Searching - TalTech Research Portal

Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles

Research Groups

Help and information

Searching

test program generation (keyword)

—

—

—

—

Add criteria Advanced search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publication ..

year

year of publication

Loading..

Loading..

TTÜ department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

Number of records 4
Look more.. (2/227)
Export

export all inquiry results (4)
Save TXT fail

Save PDF fail

print
Open for editing with marked entries my bookmarks

display

sort
1

book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

book article
2

book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

book article
3

journal article

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est

journal article
4

book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. high-level test data generation
10. highlevel test generation
11. implementation-independent test generation
12. offline test generation
13. provably correct test generation
14. test generation
15. test generation and fault diagnosis
16. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
17. Apollo program
18. automatic program synthesis
19. Baltic-wide HELCOM COMBINE monitoring program
20. college program
21. master program
22. monitoring program
23. NATO. Science for Peace and Security Program
24. probabilistic relational program logic
25. program
26. program analysis
27. program equivalence
28. program management
29. program packages
30. program transformation
31. program verification
32. SNAP program
33. stufy program
34. Activity-based demand generation
35. automatic code generation
36. Automatic generation control
37. automatic GUI model generation
38. building and urban form generation
39. business model generation
40. code generation
41. data set generation
42. disaster alert generation
43. distributed electricity generation
44. distributed generation
45. Distributed Generation (DG)
46. distributed generation systems
47. distributed power generation
48. distrubuted power generation
49. droplet generation
50. droplet generation rate control
51. electric power generation
52. electricity generation
53. energy generation
54. extreme penetration level of non synchronous generation
55. feasible path generation
56. fifth generation computer
57. fourth generation district heating
58. frequent item generation
59. generation
60. generation and transmission expansion planning
61. Generation Costs
62. generation of electric energy
63. generation succession
64. heat generation
65. hydroelectric power generation
66. hydrogen generation
67. I–III generation
68. job generation
69. multisine generation
70. next generation 4D printing
71. next generation sequencing
72. Next-generation probiotics
73. next-generation sequencing
74. oil-shale power generation
75. pattern Generation
76. photovoltaic (PV) generation
77. photovoltaic generation dispatch
78. power generation
79. power generation dispatch
80. power generation economics
81. power generation planning
82. PV generation
83. PV power generation
84. Renewable energy generation
85. renewable generation
86. residual generation
87. Second generation bioethanol
88. second generation of tribology models
89. second generation sequencing
90. signal generation
91. silver generation
92. solar power generation
93. space generation advisory council
94. template based sql generation
95. trajectory generation
96. waste generation
97. wave generation
98. white light generation
99. wind energy generation
100. wind generation
101. wind power generation
102. 16S rRNA gene amplicon next-generation sequencing
103. 4GDH (4th generation district heating)
104. 4th generation district heating
105. 5th generation district heating
106. accelerated shelf-life test
107. antigen test
108. ASTM G65 dry sand rubber wheel abrasion test
109. automated test environment
110. Auvergne test-bed
111. battery test
112. behavioral test
113. bending test
114. bit-error rate test
115. Board and System Test
116. board test
117. bounds test
118. built-in self-test
119. capillary condensation redistribution test
120. chi-square test
121. closed bottle test
122. cognitive screening test
123. compartment fire test
124. compartment test
125. cone penetration test (CPT)
126. COVID-19 antigen test
127. cutting test
128. cybersecurity test bed
129. DDR4 interconnect test
130. design and test
131. design-for-test
132. deterministic test sequences
133. diagnostic test
134. digital test
135. Digital test and testable design
136. double-pulse test
137. drawing test
138. dry droplet antimicrobial test
139. embedded test
140. fan pressurisation test
141. final test result prediction
142. four-point bending test
143. FPGA based test
144. FPGA-Assisted Test
145. FPGA-centric test
146. functional self-test
147. Granger causality test
148. hardness test
149. high-level synthesis for test
150. high-speed serial link test
151. IEEE 9 bus test system
152. in situ tensile test in SEM
153. industrial field test
154. in-situ tensile test in SEM
155. Johansen cointegration test
156. Kolmogorov-Smirnov test
157. load test
158. logic built-in self-test
159. Luria alternating series test
160. Mann–Kendall test
161. memory interconnect test
162. microprocessor test
163. Model test
164. multiplier test
165. orthogonal test
166. package test analysis
167. parallel design and test
168. performance test
169. piezocone penetration test (CPTu)
170. Point Load Test index
171. pressurisation test
172. processor-centric board test
173. progressive damage test
174. pseudo-exhaustive test
175. purity test
176. rtioco-based timed test sequences
177. seasonal Mann Kendall test
178. seismic piezocone penetration test
179. self-test
180. self-test architectures
181. sentence writing test
182. serial sevens test
183. ship towing test tank
184. similar material simulation test
185. small-scale fire test
186. small‐scale test
187. software based self-test
188. software-based self-test
189. software-based self-test (SBST)
190. soil phosphorus (P) test
191. standard test method
192. static load test
193. static-dynamic probing test (SDT)
194. stress test
195. system level test
196. teaching design and test of systems
197. tensile test
198. test
199. test and evaluation platform
200. test bench
201. test coverage
202. test driven development
203. test driven modelling
204. test embankment
205. test equipment
206. test groups
207. test model design
208. test optimization
209. test packets
210. test path synthesis
211. test patterns
212. test point insertion
213. test reference year
214. test replication
215. test scenario description language
216. test-bed
217. test-chips
218. test-house
219. test-pattern
220. test-suite reduction
221. Three-point bending test
222. unit root test
223. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

match

sort

Otsing
Valikud 0

year of publication

author

TTÜ department

subject term

series

name of the person

keyword

TalTech Library

Akadeemia tee 1

13519

TalTech homepage TalTech Library homepage Digital Collection of TalTech Library Digiteek Repository

6203551

data@taltech.ee

TalTech Raamatukogu