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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

book article
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journal article EST / journal article ENG

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est https://doi.org/10.3176/proc.2014.1.08 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
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book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. Hierarchical Multi-level Test Generation
10. high-level test data generation
11. highlevel test generation
12. implementation-independent test generation
13. offline test generation
14. provably correct test generation
15. test generation
16. test generation and fault diagnosis
17. Test Group Generation for Detecting Multiple Faults
18. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
19. Apollo program
20. automatic program synthesis
21. Baltic-wide HELCOM COMBINE monitoring program
22. BIP (Blended Intensive Program)
23. college program
24. European Program for Prevention
25. master program
26. monitoring program
27. NATO. Science for Peace and Security Program
28. probabilistic relational program logic
29. program
30. program analysis
31. program debugging
32. program equivalence
33. program management
34. program packages
35. program transformation
36. program verification
37. SNAP program
38. stufy program
39. Activity-based demand generation
40. automated code generation
41. automatic code generation
42. Automatic generation control
43. automatic GUI model generation
44. building and urban form generation
45. business model generation
46. code generation
47. data set generation
48. decentralized key generation
49. disaster alert generation
50. distributed electricity generation
51. distributed generation
52. Distributed Generation (DG)
53. distributed generation systems
54. distributed power generation
55. distrubuted power generation
56. droplet generation
57. droplet generation rate control
58. electric power generation
59. electricity generation
60. energy generation
61. extreme penetration level of non synchronous generation
62. feasible path generation
63. fifth generation computer
64. food waste generation
65. fourth generation district heating
66. frequent item generation
67. generation
68. generation and transmission expansion planning
69. Generation Costs
70. generation of electric energy
71. generation scheduling
72. generation succession
73. heat generation
74. hydroelectric power generation
75. hydrogen generation
76. I–III generation
77. job generation
78. knowledge generation
79. multisine generation
80. next generation 4D printing
81. next generation sequencing
82. Next-generation probiotics
83. next-generation sequencing
84. oil-shale power generation
85. pattern Generation
86. photovoltaic (PV) generation
87. photovoltaic generation dispatch
88. power generation
89. power generation dispatch
90. power generation economics
91. power generation planning
92. PV generation
93. PV power generation
94. Renewable energy generation
95. renewable generation
96. residual generation
97. rule generation
98. Second generation bioethanol
99. second generation of tribology models
100. second generation sequencing
101. signal generation
102. silver generation
103. sixth-generation (6G)
104. solar power generation
105. space generation advisory council
106. template based sql generation
107. trajectory generation
108. waste generation
109. wave generation
110. WEEE generation
111. white light generation
112. wind energy generation
113. wind generation
114. wind power generation
115. 16S rRNA gene amplicon next-generation sequencing
116. 4GDH (4th generation district heating)
117. 4th generation district heating
118. 5th generation district heating
119. accelerated shelf-life test
120. antigen test
121. Applications in Test Engineering
122. ASTM G65 dry sand rubber wheel abrasion test
123. Automated Synthesis of Software-based Self-test
124. automated test environment
125. Auvergne test-bed
126. battery test
127. behavioral test
128. bending test
129. bit-error rate test
130. Board and System Test
131. board test
132. bounds test
133. built-in self-test
134. capillary condensation redistribution test
135. chi-square test
136. closed bottle test
137. cognitive screening test
138. compartment fire test
139. compartment test
140. cone penetration test (CPT)
141. COVID-19 antigen test
142. cutting test
143. cybersecurity test bed
144. DDR4 interconnect test
145. design and test
146. design-for-test
147. deterministic test sequences
148. diagnostic test
149. digital test
150. Digital test and testable design
151. double-pulse test
152. drawing test
153. dry droplet antimicrobial test
154. embedded test
155. fan pressurisation test
156. final test result prediction
157. four-point bending test
158. FPGA based test
159. FPGA-Assisted Test
160. FPGA-centric test
161. functional self-test
162. Granger causality test
163. hardness test
164. high-level synthesis for test
165. high-speed serial link test
166. IEEE 9 bus test system
167. in situ tensile test in SEM
168. industrial field test
169. in-situ tensile test in SEM
170. Johansen cointegration test
171. Kolmogorov-Smirnov test
172. load test
173. logic built-in self-test
174. Luria alternating series test
175. Mann–Kendall test
176. Mann-Kendall trend test
177. memory interconnect test
178. microprocessor test
179. Model test
180. multiplier test
181. orthogonal test
182. package test analysis
183. parallel design and test
184. performance test
185. piezocone penetration test (CPTu)
186. Point Load Test index
187. pressurisation test
188. processor-centric board test
189. progressive damage test
190. pseudo-exhaustive test
191. purity test
192. real-time room temperature test
193. rolling thin film oven test
194. rtioco-based timed test sequences
195. seasonal Mann Kendall test
196. seismic piezocone penetration test
197. self-test
198. self-test architectures
199. sentence writing test
200. serial sevens test
201. ship towing test tank
202. similar material simulation test
203. small-scale fire test
204. small‐scale test
205. software based self-test
206. software-based self-test
207. software-based self-test (SBST)
208. soil phosphorus (P) test
209. standard test method
210. static load test
211. static-dynamic probing test (SDT)
212. stress test
213. system level test
214. teaching design and test of systems
215. tensile test
216. tensile test
217. test
218. test and evaluation platform
219. test automation
220. test bench
221. test coverage
222. test driven development
223. test driven modelling
224. test embankment
225. test equipment
226. test groups
227. test model design
228. test optimization
229. test packets
230. test path synthesis
231. test patterns
232. test point insertion
233. test reference year
234. test replication
235. test scenario description language
236. test-bed
237. test-chips
238. test-house
239. test-pattern
240. test-suite reduction
241. Three-point bending test
242. unit root test
243. usability platform test
244. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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