Otsing - TalTech teadusportaal

kuva

reasta

101

artikkel kogumikus

Hybrid functional BIST for digital systemsMazurova, Natalja; Smahtina, Julia; Ubar, Raimund-JohannesBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 205-208 : ill

artikkel kogumikus

102

artikkel kogumikus

HyFBIST : hybrid functional built-in self-test in microprogrammed data-paths of digital systemsUbar, Raimund-Johannes; Mazurova, Natalja; Smahtina, Julia; Orasson, Elmet; Raik, JaanProceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 20042004 / p. 497-502 : ill

artikkel kogumikus

103

artikkel ajakirjas EST / artikkel ajakirjas ENG

Implementation of Digital Twins for electrical energy conversion systems in selected case studiesRassõlkin, Anton; Orosz, Tamas; Demidova, Galina; Kuts, Vladimir; Rjabtšikov, Viktor; Vaimann, Toomas; Kallaste, AntsProceedings of the Estonian Academy of Sciences2021 / p. 19-39 : ill https://doi.org/10.3176/proc.2021.1.03 https://doi.org/wp-content/plugins/kirj/pub/proc-1-2021-19-39_20210201183802.pdf Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

104

artikkel kogumikus

An improved estimation methodology for hybrid BIST cost calculationJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Korelina, OlgaProceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 20042004 / p. 297-300 : ill https://ieeexplore.ieee.org/document/1423882

artikkel kogumikus

105

artikkel kogumikus

An improved estimation technique for hybrid BIST test set generationJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Korelina, OlgaDDECS : 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 13-16, 2005, Sopron, Hungary : proceedings2005 / p. 182-185 : ill https://www.ida.liu.se/labs/eslab/publications/pap/db/ddecs05.pdf

artikkel kogumikus

106

artikkel kogumikus

Improved VHDL input for high-level synthesis tool xTractorEllervee, Peeter; Ivask, Eero; Kruus, MargusBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 87-90 : ill

artikkel kogumikus

107

artikkel ajakirjas

Insener projekteerib usaldust : [ka TTÜ arvutitehnika instituudi töödest]Ubar, Raimund-JohannesArvutimaailm2011 / 7/8, lk. 8-9 : ill https://artiklid.elnet.ee/record=b2423013*est

artikkel ajakirjas

108

artikkel kogumikus

Integration of high-level synthesis to the courses on reconfigurable digital systemsSklyarov, Valery; Skliarova, Iouliia; Sudnitsõn, Aleksander; Kruus, Margus2015 38th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) : May 25-29, 2015, Opatija, Croatia : proceedings2015 / p. 166-171 : ill http://dx.doi.org/10.1109/MIPRO.2015.7160258

artikkel kogumikus

109

artikkel kogumikus

Internet-based collaborative test generation with MOSCITO [Electronic resource]Schneider, Andre; Ivask, Eero; Miklos, P.; Raik, Jaan; Diener, Karl-Heinz; Ubar, Raimund-Johannes; Cibakova, Tatiana; Gramatova, ElenaSIGDA publications on CD-ROM : DATE'02 : Design, Automation and Test in Europe, Paris, France, March 4-8, 20022002 / [6] p. [CD-ROM] https://www.cecs.uci.edu/~papers/date07/PAPERS/2002/DATE02/PDFFILES/02E_2.PDF

artikkel kogumikus

110

artikkel kogumikus

Internet-based software for teaching test of digital circuitsUbar, Raimund-Johannes; Orasson, Elmet; Wuttke, Heinz-Dietrich23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 659-662 : ill https://ieeexplore.ieee.org/document/1003344

artikkel kogumikus

111

artikkel kogumikus

Internet-based software for teaching test of digital circuitsUbar, Raimund-Johannes; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Evartson, Teet; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 4th European Workshop on Microelectronics Education : EWME 2002, Spain, May 23-24, 20022002 / p. 317-320 : ill https://ieeexplore.ieee.org/document/1003344

artikkel kogumikus

112

artikkel kogumikus

Java applet for self-learning of digital test issues [Electronic resource]Ubar, Raimund-Johannes; Orasson, Elmet; Evartson, Teet13th EAEEIE Annual Conference, 8th-10th April, 2002, York, England2002 / [4] p. [CD-ROM]

