Otsing - TalTech teadusportaal

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276

artikkel kogumikus

Preliminary analysis of mechanical bearing faults for predictive maintenance of electrical machinesKudelina, Karolina; Raja, Hadi Ashraf; Autsou, Siarhei; Naseer, Muhammad Usman; Vaimann, Toomas; Kallaste, Ants; Pomamacki, Raimondas; Hyunh, Van Khang2023 IEEE 14th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)2023 / p. 430-435 : ill https://doi.org/10.1109/SDEMPED54949.2023.10271451

artikkel kogumikus

Seotud publikatsioonid 1

Artificial intelligence driven approaches for fault prognostics of electrical machines using vibration spectrum analysis = Tehisintellektil põhinevad lähenemisviisid elektrimasinate rikete prognoosimiseks vibratsioonispektri analüüsi abil

277

artikkel kogumikus

Protection of bidirectional Step-Up/Down partial power converter against short circuit and open circuit faults and mode transition issuesHassanpour, Naser; Chub, Andrii; Blinov, Andrei; Yadav, Neelesh; Hasan, Sayeed; Vinnikov, Dmitri2024 IEEE 18th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)2024 / 6 p https://doi.org/10.1109/CPE-POWERENG60842.2024.10604315

artikkel kogumikus

278

artikkel ajakirjas EST / artikkel ajakirjas ENG

A public dataset for synchronous motor electrical faults diagnosis with CNN and LSTM reference classifiersSun, Zhenglong; Machlev, Ram; Wang, Qianchao; Belikov, Juri; Levron, Yoash; Baimel, DmitryEnergy and AI2023 / art. 100274 https://doi.org/10.1016/j.egyai.2023.100274 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

279

artikkel kogumikus

Register-transfer level deductive fault simulation using decision diagramsReinsalu, Uljana; Raik, Jaan; Ubar, Raimund-JohannesBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 193-196 : ill

artikkel kogumikus

280

artikkel kogumikus

Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPGPalermo, N.; Tihhomirov, Valentin; Copetti, Thiago; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102405

artikkel kogumikus

281

artikkel kogumikus

Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687Jutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 240-249 : ill https://doi.org/10.1109/AUTEST.2016.7589605

artikkel kogumikus

282

artikkel kogumikus

Research and training environment for digital design and testUbar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of the Eighth IASTED International Conference on Computers and Advanced Technology in Education : August 29-31, 2005, Oranjestad, Aruba2005 / p. 232-237 : ill https://ieeexplore.ieee.org/document/1408779

artikkel kogumikus

283

artikkel kogumikus

Research environment for teaching digital testIvask, Eero; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 468-473 : ill https://pld.ttu.ee/dildis/publications/IWK'2004_res_inv.pdf

artikkel kogumikus

284

artikkel ajakirjas

Reversible electrowetting on silanized silicon nitrideCahill, Brian; Giannitsis, Athanasios; Land, Raul; Gastrock, Gunter; Pliquett, Uwe; Frense, Dieter; Min, Mart; Beckmann, DieterSensors and actuators B. Chemical2010 / p. 380-386 : ill https://www.sciencedirect.com/science/article/pii/S092540050800885X

artikkel ajakirjas

285

artikkel ajalehes

Riigijuhid, kuhu jääb elektritootmise strateegia?Rajangu, VäinoEesti Päevaleht2023 / Lk. 3 https://dea.digar.ee/article/eestipaevaleht/2023/01/10/3.5 Riigijuhid, kuhu jääb elektritootmise strateegia?

artikkel ajalehes

286

raamat

RikkevoolukaitseTeemets, Raivo2004 https://www.ester.ee/record=b1961658*est

raamat

287

artikkel ajakirjas

RikkevoolukaitseTeemets, RaivoEhitaja1996 / 8, lk. 69-70: ill

artikkel ajakirjas

288

artikkel ajakirjas

Rikkevoolukaitse lülitite paigaldamineTeemets, RaivoEhitaja1996 / 9, lk. 73-74: ill

artikkel ajakirjas

289

artikkel kogumikus

Rotor fault diagnostic of inverter fed induction motor using frequency analysisAsad, Bilal; Vaimann, Toomas; Belahcen, Anouar; Kallaste, Ants; Rassõlkin, Anton2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED), 27-30 Aug. 2019, Toulouse, France : proceedings2019 / p. 127-133 : ill https://doi.org/10.1109/DEMPED.2019.8864903

artikkel kogumikus

290

artikkel kogumikus

RT-level identification of potentially testable initialization faultsRaik, Jaan; Fujiwara, Hideo; Krivenko, AnnaThe Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan2008 / [6] p https://www.researchgate.net/publication/234032548_RT-level_identification_of_potentially_testable_initialization_faults

artikkel kogumikus

291

artikkel kogumikus

RT-level test point insertion for sequential circuitsRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings2004 / p. 34-40 : ill https://ieeexplore.ieee.org/document/1428412

artikkel kogumikus

292

dissertatsioon

110 kV õhuliinide isolatsiooni töökindluse analüüs ja töökindluse tõstmise meetodid = The study of 110 kV power grid reliability and the measures to decrease insulation failureTaklaja, Paul2012 http://www.ester.ee/record=b2857612*est

dissertatsioon

293

artikkel ajakirjas

SALSy : security-aware layout synthesisEslami, Mohammad; Perez, Tiago Diadami; Pagliarini, Samuel NascimentoarXiv.org2024 / 13 p. : ill https://doi.org/10.48550/arXiv.2308.06201

artikkel ajakirjas

Seotud publikatsioonid 1

On the use of defensive schemes for hardware security = Kaitseskeemid riistvara turvalisuse tagamiseks

294

artikkel kogumikus

Scalable algorithm for structural fault collapsing in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea2015 / p. 171-176 : ill

artikkel kogumikus

295

artikkel kogumikus

A scalable technique to identify true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, JaanProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 152-157 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

artikkel kogumikus

296

dissertatsioon

Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemidKostin, Sergei2012 https://www.ester.ee/record=b2757857*est

dissertatsioon

297

artikkel kogumikus

Sequential test set compaction in LFSR reseedingJutman, Artur; Aleksejev, Igor; Raik, JaanDesign and test technology for dependable systems-on-chip2011 / p. 476-493 : ill https://ieeexplore.ieee.org/document/4738292

artikkel kogumikus

298

artikkel kogumikus

7-valued algebra for transition delay fault analysisKõusaar, Jaak; Ubar, Raimund-JohannesBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 89-92 : ill

artikkel kogumikus

299

artikkel kogumikus

Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Raik, Jaan2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway2015 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2015.7364406

artikkel kogumikus

300

artikkel kogumikus

Shift register based TPG for at-speed interconnect BISTJutman, ArturMIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 22004 / p. 751-754 : ill https://ieeexplore.ieee.org/document/1314941?signout=success

artikkel kogumikus

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