Otsing - TalTech teadusportaal

kuva

reasta

351

dissertatsioon

A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseksBalakrishnan, Aneesh2022 https://doi.org/10.23658/taltech.11/2022 https://digikogu.taltech.ee/et/Item/a594d3ec-0e6b-4a78-819a-fe1f47992612

dissertatsioon

Seotud publikatsioonid 9

Modeling gate-level abstraction hierarchy using graph convolutional neural networks to predict functional de-rating factors
On the estimation of complex circuits functional failure rate by machine learning techniques
Challenges of reliability assessment and enhancement in autonomous systems
The validation of graph model-based, gate level low-dimensional feature data for machine learning applications
Understanding multidimensional verification : where functional meets non-functional
Enabling cross-layer reliability and functional safety assessment through ML-based compact models
Composing graph theory and deep neural networks to evaluate SEU type soft error effects
Gate-level graph representation learning : a step towards the improved stuck-at faults analysis
Modeling soft-error reliability under variability

352

artikkel kogumikus

System modelling and measurement under the view of design of testability and fault diagnosis of analog circuitsLiu, Ji-Gou; Frühauf, UweBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 295-298: ill

artikkel kogumikus

353

artikkel kogumikus

Teaching diagnostic modeling of digital systems with decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Raik, Jaan; Mironov, Dmitri; Evartson, Teet; Orasson, Elmet; Aarna, Margit; Wuttke, Heinz-DietrichProceedings of 12th IASTED International Conference on Computers and Advanced Technology in Education - CATE 2009 : St.Thomas, US, November 22-24, 20092009 / p. 1-6. [CD-ROM]

artikkel kogumikus

354

artikkel kogumikus

Teaching digital system testOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Kruus, MargusThe 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble2017 / [6] p

artikkel kogumikus

355

dissertatsioon

Techniques for robust routing, communication and computation in multiprocessor systems = Robustse marsruutimise, side ja arvutuse tehnikad mitmeprotsessorilistes süsteemidesJanson, Karl2021 https://www.ester.ee/record=b5396084*est https://digikogu.taltech.ee/et/Item/c9091d5c-dcd8-4b21-95a7-84ead85241e6 https://doi.org/10.23658/taltech.3/2021

dissertatsioon

356

artikkel ajalehes

Tehisintellekt pandi metalliettevõttes rikkeid otsima, et vähendada tootmiskulusid [Võrguväljaanne]am.ee2022 Tehisintellekt pandi metalliettevõttes rikkeid otsima, et vähendada tootmiskulusid

artikkel ajalehes

357

artikkel kogumikus

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, Vineeth12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings2007 / p. 29-34 : ill http://dx.doi.org/10.1109/ETS.2007.41

artikkel kogumikus

358

artikkel kogumikus

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, VineethInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 33-37 : ill

artikkel kogumikus

359

artikkel kogumikus

Test generation for control faults in digital systemsDušina, Julia; Brik, MarinaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 325-330: ill

artikkel kogumikus

360

artikkel kogumikus

Test generation for finite state machinesUbar, Raimund-Johannes; Brik, MarinaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 233-236: ill

artikkel kogumikus

361

artikkel kogumikus

Test pattern generation at the behavioral level from VHDL circuit description containing several processesGramatova, Elena; Bezakova, Jana; Cibakova, TatianaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 145-148

artikkel kogumikus

362

artikkel kogumikus

The analysis of integrating sigma-delta ADC noiseGutnikov, V.S.; Krivchenko, T.I.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 201-206: ill

artikkel kogumikus

363

artikkel kogumikus

The FEM based modeling and corresponding test rig preparation for broken rotor bars analysisAsad, Bilal; Eensalu, Lauri; Vaimann, Toomas; Kallaste, Ants; Rassõlkin, Anton; Belahcen, Anouar2019 IEEE 60th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), 7-9 October 2019 : conference proceedings2019 / 9 p. : ill https://doi.org/10.1109/RTUCON48111.2019.8982350

artikkel kogumikus

364

artikkel ajakirjas

The investigation of the Therac-25 accidentsZdanov, VassiliA & A2007 / 6, lk. 20-32 : ill https://artiklid.elnet.ee/record=b1021179*est

artikkel ajakirjas

365

artikkel kogumikus

The study about indefinite fault causes in Estonian 110 kV power gridTaklaja, Paul; Oidram, ReinPQ2010 : 7th International Conference "2010 Electric Power Quality and Supply Reliability" : June 16-18, 2010, Kuressaare, Estonia2010 / p. 177-182 : ill

artikkel kogumikus

366

artikkel kogumikus

3D parallel fault simulationGorev, Maksim; Ubar, Raimund-JohannesProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 39-42 : ill

artikkel kogumikus

367

artikkel ajakirjas

3D permeance model of induction machines taking into account saturation effects and its connection with stator current and shaft speed spectraMartinez, Javier; Belahcen, Anouar; Arkkio, AnteroIET electric power applications2015 / p. 20-29 : ill http://dx.doi.org/10.1049/iet-epa.2014.0013

artikkel ajakirjas

368

artikkel kogumikus

A tool for random test generation targeting high diagnostic resolutionOsimiry, Emmanuel Ovie; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 79-82 : ill http://www.ester.ee/record=b2150914*est

artikkel kogumikus

369

artikkel kogumikus

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

artikkel kogumikus

370

artikkel kogumikus

Topological analysis of SSBDDs with applications in fault diagnosisUbar, Raimund-JohannesProceedings of 10th International Workshop on Boolean Problems : Freiberg, Germany, September 19-21, 20122012 / p. 1-16

artikkel kogumikus

371

artikkel kogumikus

Towards artificial intelligence based automatic adaptive response analyzer for high frequency analog BISTPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesCIMSA 2008 : IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : Istanbul, Turky, July 14-16, 20082008 / p. 99-104 : ill https://ieeexplore.ieee.org/document/4595841

artikkel kogumikus

372

artikkel ajakirjas EST / artikkel ajakirjas ENG

Transient modeling and recovery of non-stationary fault signature for condition monitoring of induction motorsAsad, Bilal; Vaimann, Toomas; Belahcen, Anouar; Kallaste, Ants; Rassõlkin, Anton; Ghahfarokhi, Payam Shams; Kudelina, KarolinaApplied sciences2021 / 17 p. : ill https://doi.org/10.3390/app11062806 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

373

artikkel kogumikus

Transient modeling and recovery of non-stationary fault signature for condition monitoring of induction motorsAsad, Bilal; Vaimann, Toomas; Belahcen, Anouar; Kallaste, Ants; Rassõlkin, Anton; Ghahfarokhi, Payam ShamsAdvances in machine fault diagnosis2022 / p. 43-59 https://doi.org/10.3390/app11062806

artikkel kogumikus

374

artikkel ajakirjas

Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebraKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, JaanMicroprocessors and microsystems2015 / p. 1130-1138 : ill http://dx.doi.org/10.1016/j.micpro.2015.05.003

artikkel ajakirjas

375

artikkel kogumikus

Troubleshooting and debugging functionsRuban, Olga; Laugis, Juhan5th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology : Kuressaare, January 14-19, 20082008 / p. 216-221 : ill

artikkel kogumikus

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