Otsing - TalTech teadusportaal

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51

artikkel kogumikus

Arvutite diagnostika uurimissuuna kujunemisest EestisUbar, Raimund-JohannesKõrgema tehnilise hariduse ja tehnilise mõtte areng Eestis1988 / lk. 110-127

artikkel kogumikus

52

artikkel kogumikus

Assembling low-level tests to high-level symbolic test framesJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings [of the] 15th NORCHIP Conference, Tallinn, 10-11 November 19971997 / p. 275-280: ill

artikkel kogumikus

53

artikkel kogumikus

Assertion checking with PSL and high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesDigest of papers IEEE 8th Workshop on RTL and High Level Testing : WRTLT'07 : October 12-13, 2007, Beijing, China2007 / p. 105-110 : ill https://pld.ttu.ee/~maksim/phd_papers/%5B12%5D%20wrtlt%2707.pdf

artikkel kogumikus

54

artikkel kogumikus

Assessment of diagnostic test for automated bug localizationTihhomirov, Valentin; Tšepurov, Anton; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesLATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]2013 / [6] p. : ill

artikkel kogumikus

55

artikkel kogumikus

Assessment of student's design results in e-learning-scenarios [Electronic resource]Wuttke, Heinz-Dietrich; Ubar, Raimund-Johannes; Henke, Karsten; Jutman, Artur8th International Conference on Technology Based Higher Education and Training : 10th to 13th July, 2007, KKR Hotel Kumamoto, Kumamoto, Japan : [proceedings]2007 / [6] p. [CD-ROM]

artikkel kogumikus

56

artikkel ajalehes

Assotsiatsioon EUROCHIP avas ukse Tallinna TehnikaülikoolileUbar, Raimund-JohannesTehnikaülikool1993 / 17. märts, lk. 1-2

artikkel ajalehes

57

artikkel kogumikus

Asynchronous e-learning resources for hardware design issuesJutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of the International Conference on Computer Systems and Technologies (e-learning) : CompSysTech'04 : Rousse, Bulgaria, 17-18 June2004 / p. IV.11-1 - IV.11-6 : ill https://www.researchgate.net/publication/234797327_Asynchronous_e-learning_resources_for_hardware_design_issues

artikkel kogumikus

58

artikkel kogumikus

At-speed functional built-in self-test methodology for processors [Electronic resource]Ubar, Raimund-Johannes; Indus, Viljar; Kalmend, OliverProceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka2012 / p. 168-172 : ill [CD-ROM]

artikkel kogumikus

59

artikkel kogumikus

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

artikkel kogumikus

60

dissertatsioon

At-speed testing and test quality evaluation for high-performance pipelined systems Töökiirusel testimine ja testi kvaliteedi hindamine kõrgjõudlus-konveierarhitektuuriga süsteemideleGorev, Maksim2015 https://digi.lib.ttu.ee/i/?3953

dissertatsioon

61

artikkel ajakirjas

Aufstellung von Testfolgen für logische SchaltungenPlakk, Mari; Ubar, Raimund-JohannesInternationales wissenschaftliches Kolloquium1979 / S. 93-96 https://www.ester.ee/record=b2936968*est

artikkel ajakirjas

62

artikkel kogumikus

Aukartus teaduse eesUbar, Raimund-JohannesRaimund-Johannes Ubar. Bibliograafia2016 / lk. 47-56

artikkel kogumikus

63

artikkel ajalehes

Aukartus teaduse ees : [essee]. Nikolai Alumäe medalUbar, Raimund-JohannesSirp2014 / lk. 3-5 : fot https://www.sirp.ee/s1-artiklid/c21-teadus/aukartus-teaduse-ees/

artikkel ajalehes

64

artikkel kogumikus

Automated correction of design errors by edge redirection on high-level decision diagramsKarputkin, Anton; Ubar, Raimund-Johannes; Tombak, Mati; Raik, Jaan13th International Symposium on Quality Electronic Design (ISQED), 20122012 / p. 686-693 : ill https://ieeexplore.ieee.org/document/6113980

artikkel kogumikus

65

artikkel ajakirjas

Automated design error debug using high-level decision diagrams and mutation operatorsRaik, Jaan; Repinski, Urmas; Tšepurov, Anton; Hantson, Hanno; Ubar, Raimund-Johannes; Jenihhin, MaksimMicroprocessors and microsystems2013 / p. 505-513 : ill

artikkel ajakirjas

66

artikkel ajakirjas

Automated design error localization in RTL designsJenihhin, Maksim; Tšepurov, Anton; Tihhomirov, Valentin; Raik, Jaan; Hantson, Hanno; Ubar, Raimund-Johannes; Bartsch, Günter; Meza Escobar, Jorge Hernan; Wuttke, Heinz-DietrichIEEE design & test of computers2014 / p. 83-92 : ill http://dx.doi.org/10.1109/MDAT.2013.2271420

artikkel ajakirjas

67

artikkel ajakirjas

Automated software-based in-field self-test program synthesisJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonInternational journal of microelectronics and computer science2017 / p. 57-64 : ill

artikkel ajakirjas

68

artikkel kogumikus

Automated software-based self-test generation for microprocessorsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonProceedings of the 24st International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2017 : Bydgoszcz, Poland, June 19-21, 20142017 / p. 453-458 : ill https://doi.org/10.23919/MIXDES.2017.8005252

artikkel kogumikus

69

artikkel kogumikus

Automated test bench generation for high-level synthesis flow ABELITEViilukas, Taavi; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Baranov, SamaryProceedings of IEEE East-West Design & Test Symposium (EWDTS'2011) : Sevastopol, Ukraine, September 9-12, 20112011 / p. 13-16 : ill https://ieeexplore.ieee.org/document/6116601

artikkel kogumikus

70

artikkel kogumikus

Automated test program synthesis for digital systems with high-level decision diagramsUbar, Raimund-JohannesProc. of 7th International Conference2005 / p. 171-180

artikkel kogumikus

71

artikkel kogumikus

Automatic diagnosis of simple design errorsUbar, Raimund-Johannes; Borrione, DominiqueTIMA annual report 19981999 / p. 97-98

artikkel kogumikus

72

artikkel kogumikus

Automatic diagnosis of simple design errorsUbar, Raimund-Johannes; Borrione, DominiqueTechniques of Informatics and Microelectronics for Computer Architecture1999 / p. 91

artikkel kogumikus

73

artikkel kogumikus

Automatic generation of EFSMs and HLDDs for functional ATPGTšepurov, Anton; Guglielmo, Giuseppe di; Raik, Jaan; Ubar, Raimund-Johannes; Viilukas, TaaviBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 143-146 : ill

artikkel kogumikus

74

artikkel kogumikus

Automatic SoC level test path synthesis based on partial functional modelsTšertov, Anton; Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei2011 Asian Test Symposium (ATS) : New Delhi, India2011 / p. 532-538 https://ieeexplore.ieee.org/document/6114730

artikkel kogumikus

75

artikkel kogumikus

Automatic test generation system for VLSIJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 19971997 / p. 255-258

artikkel kogumikus

Ubar, Raimund-Johannes (TTÜ autor)

teaviku laadid

CV 61

autor 57

tema kohta 28

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