4GDH (4th generation district heating)
108. 4th generation district heating
109. 5th generation district heating
110. accelerated shelf-life test
111. antigen test
112. Applications in Test Engineering
113. ASTM G65 dry sand rubber wheel abrasion test
114. Automated Synthesis of Software-based Self-test
115. automated test environment
116. Auvergne test-bed
117. battery test
118. behavioral test
119. bending test
120. bit-error rate test
121. Board and System Test
122. board test
123. bounds test
124. built-in self-test
125. capillary condensation redistribution test
126. chi-square test
127. closed bottle test
128. cognitive screening test
129. compartment fire test
130. compartment test
131. cone penetration test (CPT)
132. COVID-19 antigen test
133. cutting test
134. cybersecurity test bed
135. DDR4 interconnect test
136. design and test
137. design-for-test
138. deterministic test sequences
139. diagnostic test
140. digital test
141. Digital test and testable design
142. double-pulse test
143. drawing test
144. dry droplet antimicrobial test
145. embedded test
146. fan pressurisation test
147. final test result prediction
148. four-point bending test
149. FPGA based test
150. FPGA-Assisted Test
151. FPGA-centric test
152. functional self-test
153. Granger causality test
154. hardness test
155. high-level synthesis for test
156. high-speed serial link test
157. IEEE 9 bus test system
158. in situ tensile test in SEM
159. industrial field test
160. in-situ tensile test in SEM
161. Johansen cointegration test
162. Kolmogorov-Smirnov test
163. load test
164. logic built-in self-test
165. Luria alternating series test
166. Mann–Kendall test
167. memory interconnect test
168. microprocessor test
169. Model test
170. multiplier test
171. orthogonal test
172. package test analysis
173. parallel design and test
174. performance test
175. piezocone penetration test (CPTu)
176. Point Load Test index
177. pressurisation test
178. processor-centric board test
179. progressive damage test
180. pseudo-exhaustive test
181. purity test
182. rolling thin film oven test
183. rtioco-based timed test sequences
184. seasonal Mann Kendall test
185. seismic piezocone penetration test
186. self-test
187. self-test architectures
188. sentence writing test
189. serial sevens test
190. ship towing test tank
191. similar material simulation test
192. small-scale fire test
193. small‐scale test
194. software based self-test
195. software-based self-test
196. software-based self-test (SBST)
197. soil phosphorus (P) test
198. standard test method
199. static load test
200. static-dynamic probing test (SDT)
201. stress test
202. system level test
203. teaching design and test of systems
204. tensile test
205. test
206. test and evaluation platform
207. test automation
208. test bench
209. test coverage
210. test driven development
211. test driven modelling
212. test embankment
213. test equipment
214. test groups
215. test model design
216. test optimization
217. test packets
218. test path synthesis
219. test patterns
220. test point insertion
221. test reference year
222. test replication
223. test scenario description language
224. test-bed
225. test-chips
226. test-house
227. test-pattern
228. test-suite reduction
229. Three-point bending test
230. unit root test
231. usability platform test
232. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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