Otsing - TalTech teadusportaal

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151

raamat

Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 http://www.ester.ee/record=b2777270*est

raamat

152

artikkel kogumikus

PSL assertion checkers synthesis with ASM based HLS tool ABELITEJenihhin, Maksim; Baranov, Samary; Raik, Jaan; Tihhomirov, ValentinLATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador2012 / [6 p.] : ill https://ieeexplore.ieee.org/document/6261251

artikkel kogumikus

153

artikkel ajakirjas

PSL assertion checking using temporally extended high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2009 / 6, p. 289-300 : ill https://pld.ttu.ee/home/maksim/phd_papers/%5B11%5D%20latw%2708.pdf

artikkel ajakirjas

154

artikkel kogumikus

PSL assertion checking with temporally extended high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 49-54 : ill https://pld.ttu.ee/~maksim/phd_papers/%5B11%5D%20latw%2708.pdf

artikkel kogumikus

155

artikkel kogumikus

PSL assertions based verification with HLDD toolsJenihhin, MaksimInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 17-20 : ill

artikkel kogumikus

156

artikkel kogumikus

QoSinNoC: analysis of QoS-aware NoC architectures for mixed-criticality applicationsAvramenko, Serhiy; Azad, Siavoosh Payandeh; Niazmand, Behrad; Raik, Jaan; Jenihhin, Maksim21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 67-72 : ill https://doi.org/10.1109/DDECS.2018.00-10

artikkel kogumikus

157

artikkel kogumikus

Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPGPalermo, N.; Tihhomirov, Valentin; Copetti, Thiago; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102405

artikkel kogumikus

158

artikkel kogumikus EST / artikkel kogumikus ENG

Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programsPellerey, Francesco; Jenihhin, Maksim; Squillero, Giovanni; Raik, Jaan; Sonza Reorda, Matteo; Tihhomirov, Valentin; Ubar, Raimund-Johannes2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan2016 / p. 304-309 : ill https://doi.org/10.1109/ATS.2016.57 Conference Proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

159

artikkel kogumikus

Reliability continuum and academic EDAJenihhin, Maksim2nd International Training School on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN ISTS 2015) : Prague, Czech Republic, July 13-15, 20152015 / [1] p

artikkel kogumikus

160

artikkel ajakirjas EST / artikkel ajakirjas ENG

Reliability-Aware Hyperparameter Optimization for ANN-to-SNN ConversionSharifian, Saeed; Taheri, Mahdi; Rashtchi, Vahid; Azarpeyvand, Ali; Herglotz, Christian; Jenihhin, MaksimWorks in Progress in Embedded Computing Journal WiPiEC Journal2025 / p. 1-7 https://doi.org/10.64552/wipiec.v11i1.85 https://www.wipiec.digitalheritage.me/index.php/wipiecjournal/article/view/85

artikkel ajakirjas EST / artikkel ajakirjas ENG

161

artikkel ajakirjas EST / artikkel ajakirjas ENG

Reliability-critical computation offloading in UAV swarmsRahbari, Dadmehr; Ahmed, Foisal; Jenihhin, Maksim; Alam, Muhammad Mahtab; Le Moullec, YannickIEEE Systems Journal2024 / p. 1871-1882 https://doi.org/10.1109/JSYST.2024.3432449 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

162

artikkel kogumikus

Representing gate-level SET faults by multiple SEU faults on RT-levelBagbaba, Ahmet Cagri; Jenihhin, Maksim; Ubar, Raimund-Johannes; Sauer, Christian2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings2020 / art. 19889351, 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159715

artikkel kogumikus

Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

163

artikkel kogumikus

RESCUE : cross-sectoral PhD training concept for interdependent reliability, security and qualityVierhaus, Heinrich Theodor; Jenihhin, Maksim; Sonza Reorda, Matteo2018 12th European Workshop on Microelectronics Education (EWME) : September 24–26, 20182018 / p. 45-50 : ill https://doi.org/10.1109/EWME.2018.8629465

