Otsing - TalTech teadusportaal

kuva

reasta

126

artikkel kogumikus

Overview about low-lewel and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesProceedings of the Reed-Muller 2011 Workshop : May 25-26, 2011, Tuusula, Finland2011 / p. 1-10 : ill https://scindeks-clanci.ceon.rs/data/pdf/0353-3670/2011/0353-36701103303U.pdf

artikkel kogumikus

127

artikkel kogumikus

Overview of e-learning environment for web-based study of testing and diagnostics of digital systemsJutman, Artur; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 5th European Workshop on Microelectronics Education, held in Lausanne, Switzerland, April 15-16, 20042004 / p. 253-258 : ill https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41

artikkel kogumikus

128

artikkel kogumikus

Overview of e-learning environment for web-based study of testing and diagnostics of digital systemsJutman, Artur; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich5th European Workshop on Microelectronics Education - EWME 2004, Lausanne, 20042004 / p. 173-176 https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41

artikkel kogumikus

129

artikkel kogumikus

Parallel critical path tracing fault simulationUbar, Raimund-Johannes39. Internationales Wissenschaftliches Kolloquium : 27.-30.09.1994. Bd. 1, Vortragsreihen1994 / S. 399-404

artikkel kogumikus

130

artikkel ajakirjas

Parallel fault simulation in digital circuitsAarna, Margit; Raik, Jaan; Ubar, Raimund-JohannesScientific proceedings of Riga Technical University. 7. serija, Telecommunications and electronics2001 / p. 91-94 : ill

artikkel ajakirjas

131

artikkel kogumikus

Parallel fault simulation in digital circuitsAarna, Margit; Raik, Jaan; Ubar, Raimund-JohannesProc. of 42nd International Scientific Conference of Riga Technical University2001 / p. 91-94

artikkel kogumikus

132

artikkel kogumikus

Probabilistic equivalence checking based on high-level decision diagramsKarputkin, Anton; Ubar, Raimund-Johannes; Tombak, Mati; Raik, JaanProceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 / p. 423-428 : ill https://ieeexplore.ieee.org/document/5783130

artikkel kogumikus

133

artikkel kogumikus

PSL assertions based verification with HLDD toolsJenihhin, MaksimInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 17-20 : ill

artikkel kogumikus

134

artikkel kogumikus

Register transfer low power design based on controller decompositionSudnitsõn, AleksanderMIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 22004 / p. 735-738 : ill https://ieeexplore.ieee.org/document/1314937

artikkel kogumikus

135

artikkel kogumikus

Research environment for teaching digital testIvask, Eero; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 468-473 : ill https://pld.ttu.ee/dildis/publications/IWK'2004_res_inv.pdf

artikkel kogumikus

136

artikkel ajakirjas

Research in digital design and test at Tallinn University of TechnologyUbar, Raimund-Johannes; Jervan, Gert; Jutman, Artur; Raik, Jaan; Ellervee, Peeter; Kruus, MargusRadioelectronics & informatics2008 / p. 4-12 : ill http://www.ewdtest.com/ri/%E2%84%96-1-40-january-march-2008/

artikkel ajakirjas

137

artikkel kogumikus

Research on digital system design and test at Tallinn University of TechnologyUbar, Raimund-Johannes; Ellervee, Peeter; Hollstein, Thomas; Jervan, Gert; Jutman, Artur; Kruus, Margus; Raik, JaanResearch in Estonia : present and future2011 / p. 184-205 : ill

artikkel kogumikus

138

raamat

Ringhääling '99 : VI Rahvusvahelise Telekommunikatsioonipäeva konverentsi ettekannete materjalid1999 https://www.ester.ee/record=b1260725*est

raamat

139

raamat

Ringhääling 2003 : X rahvusvahelise telekommunikatsioonipäeva materjalid : [16. mai 2003, Tallinn]2003 http://www.ester.ee/record=b1782571*est

raamat

140

artikkel kogumikus

RT-level test point insertion for sequential circuitsRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings2004 / p. 34-40 : ill https://ieeexplore.ieee.org/document/1428412

artikkel kogumikus

141

artikkel kogumikus

Scalable algorithm for structural fault collapsing in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea2015 / p. 171-176 : ill

artikkel kogumikus

142

artikkel ajakirjas

Second IEEE East-West Design and Test WorkshopHahanov, Vladimir; Ubar, Raimund-JohannesIEEE journal of design & test of computers2004 / p. 594

artikkel ajakirjas

143

dissertatsioon

Selected issues of modeling, verification and testing of digital systemsJutman, Artur2004 https://www.ester.ee/record=b1989760*est

dissertatsioon

144

dissertatsioon

Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemidKostin, Sergei2012 https://www.ester.ee/record=b2757857*est

dissertatsioon

145

artikkel kogumikus

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

artikkel kogumikus

146

artikkel kogumikus

Sequential circuits BIST with status bit controlRaik, Jaan; Orasson, Elmet; Ubar, Raimund-JohannesProceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 20042004 / p. 507-510 : ill https://pld.ttu.ee/~raiub/files/aaaaa_pulk/MIXDES/jaan.pdf

artikkel kogumikus

147

artikkel kogumikus

Simulation and automated test development system for digital devicesBirger, AlexanderBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 293-295

artikkel kogumikus

148

raamat

Sissejuhatus digitaaltehnikasseLehtla, Madis2016 http://www.ester.ee/record=b4618200*est

raamat

149

artikkel kogumikus EST / artikkel kogumikus ENG

Small and medium-sized seaports on the digital track : tracing digitalisation across the South Baltic region by innovative auditing proceduresPhilipp, Robert; Gerlitz, Laima; Moldabekova, AisuluReliability and statistics in transportation and communication : Selected Papers from the 19th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’19, 16-19 October 2019, Riga, Latvia2020 / p. 351-362 https://doi.org/10.1007/978-3-030-44610-9_35 Article collection metrics at Scopus Article at Scopus

artikkel kogumikus EST / artikkel kogumikus ENG

150

dissertatsioon

Some new aspects of digital filteringTrump, Tõnu1993 http://www.ester.ee/record=b1065194*est

dissertatsioon

digitaaltehnika (märksõna)

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