Otsing - TalTech teadusportaal

kuva

reasta

176

artikkel kogumikus EST / artikkel kogumikus ENG

Special session : approximation and fault resiliency of DNN acceleratorsAhmadilivani, Mohammad Hasan; Barbareschi, Mario; Barone, Salvatore; Bosio, Alberto; Daneshtalab, Masoud; Torca, Salvatore Della; Gavarini, Gabriele; Jenihhin, Maksim; Raik, Jaan; Taheri, Mahdi2023 IEEE 41st VLSI Test Symposium (VTS) : proceedings2023 / 10 p. : ill https://doi.org/10.1109/VTS56346.2023.10140043 Conference proceeding at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

Seotud publikatsioonid 1

Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine

177

artikkel kogumikus EST / artikkel kogumikus ENG

Special session : AutoSoC - a suite of open-source automotive SoC benchmarksSilva, Felipe Augusto da; Bagbaba, Ahmet Cagri; Ruospo, Annachiara; Jenihhin, Maksim2020 IEEE 38th VLSI TEST SYMPOSIUM (VTS) - VTS 2020 : proceedings2020 / 9 p. : ill https://doi.org/10.1109/VTS48691.2020.9107599 Conference Proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

178

artikkel kogumikus EST / artikkel kogumikus ENG

Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCsSelg, Hardi; Shibin, Konstantin; Tsertov, Anton; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2024 https://doi.org/10.1109/DFT63277.2024.10753541 Conference proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

179

artikkel kogumikus EST / artikkel kogumikus ENG

Special session: reliability assessment recipes for DNN acceleratorsAhmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Dos Santos, Fernando Fernandes; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Sierra, Robert Limas; Raik, Jaan; Taheri, Mahdi42nd IEEE VLSI Test Symposium, VTS 2024 : proceedings2024 / 11 p. : ill https://doi.org/10.1109/VTS60656.2024.10538707 Conference proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

Seotud publikatsioonid 1

Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine

180

artikkel kogumikus

SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, Maksim2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 223-228 : ill

artikkel kogumikus

181

raamat

Structural decision diagrams in digital test : theory and applicationsUbar, Raimund-Johannes; Raik, Jaan; Jenihhin, Maksim; Jutman, Artur2024 https://doi.org/10.1007/978-3-031-44734-1 https://www.ester.ee/record=b5734441*est

raamat

182

artikkel ajakirjas EST / artikkel ajakirjas ENG

A survey on UAV computing platforms : a hardware reliability perspectiveAhmed, Foisal; Jenihhin, MaksimSensors2022 / art. 6286 https://doi.org/10.3390/s22166286 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

183

dissertatsioon

A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseksBalakrishnan, Aneesh2022 https://doi.org/10.23658/taltech.11/2022 https://digikogu.taltech.ee/et/Item/a594d3ec-0e6b-4a78-819a-fe1f47992612

dissertatsioon

Seotud publikatsioonid 9

184

artikkel ajakirjas EST / artikkel ajakirjas ENG

A systematic literature review on hardware reliability assessment methods for deep neural networksAhmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, MaksimACM Computing Surveys2024 / art. 141, 39 p. : ill https://doi.org/10.1145/3638242 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

Seotud publikatsioonid 2

185

artikkel kogumikus

SystemC-based loose models : RTL abstraction for design understandingAbrar, Syed Saif; Jenihhin, Maksim; Raik, JaanWorkshop on Design Automation for Understanding Hardware Designs DUHDe 2015 : Grenoble, March 13, 20152015 / p. 1-6

artikkel kogumikus

186

artikkel kogumikus

SystemC-based loose models for simulation speed-up by abstraction of RTL IP coresAbrar, Syed Saif; Jenihhin, Maksim; Raik, Jaan2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 71-74 : ill http://dx.doi.org/10.1109/DDECS.2015.39

artikkel kogumikus

187

artikkel kogumikus

zamiaCAD : open source platform for advanced hardware designTšepurov, Anton; Jenihhin, Maksim; Raik, JaanDATE 2011 University Booth : Design Automation and Test in Europe : Grenoble, France, March 14-18, 20112011 / [2] p.: ill

artikkel kogumikus

188

artikkel kogumikus

zamiaCAD : shall we dance?Jenihhin, MaksimOpen Source Tools for Verification : DVClub 14 January 20132013 / 1 p

