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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

book article
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journal article EST / journal article ENG

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est https://doi.org/10.3176/proc.2014.1.08 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. Hierarchical Multi-level Test Generation
10. high-level test data generation
11. highlevel test generation
12. implementation-independent test generation
13. offline test generation
14. provably correct test generation
15. test generation
16. test generation and fault diagnosis
17. Test Group Generation for Detecting Multiple Faults
18. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
19. Apollo program
20. automatic program synthesis
21. Baltic-wide HELCOM COMBINE monitoring program
22. college program
23. master program
24. monitoring program
25. NATO. Science for Peace and Security Program
26. probabilistic relational program logic
27. program
28. program analysis
29. program debugging
30. program equivalence
31. program management
32. program packages
33. program transformation
34. program verification
35. SNAP program
36. stufy program
37. Activity-based demand generation
38. automated code generation
39. automatic code generation
40. Automatic generation control
41. automatic GUI model generation
42. building and urban form generation
43. business model generation
44. code generation
45. data set generation
46. decentralized key generation
47. disaster alert generation
48. distributed electricity generation
49. distributed generation
50. Distributed Generation (DG)
51. distributed generation systems
52. distributed power generation
53. distrubuted power generation
54. droplet generation
55. droplet generation rate control
56. electric power generation
57. electricity generation
58. energy generation
59. extreme penetration level of non synchronous generation
60. feasible path generation
61. fifth generation computer
62. fourth generation district heating
63. frequent item generation
64. generation
65. generation and transmission expansion planning
66. Generation Costs
67. generation of electric energy
68. generation scheduling
69. generation succession
70. heat generation
71. hydroelectric power generation
72. hydrogen generation
73. I–III generation
74. job generation
75. knowledge generation
76. multisine generation
77. next generation 4D printing
78. next generation sequencing
79. Next-generation probiotics
80. next-generation sequencing
81. oil-shale power generation
82. pattern Generation
83. photovoltaic (PV) generation
84. photovoltaic generation dispatch
85. power generation
86. power generation dispatch
87. power generation economics
88. power generation planning
89. PV generation
90. PV power generation
91. Renewable energy generation
92. renewable generation
93. residual generation
94. rule generation
95. Second generation bioethanol
96. second generation of tribology models
97. second generation sequencing
98. signal generation
99. silver generation
100. solar power generation
101. space generation advisory council
102. template based sql generation
103. trajectory generation
104. waste generation
105. wave generation
106. white light generation
107. wind energy generation
108. wind generation
109. wind power generation
110. 16S rRNA gene amplicon next-generation sequencing
111. 4GDH (4th generation district heating)
112. 4th generation district heating
113. 5th generation district heating
114. accelerated shelf-life test
115. antigen test
116. Applications in Test Engineering
117. ASTM G65 dry sand rubber wheel abrasion test
118. Automated Synthesis of Software-based Self-test
119. automated test environment
120. Auvergne test-bed
121. battery test
122. behavioral test
123. bending test
124. bit-error rate test
125. Board and System Test
126. board test
127. bounds test
128. built-in self-test
129. capillary condensation redistribution test
130. chi-square test
131. closed bottle test
132. cognitive screening test
133. compartment fire test
134. compartment test
135. cone penetration test (CPT)
136. COVID-19 antigen test
137. cutting test
138. cybersecurity test bed
139. DDR4 interconnect test
140. design and test
141. design-for-test
142. deterministic test sequences
143. diagnostic test
144. digital test
145. Digital test and testable design
146. double-pulse test
147. drawing test
148. dry droplet antimicrobial test
149. embedded test
150. fan pressurisation test
151. final test result prediction
152. four-point bending test
153. FPGA based test
154. FPGA-Assisted Test
155. FPGA-centric test
156. functional self-test
157. Granger causality test
158. hardness test
159. high-level synthesis for test
160. high-speed serial link test
161. IEEE 9 bus test system
162. in situ tensile test in SEM
163. industrial field test
164. in-situ tensile test in SEM
165. Johansen cointegration test
166. Kolmogorov-Smirnov test
167. load test
168. logic built-in self-test
169. Luria alternating series test
170. Mann–Kendall test
171. memory interconnect test
172. microprocessor test
173. Model test
174. multiplier test
175. orthogonal test
176. package test analysis
177. parallel design and test
178. performance test
179. piezocone penetration test (CPTu)
180. Point Load Test index
181. pressurisation test
182. processor-centric board test
183. progressive damage test
184. pseudo-exhaustive test
185. purity test
186. rolling thin film oven test
187. rtioco-based timed test sequences
188. seasonal Mann Kendall test
189. seismic piezocone penetration test
190. self-test
191. self-test architectures
192. sentence writing test
193. serial sevens test
194. ship towing test tank
195. similar material simulation test
196. small-scale fire test
197. small‐scale test
198. software based self-test
199. software-based self-test
200. software-based self-test (SBST)
201. soil phosphorus (P) test
202. standard test method
203. static load test
204. static-dynamic probing test (SDT)
205. stress test
206. system level test
207. teaching design and test of systems
208. tensile test
209. tensile test
210. test
211. test and evaluation platform
212. test automation
213. test bench
214. test coverage
215. test driven development
216. test driven modelling
217. test embankment
218. test equipment
219. test groups
220. test model design
221. test optimization
222. test packets
223. test path synthesis
224. test patterns
225. test point insertion
226. test reference year
227. test replication
228. test scenario description language
229. test-bed
230. test-chips
231. test-house
232. test-pattern
233. test-suite reduction
234. Three-point bending test
235. unit root test
236. usability platform test
237. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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