artikkel kogumikus

164

artikkel kogumikus

A rescue demonstrator for interdependent aspects of reliability, security and quality towards a complete EDA flowRaik, Jaan; Jenihhin, Maksim2020 Design, Automation & Test in Europe Conference &Exhibition (DATE) : proceedings2020 / p. 58 https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=9116424

artikkel kogumikus

165

artikkel kogumikus

RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems designGürsoy, Cemil Cem; Cardoso Medeiros, Guilherme; Chen, Juanho; Balakrishnan, Aneesh; Lai, Xinhui; Bagbaba, Ahmet Cagri; Raik, Jaan; Jenihhin, MaksimDATE 20192019 / 1 p. : ill https://doi.org/10.5281/zenodo.3362529 https://past.date-conference.com/

artikkel kogumikus

166

artikkel kogumikus

RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systemsJenihhin, Maksim; Raik, Jaan2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings2020 / art. 19690741 , 6 p https://doi.org/10.23919/DATE48585.2020.9116558

artikkel kogumikus

167

artikkel kogumikus EST / artikkel kogumikus ENG

RL-agent-based early-exit DNN architecture search frameworkTaheri, Mahdi; Patne, Parth; Cherezova, Natalia; Mahani, Ali; Herglotz, Christian; Jenihhin, Maksim2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2025), Lyon, France, 5-7 May 20252025 / p. 145-148 https://doi.org/10.1109/DDECS63720.2025.11006795 Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

168

artikkel kogumikus

SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN AcceleratorsTaheri, Mahdi; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim; Pappalardo, Salvatore; Jimenez, Paul; Deveautour, Bastien; Bosio, Alberto2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) : 03-05 April 2024, Kielce, Poland2024 / p. 19–24 : ill https://doi.org/10.1109/DDECS60919.2024.10508925 Article at Scopus Article at WOS

artikkel kogumikus

Seotud publikatsioonid 1

Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine

169

artikkel kogumikus

A scalable technique to identify true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, JaanProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 152-157 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

artikkel kogumikus

170

artikkel kogumikus

Sequential circuits BIST synthesis from signal specificationsRaik, Jaan; Jenihhin, Maksim; Adelbert, RainProceedings 23rd NORCHIP Conference : Oulu, Finland, 21-22 November 20052005 / p. 196-199 : ill https://ieeexplore.ieee.org/document/1597023

artikkel kogumikus

171

artikkel kogumikus EST / artikkel kogumikus ENG

SHIELD: PSO-based hardware trojan detection for efficient and low-cost defenseHosseini, Mostafa; Azarpeyvand, Ali; Taheri, Mahdi; Ghasempouri, Tara; Jenihhin, MaksimProceedings 2025 IEEE 31st International Symposium on on Line Testing and Robust System Design (IOLTS)2025 / 4 p. : ill https://doi.org/10.1109/IOLTS65288.2025.11116879 Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

172

dissertatsioon

Simulation-based hardware verification with high-level decision diagrams = Simuleerimisel põhinev riistvara verifitseerimine kõrgtaseme otsustusdiagrammidelJenihhin, Maksim2008 https://www.ester.ee/record=b2431332*est

dissertatsioon

173

artikkel kogumikus

Simulation-based verification with APRICOT framework using high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesEast-West Design & Test Symposium : Moscow, September 18-21, 20092009 / p. 13-16 : ill

artikkel kogumikus

174

artikkel kogumikus

Software-based mitigation for memory address decoder agingKraak, D. H. P.; Gürsoy, Cemil Cem; Jenihhin, Maksim; Raik, JaanLATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 20192019 / 6 p. : ill https://doi.org/10.1109/LATW.2019.8704595

artikkel kogumikus

175

artikkel kogumikus

Software-level TMR approach for on-board data processing in space applicationsJanson, Karl; Treudler, Carl Johann; Hollstein, Thomas; Raik, Jaan; Jenihhin, Maksim; Fey, Goerschwin21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 147-152 : ill https://doi.org/10.1109/DDECS.2018.00033

artikkel kogumikus

Jenihhin, Maksim (autor)

teaviku laadid

autor 17

tema kohta 9

CV 9