Otsing - TalTech teadusportaal

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26

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European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedingsCantarella, JD2005 https://www.ester.ee/record=b2300865*est

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27

artikkel kogumikus

Execution of dataflow process networks on OpenCL platformsLund, Wictor; Kanur, Sudeep; Ersfolk, Johan; Tsiopoulos, Leonidas23rd Euromicro International Conference on Parallel, Distributed, and Network-Based Processing : PDP 2015 : 4-6 March 2015, Turku, Finland : proceedings2015 / p. 618-625 : ill https://doi.org/10.1109/PDP.2015.29

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28

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Experimental analysis of cost optimization for electrical floor heating systems in volatile energy marketsUuemaa, Madis; Uleksin, Taaniel; Tammoja, Heiki2017 International Conference on Control, Artificial Intelligence, Robotics & Optimization (ICCAIRO), 20-22 May 2017 : proceedings2017 / p. 177-181 http://doi.ieeecomputersociety.org/10.1109/ICCAIRO.2017.42

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29

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Explaining the decisions of deep learning models for load disaggregation (NILM) based on XAIMachlev, Ram; Malka, Asaf; Perl, Michael; Levron, Yoash; Belikov, Juri2022 IEEE Power & Energy Society General Meeting (PESGM)2022 / art. 183865 , p. 1-5 : ill https://doi.org/10.1109/PESGM48719.2022.9917049

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30

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Fast test cost calculation for hybrid BIST in digital systemsOrasson, Elmet; Raidma, Rein; Ubar, Raimund-Johannes; Jervan, Gert; Peng, ZeboEuromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings2001 / p. 318-325 : ill https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f

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31

artikkel kogumikus

Fault diagnosis in integrated circuits with BISTUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan; Evartson, Teet; Lensen, Harri10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 604-610 : ill http://dx.doi.org/10.1109/DSD.2007.4341530

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Fault-tolerant scheduling of mixed-critical applications on multi-processor platformsBagheri, Mehrdad; Jervan, Gert2014 International Conference on Embedded and Ubiquitous Computing : EUC 2014 : 26-28 August 2014, Milano, Italy : proceedings2014 / p. 25-32 : ill

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33

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Formalization of finite state machines with data path for the verification of high-level synthesisBorrione, Dominique; Dušina, Julia; Pierre, LaurenceXI Brasilian Symposium on Integrated Circuit Design, September 30 - October 3, 1998, Rio de Janeiro, Brazil : proceedings1998 / p. 99-102: ill https://ieeexplore.ieee.org/document/715419

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34

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FP7 collaborative research project DIAMOND : diagnosis, error modeling and correction for reliable systems designRaik, JaanProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p https://ieeexplore.ieee.org/document/6233052

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35

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Functional built-in self-test for processor cores in SoCUbar, Raimund-Johannes; Indus, Viljar; Kalmend, Oliver; Evartson, Teet; Orasson, Elmet30th IEEE NORCHIP Conference : Copenhagen, Denmark, November 12-14, 20122012 / p. 1-4 : ill https://ieeexplore.ieee.org/document/6403148

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36

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Generation of tests for the localization of single gate design errors in combinational circuits using the stuck-at fault modelUbar, Raimund-Johannes; Borrione, DominiqueXI Brasilian Symposium on Integrated Circuit Design, September 30 - October 3, 1998, Rio de Janeiro, Brazil : proceedings1998 / p. 51-54 https://ieeexplore.ieee.org/document/715409

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37

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Heuristics for designing and evaluating socio-technical agent-oriented behaviour models with Coloured Petri NetsMahunnah, Msury; Norta, Alexander; Ma, Lixin; Taveter, KuldarIEEE 38th Annual International Computers, Software and Applications Conference Workshops : 27-29 July 2014, Västerås, Sweden : proceedings2014 / p. 438-443 : ill

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38

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Hierarchical analysis of short defects between metal lines in CMOS ICPleskacz, Witold A.; Jenihhin, Maksim; Raik, Jaan; Rakowski, Michal; Ubar, Raimund-Johannes; Kuzmicz, WieslawProceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy2008 / p. 729-734 : ill https://ieeexplore.ieee.org/document/4669309

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Hierarchical calculation of malicious faults for evaluating the fault-toleranceUbar, Raimund-Johannes; Devadze, Sergei; Jenihhin, Maksim; Raik, Jaan; Jervan, Gert; Ellervee, PeeterProceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China2008 / p. 222-227 : ill https://ieeexplore.ieee.org/document/4459544

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40

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Hierarchical defect-oriented fault simulation for digital circuitsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings2000 / p. 69-74 : ill https://ieeexplore.ieee.org/document/873781

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41

artikkel kogumikus

Hierarchical identification of untestable faults in sequential circuitsRaik, Jaan; Ubar, Raimund-Johannes; Krivenko, Anna; Kruus, Margus10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 668-671 : ill http://dx.doi.org/10.1109/DSD.2007.4341539

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42

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High-level decision diagram based fault models for targeting FSMsRaik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 353-358 : ill http://dx.doi.org/10.1109/DSD.2006.60

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43

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A hybrid BIST architecture and its optimization for SoC testingJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Kruus, HelenaProceedings of the 3rd International Symposium on Quality Electronic Design : ISQED 2002, March 18-21, 2002, San Jose, California2002 / p. 273-279 : ill https://ieeexplore.ieee.org/document/996750

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Hybrid BIST optimization for core-based systems with test pattern broadcastingUbar, Raimund-Johannes; Jenihhin, Maksim; Jervan, Gert; Peng, ZeboDELTA 2004 : second IEEE International Workshop on Electronic Design, Test and Applications : 28-30 January 2004, Perth, Australia : proceedings2004 / p. 3-8 : ill https://ieeexplore.ieee.org/document/1409808

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Hybrid BIST optimization using reseeding and test set compactionJervan, Gert; Orasson, Elmet; Kruus, Helena; Ubar, Raimund-Johannes10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 596-603 : ill http://dx.doi.org/10.1109/DSD.2007.4341529

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Hybrid BIST time minimization for core-based systems with STUMPS architectureJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, Maksim18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 November 2003, Boston, Massachusetts : proceedings2003 / p. 225-232 : ill https://ieeexplore.ieee.org/document/1250116

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IaaS platforms : how secure are they?Astrova, Irina; Koschel, Arne; Henke, Mats LennartIEEE 30th International Conference on Advanced Information Networking and Applications Workshops : WAINA 2016 : 23-25 March 2016, Crans-Montana, Switzerland : proceedings2016 / p. 843-848 : ill https://doi.org/10.1109/WAINA.2016.22

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48

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Implementation of address-based data sorting on different FPGA platformsSudnitsõn, Aleksander; Mihhailov, Dmitri; Sklyarov, Valery; Skliarova, IouliiaProceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 20122012 / p. 38-41 https://www.semanticscholar.org/paper/Implementation-of-address-based-data-sorting-on-Mihhailov-Sudnitson/e9294d725ab92a2d2a51ccb44fc47e80798bc071

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49

artikkel kogumikus

Improved fault emulation for synchronous sequential circuitsRaik, Jaan; Ellervee, Peeter; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 72-78 : ill

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Information processing for mass-customized clothing productionElbrecht, Pirjo; Palm, Knut-Joosep2016 IEEE Tenth International Conference on Semantic Computing : 3-5 February 2016, Laguna Hills, California : proceedings2016 / p. 362-365 : ill https://doi.org/10.1109/ICSC.2016.51

artikkel kogumikus

IEEE Computer Society (kirjastus/väljaandja)

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