artikkel kogumikus

113

artikkel kogumikus

Java applets support for an asynchronous-mode learning of digital design and testJutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichITHET 2003 proceedings : 4th International Conference on Information Technology Based Higher Education and Training : July 7-9, 2003, Marrakech, Morocco2003 / p. 397-401 : ill https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=92f0b0e5011a2192d5a1b98baa751cb8cd2f7ff3

artikkel kogumikus

114

artikkel kogumikus

Java technology based training system for teaching digital design and testDevadze, Sergei; Jutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 283-286 : ill

artikkel kogumikus

115

raamat

Kiiruse mõõtmise mobiilne süsteem : aastal 2009 avaldatud tööde koopiate kogumik. 13Laaneots, Rein2009 https://www.ester.ee/record=b2641827*est

raamat

116

artikkel ajalehes

Kvaliteetsema digiõppe poolePuust, RaidoPostimees2021 / Lk. 14 https://dea.digar.ee/article/postimees/2021/05/13/12.10

artikkel ajalehes

117

artikkel kogumikus

Laboratory course for training "Digital design and test"Ubar, Raimund-Johannes; Tulit, Viljar; Buldas, Ahto; Saarepera, MärtFourth EUROCHIP Workshop on VLSI Design Training, 29 September to 1 October 1993, Toledo : [proceedings]1993 / p. 112-117: ill

artikkel kogumikus

118

artikkel kogumikus

Localization of single-gate design errors in combinational circuits by diagnostic information about stuck-at faultsUbar, Raimund-Johannes; Borrione, DominiqueProceedings of the 2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Szczyrk, Poland, September 2-4, 19981998 / p. 73-79 https://www.researchgate.net/publication/238687832_Localization_of_Single_Gate_Design_Errors_in_Combinational_Circuits_by_Diagnostic_Information_about_Stuck-at_Faults

artikkel kogumikus

119

raamat

Logic and system design of digital systemsBaranov, Samary; Keevallik, Andres2008 https://www.ester.ee/record=b2358322*est

raamat

120

artikkel kogumikus

Mapping faults in hierarchical testing of digital systemsUbar, Raimund-JohannesInternational Conference on Computer, Communication and Control Technologies CCCT'03 and the 9th International Conference on Information Systems, Analysis and Synthesis ISAS'03 : July 31 - August 1-2, Orlando, Florida, USA : proceedings. Volume I, Computing/Information Systems and Technologies2003 / p. 14-19 : ill

artikkel kogumikus

121

artikkel ajalehes

Mehaanika ja tööstustehnika instituudis valmivad elumuutvad lahendused [Võrguväljaanne]Alver, Anne-MariEesti Päevaleht2022 / Lk. 10 Mehaanika ja tööstustehnika instituudis valmivad elumuutvad lahendused

artikkel ajalehes

122

dissertatsioon

Methods for improving the accuracy and efficiency of fault simulation in digital systems = Meetodid digitaalsüsteemide rikete simuleerimise täpsuse ja efektiivsuse tõstmiseksKõusaar, Jaak2019 https://digi.lib.ttu.ee/i/?11667

dissertatsioon

123

artikkel ajalehes

Millest tekkisid parvlaeva Estonia augud? Laevaehituse insener : teeme esimesi katsearvutusiRiik, Marvelohtuleht.ee2023 / Lk. 2 Millest tekkisid parvlaeva Estonia augud? Laevaehituse insener: teeme esimesi katsearvutusi

artikkel ajalehes

124

artikkel kogumikus

Mixed bottom-up/top-down hierarchical test generation for digital systemsUbar, Raimund-JohannesProceedings of the 9th European Workshop on Dependable Computing, Gdansk, Poland, May 14-16, 19981998 / p. 37-40

artikkel kogumikus

125

artikkel kogumikus

Mixed-level defect simulation in data-paths of digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, Marina23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 617-620 : ill https://ieeexplore.ieee.org/document/1003333

artikkel kogumikus

digitaaltehnika (märksõna)

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