Otsing - TalTech teadusportaal

kuva

reasta

51

artikkel kogumikus

RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systemsJenihhin, Maksim; Raik, Jaan2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings2020 / art. 19690741 , 6 p https://doi.org/10.23919/DATE48585.2020.9116558

artikkel kogumikus

52

artikkel kogumikus

SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN AcceleratorsTaheri, Mahdi; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim; Pappalardo, Salvatore; Jimenez, Paul; Deveautour, Bastien; Bosio, Alberto2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) : 03-05 April 2024, Kielce, Poland2024 / p. 19–24 : ill https://doi.org//10.1109/DDECS60919.2024.10508925

artikkel kogumikus

Seotud publikatsioonid 1

Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine

53

artikkel kogumikus

Scenario-based Validation for Autonomous Vehicles with Different Fidelity LevelsMalayjerdi, Mohsen; Kaljavesi, Gemb; Diermeyer, Frank; Sell, Raivo2023 IEEE Conference on Intelligent Transportation Systems (ITSC 2023)2023 / 6 p https://doi.org/10.1109/ITSC57777.2023.10422403

artikkel kogumikus

54

artikkel ajakirjas

Self-healing photovoltaic microconverter with zero redundancy and accurate low-cost fault detectionBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, DmitriIEEE transactions on industrial electronics2024 / p. 646-656 https://doi.org/10.1109/TIE.2023.3250836

artikkel ajakirjas

Seotud publikatsioonid 1

Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid

55

artikkel kogumikus

Sensorless pressure calculation for parallel redundancy in pumping systemsVodovozov, Valery; Bakman, Ilja2014 16th European Conference on Power Electronics and Applications (EPE'14-ECCE Europe) : Lappeenranta, Finland, 26-28 August 2014. Vol. 12014 / p. 210-218 : ill

artikkel kogumikus

56

artikkel kogumikus

Short-circuit fault detection and remedial in full-bridge rectifier of series resonant DC-DC converter based on inductor voltage signatureBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, Dmitri2020 IEEE 61st International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia, Nov. 5-7, 2020 : conference proceedings2020 / 6 p. : ill https://doi.org/10.1109/RTUCON51174.2020.9316482

artikkel kogumikus

Seotud publikatsioonid 1

Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid

57

artikkel kogumikus EST / artikkel kogumikus ENG

Special session : approximation and fault resiliency of DNN acceleratorsAhmadilivani, Mohammad Hasan; Barbareschi, Mario; Barone, Salvatore; Bosio, Alberto; Daneshtalab, Masoud; Torca, Salvatore Della; Gavarini, Gabriele; Jenihhin, Maksim; Raik, Jaan; Taheri, Mahdi2023 IEEE 41st VLSI Test Symposium (VTS) : proceedings2023 / 10 p. : ill https://doi.org/10.1109/VTS56346.2023.10140043 Conference proceeding at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

Seotud publikatsioonid 1

Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine

58

artikkel kogumikus EST / artikkel kogumikus ENG

Special session: reliability assessment recipes for DNN acceleratorsAhmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Dos Santos, Fernando Fernandes; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Sierra, Robert Limas; Raik, Jaan; Taheri, Mahdi42nd IEEE VLSI Test Symposium, VTS 20242024 / 11 p. : ill https://doi.org/10.1109/VTS60656.2024.10538707 Conference proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

Seotud publikatsioonid 1

Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine

59

artikkel kogumikus

Study of MOSFET post-fault operation in fault-tolerant DC-DC convertersBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, Dmitri2022 IEEE 7th International Energy Conference (ENERGYCON)2022 / Code 181231, 5 p https://doi.org/10.1109/ENERGYCON53164.2022.9830216

artikkel kogumikus

Seotud publikatsioonid 1

Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid

60

artikkel kogumikus EST / artikkel kogumikus ENG

Supply chain quality improvement based on customer complianceMaas, Rene; Shevtshenko, Eduard; Karaulova, TatjanaTechnological Innovation for Connected Cyber Physical Spaces : 14th IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2023, Caparica, Portugal, July 5–7, 2023 : proceedings2023 / p. 230 - 242 https://doi.org/10.1007/978-3-031-36007-7_17 Conference Proceedings at Scopus Article at Scopus

artikkel kogumikus EST / artikkel kogumikus ENG

61

artikkel ajakirjas EST / artikkel ajakirjas ENG

Using STLs for effective in-field test of GPUsRodriguez Condia, Josie E.; Da Silva, Felipe Augusto; Bagbaba, Ahmet Cagrl; Guerrero-Balaguera, Juan-David; Hamdioui, Said; Sauer, Christian; Reorda, Matteo SonzaIEEE Design and Test2023 / p. 109-117 https://doi.org/10.1109/MDAT.2022.3188573 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

62

artikkel ajakirjas EST / artikkel ajakirjas ENG

Wear-out failure analysis of an impedance-source PV microinverter based on system-level electrothermal modelingShen, Yanfeng; Chub, Andrii; Wang, Huai; Vinnikov, Dmitri; Liivik, Elizaveta; Blaabjerg, FredeIEEE transactions on industrial electronics2019 / p. 3914-3927 https://doi.org/10.1109/TIE.2018.2831643 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

63

artikkel kogumikus

Wear-out failure analysis of solar optiverter operating with 60- and 72-cell Si crystalline PV modulesLiivik, Liisa; Chub, Andrii; Sangwongwanich, Ariya; Shen, Yanfeng; Vinnikov, Dmitri; Blaabjerg, FredeIECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society : proceedings2018 / p. 6134-6140 : ill https://doi.org/10.1109/IECON.2018.8592925

artikkel kogumikus

reliability (võtmesõna)

teaviku laadid

võtmesõna 27