Otsing - TalTech teadusportaal

kuva

reasta

51

raamat

Product and manufacturing in electronics : supplementary material in the subject "Technologies of electronic circuits"Rang, Toomas2003 https://www.ester.ee/record=b1766953*est

raamat

52

artikkel kogumikus

Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPGPalermo, N.; Tihhomirov, Valentin; Copetti, Thiago; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102405

artikkel kogumikus

53

artikkel kogumikus

Research and training environment for digital design and testUbar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of the Eighth IASTED International Conference on Computers and Advanced Technology in Education : August 29-31, 2005, Oranjestad, Aruba2005 / p. 232-237 : ill https://ieeexplore.ieee.org/document/1408779

artikkel kogumikus

54

artikkel kogumikus

Reuse-dominated synthesis of electronic designsConradi, PeterBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 21994 / p. 431-435: ill https://www.ester.ee/record=b2150914*est

artikkel kogumikus

55

artikkel kogumikus

Scalable algorithm for structural fault collapsing in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea2015 / p. 171-176 : ill

artikkel kogumikus

56

artikkel kogumikus

A scalable technique to identify true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, JaanProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 152-157 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

artikkel kogumikus

57

artikkel kogumikus

7-valued algebra for transition delay fault analysisKõusaar, Jaak; Ubar, Raimund-JohannesBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 89-92 : ill

artikkel kogumikus

58

artikkel kogumikus

Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Raik, Jaan2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway2015 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2015.7364406

artikkel kogumikus

59

artikkel kogumikus

SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, Maksim2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 223-228 : ill

artikkel kogumikus

60

artikkel kogumikus

State of charge estimation for Li-ion batteries based on equivalent circuit diagrams and the application of a Kalman filterRahmoun, Ahmad; Biechl, Helmuth; Rosin, Argo12th International Symposium "Topical Problems in the Field of Electrical and Power Engineering." Doctoral School of Energy and Geotechnology II : Kuressaare, Estonia, June 11-16, 20122012 / p. 125-128 : ill

artikkel kogumikus

61

artikkel kogumikus

Switched capacitor general immitance converterKängsep, Eiko; Kukk, VelloBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 21994 / p. 483-486: ill https://www.ester.ee/record=b2150914*est

artikkel kogumikus

62

dissertatsioon

Symbolic test generation for hierarchically modeled digital systemsZaugarov, Viktor1993 https://www.ester.ee/record=b2090336*est

dissertatsioon

63

artikkel kogumikus

Synthesis of hierarchically testable FSM networksKasirova, Lilia; Keevallik, Andres; Kruus, MargusBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 347-352: ill

artikkel kogumikus

64

artikkel kogumikus

TCAD with device-circuit simulators for advanced process development, correlations between model parameters and optimizationBubennikov, Alexander N.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 21994 / p. 517-522: ill https://www.ester.ee/record=b2150914*est

artikkel kogumikus

65

artikkel ajakirjas

10th IEEE European Test SymposiumUbar, Raimund-Johannes; Prinetto, Paolo; Raik, JaanIEEE journal of design & test of computers2005 / p. 480-481 : phot http://dx.doi.org/10.1109/MDT.2005.106

artikkel ajakirjas

66

artikkel kogumikus

Testing toolsJutman, ArturHandbook of testing electronic systems2005 / p. 361-365 : ill

artikkel kogumikus

67

artikkel kogumikus

Testing toolsRaik, JaanHandbook of testing electronic systems2005 / p. 373-378 : ill

artikkel kogumikus

68

artikkel kogumikus

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

artikkel kogumikus

69

artikkel ajakirjas EST / artikkel ajakirjas ENG

Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebraKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, JaanMicroprocessors and microsystems2015 / p. 1130-1138 : ill https://doi.org/10.1016/j.micpro.2015.05.003 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

70

dissertatsioon

Ökonoomsete negatiivse diferentsiaaltakistusega astmete ja elementide disainimine ja optimeerimineTaniloo, Rainer2005 https://www.ester.ee/record=b2073482*est

dissertatsioon

71

artikkel kogumikus

Генерирование тестов для цифровых схем при помощи модели альтернативных графовUbar, Raimund-JohannesТруды по электротехнике и автоматике : сборник статей. 141976 / с. 75-81 https://www.ester.ee/record=b2190768*est https://digikogu.taltech.ee/et/Item/aa35e320-87b1-405b-9cac-3b90c51867d1

artikkel kogumikus

72

artikkel kogumikus

Диалоговая система моделирования электронных схем "ПОИСК"Laksberg, Edgar; Nelus, K.; Ess, ViktorМетоды и устройства регистрации, передачи, обработки и представления информации1986 / с. 63-68

artikkel kogumikus

73

artikkel kogumikus

Единый подход к синтезу тестов цифровых схем и системUbar, Raimund-JohannesМежреспубликанская школа-семинар по технической диагностике, 8-12 октября 1984 года : тезисы докладов1984 / с. 75-81 : илл https://www.ester.ee/record=b1237891*est

artikkel kogumikus

74

raamat

Импульсные устройства : лабораторная работа No 5 : триггеры на логических элементах1988 https://www.ester.ee/record=b1224918*est

raamat

75

dissertatsioon

Исследование алгоритмов преобразования и аппроксимации параметров линейных систем и цепей на ЭВМ : автореферат ... кандидата технических наук (05.13.01)Rüstern, Ennu1976 https://www.ester.ee/record=b1301697*est

dissertatsioon

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