Otsing - TalTech teadusportaal

kuva

reasta

101

artikkel kogumikus

Calculation of the diagnosibility of digital circuits without using fault modelsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 159-162 : ill

artikkel kogumikus

102

artikkel ajakirjas

Canonical representations of high-level decision diagramsKarputkin, Anton; Ubar, Raimund-Johannes; Raik, Jaan; Tombak, MatiEstonian journal of engineering2010 / 1, p. 39-55 : ill

artikkel ajakirjas

103

artikkel ajakirjas

Case study in testing digital systemsUbar, Raimund-JohannesBaltic electronics1995 / 1, p. 24-27

artikkel ajakirjas

104

artikkel ajakirjas

CEBE - Centre for Integrated Electronic Systems and Biomedical EngineeringFridolin, Ivo; Min, Mart; Ubar, Raimund-JohannesThe parliament magazine's research review : European research & innovation2009 / p. 35

artikkel ajakirjas

105

artikkel ajakirjas

Centre for Integrated Electronic Systems and Biomedical Engineering - CEBEUbar, Raimund-JohannesEstonian journal of engineering2010 / 1, p. 7-10 : ill

artikkel ajakirjas

106

artikkel kogumikus

Challenges for future system-on-chip designHollstein, Thomas; Peng, Zebo; Ubar, Raimund-Johannes; Glesner, ManfredCircuit Paradigm in the 21st Century : ECCTD '01 : proceedings of the 15th European Conference on Circuit Theory and Design : Helsinki University of Technology, Finland, 28th-31st August 2001. Vol 32001 / p. 173-176

artikkel kogumikus

107

artikkel kogumikus

CMOS defects analysis using DefSim measurement environmentPleskacz, Witold A.; Borejko, Tomasz; Walkanis, A.; Stopjakova, Viera; Jutman, Artur; Ubar, Raimund-JohannesInformal Digest of Papers : Eleventh IEEE European Test Symposium : ETS 2006 : 21-24 May 2006, Southampton, United Kingdom2006 / p. 241-246 : ill

artikkel kogumikus

108

artikkel kogumikus

Code coverage analysis for concurrent programming languages using high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesProceedings of the 12th European Workshop on Dependable Computing : EWDC 2009 : Toulouse, France, May 14-15, 20092009 / [4] p. : ill https://hal.archives-ouvertes.fr/hal-00381559

artikkel kogumikus

109

artikkel kogumikus

Code coverage analysis using high-level decision diagrams [Electronic resource]Raik, Jaan; Reinsalu, Uljana; Ubar, Raimund-Johannes; Jenihhin, Maksim; Ellervee, Peeter2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 20082008 / p. 201-207 : ill. [CD-ROM] https://ieeexplore.ieee.org/document/4538786

artikkel kogumikus

110

artikkel kogumikus

Collaborative distributed computing in the field of digital electronics testingIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesBalanced Automation Systems for Future Manufacturing Networks : 9th IFIP WG 5.5 International Conference : BASYS 2010 : Valencia, Spain, July 21-23, 2010 : proceedings2010 / p. 145-152

artikkel kogumikus

111

artikkel kogumikus

Collaborative distributed fault simulation for digital electronic circuitsIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesIntelligent Distributed Computing IV : proceedings of the 4th International Symposium on Intelligent Distributed Computing - IDC 2010 : Tangier, Morocco, September 20102010 / p. 67-76

artikkel kogumikus

112

artikkel kogumikus

Combinational fault simulation in sequential circuitsUbar, Raimund-Johannes; Kõusaar, Jaak; Gorev, Maksim; Devadze, Sergei2015 IEEE International Symposium on Circuits and Systems : 24-27 May 2015, Lisboa, Portugal : [proceedings]2015 / p. 2876-2879 : ill

artikkel kogumikus

113

artikkel kogumikus

Combined fault-model free cause-effect and effect-cause fault diagnosis in block-level digital networksUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanASQED'09 : 1st Asia Symposium on Quality Electronic Design : Kuala Lumpur, Malaisia, July 15-16, 20092009 / p. 385-390 https://ieeexplore.ieee.org/document/5206232

artikkel kogumikus

114

artikkel kogumikus

Combined pseudo-exhaustive and deterministic testing of array multipliersOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 21st edition, 24th-26th May, Cluj-Napoca, Romania : proceedings2018 / 6 p. : ill https://doi.org/10.1109/AQTR.2018.8402708

artikkel kogumikus

115

artikkel kogumikus

Combining dynamic slicing and mutation operators for ESL correctionRepinski, Urmas; Hantson, Hanno; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th-June 1st, 2012, Annecy, France2012 / [6] p. : ill https://ieeexplore.ieee.org/document/6233020

artikkel kogumikus

116

artikkel ajakirjas

Combining functional and structural approaches in test generation for digital systemsUbar, Raimund-JohannesMicroelectronics reliability1998 / 3, p. 317-329 : ill

artikkel ajakirjas

117

artikkel kogumikus

Combining learning, training and research in laboratory course for design and testUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 221-224 : ill https://www.researchgate.net/publication/242397131_Combining_Learning_Training_and_Research_in_Laboratory_Course_for_Design_and_Test

artikkel kogumikus

118

artikkel kogumikus

Combining symbolic techniques with topological approach in test generationUbar, Raimund-JohannesProceedings of the 3rd Workshop on Mixed Design of Integrated Circuits and Systems, Lodz, May 19961996 / p. 377-382

artikkel kogumikus

119

artikkel kogumikus

Compaction of decision diagrams for describing multi-process VHDL descriptionsLeveugle, R.; Saucier, Gabriele; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 195-198: ill

artikkel kogumikus

120

artikkel kogumikus

Comparative analysis of sequential circuit test generation approachesRaik, Jaan; Krivenko, Anna; Ubar, Raimund-JohannesBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 225-228 : ill

artikkel kogumikus

121

artikkel kogumikus

Comparison of genetic and random techniques for test pattern generationIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 163-166: ill

artikkel kogumikus

122

artikkel kogumikus

Comparison of two approaches to improve functional BIST fault coverageKostin, Sergei; Ubar, Raimund-Johannes; Gorev, Maksim; Mägi, GunnarBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 105-108 : ill

artikkel kogumikus

123

artikkel kogumikus

Complex delay fault reasoning with sequential 7-valued algebraKõusaar, Jaak; Ubar, Raimund-Johannes; Aleksejev, Igor2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102403

artikkel kogumikus

124

artikkel kogumikus

Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]Jürimägi, Lembit; Ubar, Raimund-JohannesBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p. : ill https://doi.org/10.1109/BEC.2018.8600967

artikkel kogumikus

125

artikkel kogumikus

Constraint-based hierarchical untestability identification for synchronous sequential circuitsRaik, Jaan; Rannaste, Anna; Jenihhin, Maksim; Viilukas, Taavi; Ubar, Raimund-Johannes; Fujiwara, HideoSixteenth IEEE European Test Symposium : 23-27 May 2011, Trondheim2011 / p. 147-152

artikkel kogumikus

Ubar, Raimund-Johannes (TTÜ autor)

teaviku laadid

CV 61

autor 57

tema kohta 28

märksõna 1