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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

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journal article EST / journal article ENG

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est https://doi.org/10.3176/proc.2014.1.08 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
4

book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. Hierarchical Multi-level Test Generation
10. high-level test data generation
11. highlevel test generation
12. implementation-independent test generation
13. offline test generation
14. provably correct test generation
15. test generation
16. test generation and fault diagnosis
17. Test Group Generation for Detecting Multiple Faults
18. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
19. Apollo program
20. automatic program synthesis
21. Baltic-wide HELCOM COMBINE monitoring program
22. BIP (Blended Intensive Program)
23. college program
24. European Program for Prevention
25. master program
26. monitoring program
27. NATO. Science for Peace and Security Program
28. probabilistic relational program logic
29. program
30. program analysis
31. program debugging
32. program equivalence
33. program logics
34. program management
35. program packages
36. program transformation
37. program verification
38. SNAP program
39. stufy program
40. Activity-based demand generation
41. automated code generation
42. automatic code generation
43. Automatic generation control
44. automatic GUI model generation
45. building and urban form generation
46. business model generation
47. code generation
48. data set generation
49. decentralized key generation
50. disaster alert generation
51. distributed electricity generation
52. distributed generation
53. Distributed Generation (DG)
54. distributed generation systems
55. distributed power generation
56. distrubuted power generation
57. droplet generation
58. droplet generation rate control
59. electric power generation
60. electricity generation
61. energy generation
62. extreme penetration level of non synchronous generation
63. feasible path generation
64. fifth generation computer
65. food waste generation
66. fourth generation district heating
67. frequent item generation
68. generation
69. generation and transmission expansion planning
70. Generation Costs
71. generation of electric energy
72. generation scheduling
73. generation succession
74. heat generation
75. hydroelectric power generation
76. hydrogen generation
77. I–III generation
78. job generation
79. knowledge generation
80. multisine generation
81. next generation 4D printing
82. next generation sequencing
83. Next-generation probiotics
84. next-generation sequencing
85. oil-shale power generation
86. pattern Generation
87. photovoltaic (PV) generation
88. photovoltaic generation dispatch
89. power generation
90. power generation dispatch
91. power generation economics
92. power generation planning
93. PV generation
94. PV power generation
95. real-time alert generation
96. Renewable energy generation
97. renewable generation
98. residual generation
99. retrieval-augmented generation (RAG)
100. rule generation
101. Scenario Generation
102. Second generation bioethanol
103. second generation of tribology models
104. second generation sequencing
105. signal generation
106. silver generation
107. sixth-generation (6G)
108. solar power generation
109. space generation advisory council
110. template based sql generation
111. trajectory generation
112. waste generation
113. wave generation
114. WEEE generation
115. white light generation
116. wind energy generation
117. wind generation
118. wind power generation
119. 16S rRNA gene amplicon next-generation sequencing
120. 4GDH (4th generation district heating)
121. 4th generation district heating
122. 5th generation district heating (5GDH)
123. accelerated shelf-life test
124. antigen test
125. Applications in Test Engineering
126. ASTM G65 dry sand rubber wheel abrasion test
127. Automated Synthesis of Software-based Self-test
128. automated test environment
129. Auvergne test-bed
130. battery test
131. behavioral test
132. bending test
133. bit-error rate test
134. Board and System Test
135. board test
136. bounds test
137. built-in self-test
138. capillary condensation redistribution test
139. chi-square test
140. closed bottle test
141. cognitive screening test
142. compartment fire test
143. compartment test
144. cone penetration test (CPT)
145. COVID-19 antigen test
146. cutting test
147. cybersecurity test bed
148. DDR4 interconnect test
149. design and test
150. design-for-test
151. deterministic test sequences
152. diagnostic test
153. digital test
154. Digital test and testable design
155. double-pulse test
156. drawing test
157. dry droplet antimicrobial test
158. Embedded figures test
159. embedded test
160. fan pressurisation test
161. final test result prediction
162. four-point bending test
163. FPGA based test
164. FPGA-Assisted Test
165. FPGA-centric test
166. functional self-test
167. Granger causality test
168. hardness test
169. high-level synthesis for test
170. high-speed serial link test
171. IEEE 9 bus test system
172. in situ tensile test in SEM
173. industrial field test
174. in-situ tensile test in SEM
175. Johansen cointegration test
176. Kolmogorov-Smirnov test
177. load test
178. logic built-in self-test
179. Luria alternating series test
180. Mann–Kendall test
181. Mann-Kendall trend test
182. memory interconnect test
183. microprocessor test
184. Model test
185. multiplier test
186. orthogonal test
187. package test analysis
188. parallel design and test
189. performance test
190. piezocone penetration test (CPTu)
191. Point Load Test index
192. pressurisation test
193. processor-centric board test
194. progressive damage test
195. Provably Correct Test Development
196. pseudo-exhaustive test
197. purity test
198. real-time room temperature test
199. rolling thin film oven test
200. rtioco-based timed test sequences
201. seasonal Mann Kendall test
202. seismic piezocone penetration test
203. self-test
204. self-test architectures
205. sentence writing test
206. serial sevens test
207. ship towing test tank
208. similar material simulation test
209. small-scale fire test
210. small‐scale test
211. software based self-test
212. software-based self-test
213. software-based self-test (SBST)
214. soil phosphorus (P) test
215. standard test method
216. static load test
217. static-dynamic probing test (SDT)
218. stress test
219. system level test
220. teaching design and test of systems
221. tensile test
222. tensile test
223. test
224. Test Adapters
225. test and evaluation platform
226. test automation
227. test bench
228. test coverage
229. test driven development
230. test driven modelling
231. test embankment
232. test equipment
233. test groups
234. test model design
235. test optimization
236. test packets
237. test path synthesis
238. test patterns
239. test point insertion
240. test reference year
241. test replication
242. test scenario description language
243. test-bed
244. test-chips
245. test-house
246. test-pattern
247. test-suite reduction
248. Three-point bending test
249. unit root test
250. usability platform test
251. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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