Otsing - TalTech teadusportaal

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1

artikkel kogumikus

Automated design and diagnosis of electronic system based on description language representationWawryn, Krzysztof; Drabarek, JozefBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 21994 / p. 443-448 https://www.ester.ee/record=b2150914*est

artikkel kogumikus

2

artikkel kogumikus

Automatic circuit partitioning for FPGAsKrupnova, Helena; Abbara, A.; Brasen, D.; Saucier, GabrieleBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 389-392: ill

artikkel kogumikus

3

raamat

Boole'i algebra kasutamine automaatikalülituste projekteerimisel : loengukonspektAgur, Ustus1972 https://www.ester.ee/record=b1327567*est

raamat

4

artikkel ajakirjas EST / artikkel ajakirjas ENG

Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanMicroprocessors and microsystems2020 / art. 103117, 12 p https://doi.org/10.1016/j.micpro.2020.103117 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

5

artikkel kogumikus

Chaos in electronic circuitsLindberg, ErikBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 29-37: ill

artikkel kogumikus

6

artikkel kogumikus

Combinational fault simulation in sequential circuitsUbar, Raimund-Johannes; Kõusaar, Jaak; Gorev, Maksim; Devadze, Sergei2015 IEEE International Symposium on Circuits and Systems : 24-27 May 2015, Lisboa, Portugal : [proceedings]2015 / p. 2876-2879 : ill

artikkel kogumikus

7

artikkel kogumikus

Complex delay fault reasoning with sequential 7-valued algebraKõusaar, Jaak; Ubar, Raimund-Johannes; Aleksejev, Igor2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102403

artikkel kogumikus

8

raamat

Computational aspects of nodal method for simulation of electronic circuitsLaksberg, Edgar1983

raamat

9

artikkel ajakirjas

Computer-aided examination of the I²L current source and the behaviour of the I²L flip-flop used in static memory cellsRang, ToomasPeriodica polytechnica. Electrical engineering = Электротехника1981 / p. 159-165 : joon https://www.ester.ee/record=b1198855*est https://pp.bme.hu/ee/article/view/4776/3881

artikkel ajakirjas

10

artikkel kogumikus

Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]Jürimägi, Lembit; Ubar, Raimund-JohannesBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p. : ill https://doi.org/10.1109/BEC.2018.8600967

artikkel kogumikus

11

artikkel kogumikus

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan2014 17th Euromicro Conference on Digital System Design : DSD 2014 : 27-29 August 2014, Verona, Italy : proceedings2014 / p. 108-113 : ill

artikkel kogumikus

12

artikkel kogumikus

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, JaanProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 61-66 : ill

artikkel kogumikus

13

artikkel kogumikus

Defects, faults and fault modelsGramatova, Elena; Fisherova, Maria; Ubar, Raimund-Johannes; Pleskacz, Witold A.Handbook of testing electronic systems2005 / p. 26-96 : ill

artikkel kogumikus

14

artikkel ajakirjas

Design error diagnosis in digital circuits with stuck-at fault modelJutman, Artur; Ubar, Raimund-JohannesMicroelectronics reliability2000 / 2, p. 307-320 : ill

artikkel ajakirjas

15

artikkel kogumikus

Diagnostics system for electronic circuitsMelentjev, Sergei11th International Symposium "Topical Problems in the Field of Electrical and Power Engineering." Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 16-21, 20122012 / p. 192-194 : ill

artikkel kogumikus

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raamat

Digitaalsüsteemide diagnostikaUbar, Raimund-Johannes2005 http://www.ester.ee/record=b2097071*est

raamat

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artikkel kogumikus

Efficient at-speed interconnect BIST and diagnosis frameworkJutman, ArturInformal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 20052005 / p. 257-258 : ill https://artiklid.elnet.ee/record=b1018804*est

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artikkel kogumikus

Ein universeller Weg zur Automatisierung des Testentwurfs für digitale ObjecteUbar, Raimund-Johannes; Lohuaru, TõnuFehler in Automaten1989 / S. 16-30 : Ill

artikkel kogumikus

19

raamat

Electronic circuits : examples for project based subject "Technologies of electronic products"Sillakivi, Peeter; Tamm, Uljas2003 https://www.ester.ee/record=b1828290*est

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20

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Elektronlülitused : näidisskeemid projektipõhilisele õppeainele "Elektrontoodete tehnoloogiad"2003 https://www.ester.ee/record=b1828299*est

raamat

21

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European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedingsCantarella, JD2005 https://www.ester.ee/record=b2300865*est

raamat

22

artikkel kogumikus

Evolutionary approach to test generation for functional BISTSkobtsov, Y.A.; Ivanov, D.E.; Skobtsov, V.Y.; Ubar, Raimund-Johannes; Raik, JaanInformal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 20052005 / p. 151-155 : ill https://artiklid.elnet.ee/record=b1018764*est

artikkel kogumikus

23

artikkel ajakirjas

Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanInternational journal of microelectronics and computer science2018 / p. 9−18 https://ijmcs.dmcs.pl/web/guest/vol.-9-no.-1 https://ijmcs.dmcs.pl/documents/10630/345460/IJMCS_1_2018_2.pdf

artikkel ajakirjas

24

artikkel kogumikus

Experimental performance validation of Z-source DC circuit breaker for high impedance faultsPogulaguntla, Aditya; Naik Banavath, Satish; Chub, Andrii; Vinnikov, Dmitri; Singh, Rajendra2024 IEEE Sixth International Conference on DC Microgrids (ICDCM)2024 / 5 p https://doi.org/10.1109/ICDCM60322.2024.10664702

artikkel kogumikus

25

artikkel ajakirjas EST / artikkel ajakirjas ENG

Fast identification of true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Jürimägi, LembitMicroelectronics reliability2018 / p. 252-261 : ill https://doi.org/10.1016/j.microrel.2017.11.027 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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