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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

book article
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journal article EST / journal article ENG

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est https://doi.org/10.3176/proc.2014.1.08 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
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book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. Hierarchical Multi-level Test Generation
10. high-level test data generation
11. highlevel test generation
12. implementation-independent test generation
13. offline test generation
14. provably correct test generation
15. test generation
16. test generation and fault diagnosis
17. Test Group Generation for Detecting Multiple Faults
18. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
19. Apollo program
20. automatic program synthesis
21. Baltic-wide HELCOM COMBINE monitoring program
22. college program
23. master program
24. monitoring program
25. NATO. Science for Peace and Security Program
26. probabilistic relational program logic
27. program
28. program analysis
29. program debugging
30. program equivalence
31. program management
32. program packages
33. program transformation
34. program verification
35. SNAP program
36. stufy program
37. Activity-based demand generation
38. automated code generation
39. automatic code generation
40. Automatic generation control
41. automatic GUI model generation
42. building and urban form generation
43. business model generation
44. code generation
45. data set generation
46. decentralized key generation
47. disaster alert generation
48. distributed electricity generation
49. distributed generation
50. Distributed Generation (DG)
51. distributed generation systems
52. distributed power generation
53. distrubuted power generation
54. droplet generation
55. droplet generation rate control
56. electric power generation
57. electricity generation
58. energy generation
59. extreme penetration level of non synchronous generation
60. feasible path generation
61. fifth generation computer
62. fourth generation district heating
63. frequent item generation
64. generation
65. generation and transmission expansion planning
66. Generation Costs
67. generation of electric energy
68. generation scheduling
69. generation succession
70. heat generation
71. hydroelectric power generation
72. hydrogen generation
73. I–III generation
74. job generation
75. knowledge generation
76. multisine generation
77. next generation 4D printing
78. next generation sequencing
79. Next-generation probiotics
80. next-generation sequencing
81. oil-shale power generation
82. pattern Generation
83. photovoltaic (PV) generation
84. photovoltaic generation dispatch
85. power generation
86. power generation dispatch
87. power generation economics
88. power generation planning
89. PV generation
90. PV power generation
91. Renewable energy generation
92. renewable generation
93. residual generation
94. Second generation bioethanol
95. second generation of tribology models
96. second generation sequencing
97. signal generation
98. silver generation
99. solar power generation
100. space generation advisory council
101. template based sql generation
102. trajectory generation
103. waste generation
104. wave generation
105. white light generation
106. wind energy generation
107. wind generation
108. wind power generation
109. 16S rRNA gene amplicon next-generation sequencing
110. 4GDH (4th generation district heating)
111. 4th generation district heating
112. 5th generation district heating
113. accelerated shelf-life test
114. antigen test
115. Applications in Test Engineering
116. ASTM G65 dry sand rubber wheel abrasion test
117. Automated Synthesis of Software-based Self-test
118. automated test environment
119. Auvergne test-bed
120. battery test
121. behavioral test
122. bending test
123. bit-error rate test
124. Board and System Test
125. board test
126. bounds test
127. built-in self-test
128. capillary condensation redistribution test
129. chi-square test
130. closed bottle test
131. cognitive screening test
132. compartment fire test
133. compartment test
134. cone penetration test (CPT)
135. COVID-19 antigen test
136. cutting test
137. cybersecurity test bed
138. DDR4 interconnect test
139. design and test
140. design-for-test
141. deterministic test sequences
142. diagnostic test
143. digital test
144. Digital test and testable design
145. double-pulse test
146. drawing test
147. dry droplet antimicrobial test
148. embedded test
149. fan pressurisation test
150. final test result prediction
151. four-point bending test
152. FPGA based test
153. FPGA-Assisted Test
154. FPGA-centric test
155. functional self-test
156. Granger causality test
157. hardness test
158. high-level synthesis for test
159. high-speed serial link test
160. IEEE 9 bus test system
161. in situ tensile test in SEM
162. industrial field test
163. in-situ tensile test in SEM
164. Johansen cointegration test
165. Kolmogorov-Smirnov test
166. load test
167. logic built-in self-test
168. Luria alternating series test
169. Mann–Kendall test
170. memory interconnect test
171. microprocessor test
172. Model test
173. multiplier test
174. orthogonal test
175. package test analysis
176. parallel design and test
177. performance test
178. piezocone penetration test (CPTu)
179. Point Load Test index
180. pressurisation test
181. processor-centric board test
182. progressive damage test
183. pseudo-exhaustive test
184. purity test
185. rolling thin film oven test
186. rtioco-based timed test sequences
187. seasonal Mann Kendall test
188. seismic piezocone penetration test
189. self-test
190. self-test architectures
191. sentence writing test
192. serial sevens test
193. ship towing test tank
194. similar material simulation test
195. small-scale fire test
196. small‐scale test
197. software based self-test
198. software-based self-test
199. software-based self-test (SBST)
200. soil phosphorus (P) test
201. standard test method
202. static load test
203. static-dynamic probing test (SDT)
204. stress test
205. system level test
206. teaching design and test of systems
207. tensile test
208. tensile test
209. test
210. test and evaluation platform
211. test automation
212. test bench
213. test coverage
214. test driven development
215. test driven modelling
216. test embankment
217. test equipment
218. test groups
219. test model design
220. test optimization
221. test packets
222. test path synthesis
223. test patterns
224. test point insertion
225. test reference year
226. test replication
227. test scenario description language
228. test-bed
229. test-chips
230. test-house
231. test-pattern
232. test-suite reduction
233. Three-point bending test
234. unit root test
235. usability platform test
236. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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