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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

book article
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journal article EST / journal article ENG

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est https://doi.org/10.3176/proc.2014.1.08 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
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book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. Hierarchical Multi-level Test Generation
10. high-level test data generation
11. highlevel test generation
12. implementation-independent test generation
13. offline test generation
14. provably correct test generation
15. test generation
16. test generation and fault diagnosis
17. Test Group Generation for Detecting Multiple Faults
18. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
19. Apollo program
20. automatic program synthesis
21. Baltic-wide HELCOM COMBINE monitoring program
22. BIP (Blended Intensive Program)
23. college program
24. European Program for Prevention
25. master program
26. monitoring program
27. NATO. Science for Peace and Security Program
28. probabilistic relational program logic
29. program
30. program analysis
31. program debugging
32. program equivalence
33. program logics
34. program management
35. program packages
36. program transformation
37. program verification
38. SNAP program
39. stufy program
40. Activity-based demand generation
41. automated code generation
42. automatic code generation
43. Automatic generation control
44. automatic GUI model generation
45. building and urban form generation
46. business model generation
47. code generation
48. data set generation
49. decentralized key generation
50. disaster alert generation
51. distributed electricity generation
52. distributed generation
53. Distributed Generation (DG)
54. distributed generation systems
55. distributed power generation
56. distrubuted power generation
57. droplet generation
58. droplet generation rate control
59. electric power generation
60. electricity generation
61. energy generation
62. extreme penetration level of non synchronous generation
63. feasible path generation
64. fifth generation computer
65. food waste generation
66. fourth generation district heating
67. frequent item generation
68. generation
69. generation and transmission expansion planning
70. Generation Costs
71. generation of electric energy
72. generation scheduling
73. generation succession
74. heat generation
75. hydroelectric power generation
76. hydrogen generation
77. I–III generation
78. job generation
79. knowledge generation
80. multisine generation
81. next generation 4D printing
82. next generation sequencing
83. Next-generation probiotics
84. next-generation sequencing
85. oil-shale power generation
86. pattern Generation
87. photovoltaic (PV) generation
88. photovoltaic generation dispatch
89. power generation
90. power generation dispatch
91. power generation economics
92. power generation planning
93. PV generation
94. PV power generation
95. Renewable energy generation
96. renewable generation
97. residual generation
98. rule generation
99. Second generation bioethanol
100. second generation of tribology models
101. second generation sequencing
102. signal generation
103. silver generation
104. sixth-generation (6G)
105. solar power generation
106. space generation advisory council
107. template based sql generation
108. trajectory generation
109. waste generation
110. wave generation
111. WEEE generation
112. white light generation
113. wind energy generation
114. wind generation
115. wind power generation
116. 16S rRNA gene amplicon next-generation sequencing
117. 4GDH (4th generation district heating)
118. 4th generation district heating
119. 5th generation district heating
120. accelerated shelf-life test
121. antigen test
122. Applications in Test Engineering
123. ASTM G65 dry sand rubber wheel abrasion test
124. Automated Synthesis of Software-based Self-test
125. automated test environment
126. Auvergne test-bed
127. battery test
128. behavioral test
129. bending test
130. bit-error rate test
131. Board and System Test
132. board test
133. bounds test
134. built-in self-test
135. capillary condensation redistribution test
136. chi-square test
137. closed bottle test
138. cognitive screening test
139. compartment fire test
140. compartment test
141. cone penetration test (CPT)
142. COVID-19 antigen test
143. cutting test
144. cybersecurity test bed
145. DDR4 interconnect test
146. design and test
147. design-for-test
148. deterministic test sequences
149. diagnostic test
150. digital test
151. Digital test and testable design
152. double-pulse test
153. drawing test
154. dry droplet antimicrobial test
155. embedded test
156. fan pressurisation test
157. final test result prediction
158. four-point bending test
159. FPGA based test
160. FPGA-Assisted Test
161. FPGA-centric test
162. functional self-test
163. Granger causality test
164. hardness test
165. high-level synthesis for test
166. high-speed serial link test
167. IEEE 9 bus test system
168. in situ tensile test in SEM
169. industrial field test
170. in-situ tensile test in SEM
171. Johansen cointegration test
172. Kolmogorov-Smirnov test
173. load test
174. logic built-in self-test
175. Luria alternating series test
176. Mann–Kendall test
177. Mann-Kendall trend test
178. memory interconnect test
179. microprocessor test
180. Model test
181. multiplier test
182. orthogonal test
183. package test analysis
184. parallel design and test
185. performance test
186. piezocone penetration test (CPTu)
187. Point Load Test index
188. pressurisation test
189. processor-centric board test
190. progressive damage test
191. pseudo-exhaustive test
192. purity test
193. real-time room temperature test
194. rolling thin film oven test
195. rtioco-based timed test sequences
196. seasonal Mann Kendall test
197. seismic piezocone penetration test
198. self-test
199. self-test architectures
200. sentence writing test
201. serial sevens test
202. ship towing test tank
203. similar material simulation test
204. small-scale fire test
205. small‐scale test
206. software based self-test
207. software-based self-test
208. software-based self-test (SBST)
209. soil phosphorus (P) test
210. standard test method
211. static load test
212. static-dynamic probing test (SDT)
213. stress test
214. system level test
215. teaching design and test of systems
216. tensile test
217. tensile test
218. test
219. test and evaluation platform
220. test automation
221. test bench
222. test coverage
223. test driven development
224. test driven modelling
225. test embankment
226. test equipment
227. test groups
228. test model design
229. test optimization
230. test packets
231. test path synthesis
232. test patterns
233. test point insertion
234. test reference year
235. test replication
236. test scenario description language
237. test-bed
238. test-chips
239. test-house
240. test-pattern
241. test-suite reduction
242. Three-point bending test
243. unit root test
244. usability platform test
245. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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