artikkel kogumikus

189

artikkel kogumikus

zamiaCAD : understand, develop and debug hardware designsJenihhin, Maksim; Tihhomirov, Valentin; Saif Abrar, Syed; Raik, Jaan; Bartsch, GünterDUHDe : 1st Workshop on Design Automation for Understanding Hardware Designs : March 28, 2014 : Friday Workshop at DATE 2014, Dresden, Germany2014 / p. 1-6

artikkel kogumikus

190

artikkel ajalehes

TalTech panustab kosmosevaldkonda kiipide, päikesepaneelide ja satelliitidegaNormak, Liisu KirkeTrialoog2025 https://trialoog.taltech.ee/taltech-panustab-kosmosevaldkonda-kiipide-paikesepaneelide-ja-satelliitidega/

artikkel ajalehes

191

artikkel kogumikus

Techniques for reliability in Edge-AI chipsJenihhin, Maksim; Taheri, Mahdi; Cherezova, Natalia; Ahmadilivani, Mohammad Hasan; Rafiq, Ahsan; Raik, Jaan; Daneshtalab, MasoudIEEE Top Picks in Test and Reliability Workshop at the International Test Conference 2024, San Diego, US, November 7-8, 20242024 / p. 1-2 https://people.rennes.inria.fr/Marcello.Traiola/TPTR2024/event_program.html

artikkel kogumikus

192

artikkel kogumikus

Temporally extended high-level decision diagrams for PSL assertions simulationJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesProceedings : Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May 2008, Verbania, Italy2008 / p. 61-68 : ill https://ieeexplore.ieee.org/document/4556029

artikkel kogumikus

193

artikkel kogumikus

Test time minimization for hybrid BIST of core-based systemsJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, Maksim12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China2003 / p. 318-325 : ill https://link.springer.com/article/10.1007/s11390-006-0907-x

artikkel kogumikus

194

artikkel ajakirjas

Test time minimization for hybrid BIST of core-based systemsJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, MaksimJournal of computer science and technology2006 / 6, p. 907-912 : ill https://link.springer.com/article/10.1007/s11390-006-0907-x

artikkel ajakirjas

195

artikkel kogumikus

Test time minimization for hybrid BIST with test pattern broadcastingUbar, Raimund-Johannes; Jenihhin, Maksim; Jervan, Gert; Peng, ZeboIEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings2003 / p. 112-116 : ill https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf

artikkel kogumikus

196

artikkel kogumikus

The validation of graph model-based, gate level low-dimensional feature data for machine learning applicationsBalakrishnan, Aneesh; Lange, Thomas; Glorieux, Maximilien; Alexandrescu, Dan; Jenihhin, Maksim2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore2019 / 7 p https://doi.org/10.1109/NORCHIP.2019.8906974

artikkel kogumikus

Seotud publikatsioonid 1

A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks

197

artikkel kogumikus

Timing-critical path analysis with structurally synthesized BDDsUbar, Raimund-Johannes; Jürimägi, Lembit; Jenihhin, Maksim; Raik, Jaan; Olugbenga, Niyi-Leigh; Viies, Vladimir2018 7th Mediterranean Conference on Embedded Computing (MECO)2018 / 6 p. : ill https://doi.org/10.1109/MECO.2018.8406051

artikkel kogumikus

198

artikkel kogumikus

Towards multidimensional verification : where functional meets non-functionalJenihhin, Maksim; Lai, Xinhui; Ghasempouri, Tara; Raik, Jaan2018 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC) : 30-31 October 2018, Tallinn, Estonia : proceedings in IEEE Xplore2018 / 7 p. : ill https://doi.org/10.1109/NORCHIP.2018.8573495

artikkel kogumikus

Seotud publikatsioonid 1

Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisid

199

artikkel kogumikus

True path tracing in structurally synthesized BDDs for testability analysis of digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Oyeniran, Adeboye Stephen; Jenihhin, MaksimEuromicro Conference on Digital System Design : DSD 2019 : 28 - 30 August 2019 Kallithea, Chalkidiki, Greece : proceedings2019 / p. 492-499 : ill https://doi.org/10.1109/DSD.2019.00077

artikkel kogumikus

200

artikkel kogumikus

TTBist: a DfT tool for enhancing functional test for SoCHermann, K.; Raik, Jaan; Jenihhin, MaksimBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 191-194 : ill

artikkel kogumikus

Jenihhin, Maksim (autor)

teaviku laadid

autor 17

tema kohta 9

CV 9