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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

book article
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journal article EST / journal article ENG

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est https://doi.org/10.3176/proc.2014.1.08 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
4

book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. Hierarchical Multi-level Test Generation
10. high-level test data generation
11. highlevel test generation
12. implementation-independent test generation
13. offline test generation
14. provably correct test generation
15. test generation
16. test generation and fault diagnosis
17. Test Group Generation for Detecting Multiple Faults
18. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
19. Apollo program
20. automatic program synthesis
21. Baltic-wide HELCOM COMBINE monitoring program
22. BIP (Blended Intensive Program)
23. college program
24. European Program for Prevention
25. master program
26. monitoring program
27. NATO. Science for Peace and Security Program
28. probabilistic relational program logic
29. program
30. program analysis
31. program debugging
32. program equivalence
33. program logics
34. program management
35. program packages
36. program transformation
37. program verification
38. SNAP program
39. stufy program
40. Activity-based demand generation
41. automated code generation
42. automatic code generation
43. Automatic generation control
44. automatic GUI model generation
45. building and urban form generation
46. business model generation
47. code generation
48. data set generation
49. decentralized key generation
50. disaster alert generation
51. distributed electricity generation
52. distributed generation
53. Distributed Generation (DG)
54. distributed generation systems
55. distributed power generation
56. distrubuted power generation
57. droplet generation
58. droplet generation rate control
59. electric power generation
60. electricity generation
61. energy generation
62. extreme penetration level of non synchronous generation
63. feasible path generation
64. fifth generation computer
65. food waste generation
66. fourth generation district heating
67. frequent item generation
68. generation
69. generation and transmission expansion planning
70. Generation Costs
71. generation of electric energy
72. generation scheduling
73. generation succession
74. heat generation
75. hydroelectric power generation
76. hydrogen generation
77. I–III generation
78. job generation
79. knowledge generation
80. multisine generation
81. next generation 4D printing
82. next generation sequencing
83. Next-generation probiotics
84. next-generation sequencing
85. oil-shale power generation
86. pattern Generation
87. photovoltaic (PV) generation
88. photovoltaic generation dispatch
89. power generation
90. power generation dispatch
91. power generation economics
92. power generation planning
93. PV generation
94. PV power generation
95. real-time alert generation
96. Renewable energy generation
97. renewable generation
98. residual generation
99. rule generation
100. Scenario Generation
101. Second generation bioethanol
102. second generation of tribology models
103. second generation sequencing
104. signal generation
105. silver generation
106. sixth-generation (6G)
107. solar power generation
108. space generation advisory council
109. template based sql generation
110. trajectory generation
111. waste generation
112. wave generation
113. WEEE generation
114. white light generation
115. wind energy generation
116. wind generation
117. wind power generation
118. 16S rRNA gene amplicon next-generation sequencing
119. 4GDH (4th generation district heating)
120. 4th generation district heating
121. 5th generation district heating (5GDH)
122. accelerated shelf-life test
123. antigen test
124. Applications in Test Engineering
125. ASTM G65 dry sand rubber wheel abrasion test
126. Automated Synthesis of Software-based Self-test
127. automated test environment
128. Auvergne test-bed
129. battery test
130. behavioral test
131. bending test
132. bit-error rate test
133. Board and System Test
134. board test
135. bounds test
136. built-in self-test
137. capillary condensation redistribution test
138. chi-square test
139. closed bottle test
140. cognitive screening test
141. compartment fire test
142. compartment test
143. cone penetration test (CPT)
144. COVID-19 antigen test
145. cutting test
146. cybersecurity test bed
147. DDR4 interconnect test
148. design and test
149. design-for-test
150. deterministic test sequences
151. diagnostic test
152. digital test
153. Digital test and testable design
154. double-pulse test
155. drawing test
156. dry droplet antimicrobial test
157. Embedded figures test
158. embedded test
159. fan pressurisation test
160. final test result prediction
161. four-point bending test
162. FPGA based test
163. FPGA-Assisted Test
164. FPGA-centric test
165. functional self-test
166. Granger causality test
167. hardness test
168. high-level synthesis for test
169. high-speed serial link test
170. IEEE 9 bus test system
171. in situ tensile test in SEM
172. industrial field test
173. in-situ tensile test in SEM
174. Johansen cointegration test
175. Kolmogorov-Smirnov test
176. load test
177. logic built-in self-test
178. Luria alternating series test
179. Mann–Kendall test
180. Mann-Kendall trend test
181. memory interconnect test
182. microprocessor test
183. Model test
184. multiplier test
185. orthogonal test
186. package test analysis
187. parallel design and test
188. performance test
189. piezocone penetration test (CPTu)
190. Point Load Test index
191. pressurisation test
192. processor-centric board test
193. progressive damage test
194. Provably Correct Test Development
195. pseudo-exhaustive test
196. purity test
197. real-time room temperature test
198. rolling thin film oven test
199. rtioco-based timed test sequences
200. seasonal Mann Kendall test
201. seismic piezocone penetration test
202. self-test
203. self-test architectures
204. sentence writing test
205. serial sevens test
206. ship towing test tank
207. similar material simulation test
208. small-scale fire test
209. small‐scale test
210. software based self-test
211. software-based self-test
212. software-based self-test (SBST)
213. soil phosphorus (P) test
214. standard test method
215. static load test
216. static-dynamic probing test (SDT)
217. stress test
218. system level test
219. teaching design and test of systems
220. tensile test
221. tensile test
222. test
223. Test Adapters
224. test and evaluation platform
225. test automation
226. test bench
227. test coverage
228. test driven development
229. test driven modelling
230. test embankment
231. test equipment
232. test groups
233. test model design
234. test optimization
235. test packets
236. test path synthesis
237. test patterns
238. test point insertion
239. test reference year
240. test replication
241. test scenario description language
242. test-bed
243. test-chips
244. test-house
245. test-pattern
246. test-suite reduction
247. Three-point bending test
248. unit root test
249. usability platform test
250. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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