Otsing - TalTech teadusportaal

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51

artikkel kogumikus

Combined pseudo-exhaustive and deterministic testing of array multipliersOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 21st edition, 24th-26th May, Cluj-Napoca, Romania : proceedings2018 / 6 p. : ill https://doi.org/10.1109/AQTR.2018.8402708

artikkel kogumikus

52

artikkel kogumikus

Combining fault analysis technologies for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings2019 / p. 129–134 : ill https://doi.org/10.1109/ATS47505.2019.00024

artikkel kogumikus

Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

53

dissertatsioon

Common-ground energy router structure with enhanced reliability and protection = Ühise nulljuhtmega suurendatud töökindluse ja kaitsega energiaruuterRahimpour, Saeed2024 https://doi.org/10.23658/taltech.45/2024 https://www.ester.ee/record=b5694226*est https://digikogu.taltech.ee/et/Item/520b18fc-f0a8-4a08-ade8-d3b890d253ff

dissertatsioon

Seotud publikatsioonid 9

54

artikkel kogumikus

Complex delay fault reasoning with sequential 7-valued algebraKõusaar, Jaak; Ubar, Raimund-Johannes; Aleksejev, Igor2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102403

artikkel kogumikus

55

artikkel kogumikus EST / artikkel kogumikus ENG

Condition monitoring and fault detection for electrical machines using IOTRaja, Hadi Ashraf; Vaimann, Toomas; Rassõlkin, Anton; Kallaste, AntsProceedings of the Future Technologies Conference (FTC) 2022. Volume 22023 / p. 162-173 https://doi.org/10.1007/978-3-031-18458-1_12 Conference proceedings at Scopus Article at Scopus

artikkel kogumikus EST / artikkel kogumikus ENG

Seotud publikatsioonid 1

IoT based tools and methods for electrical machine diagnostics = Asjade interneti põhised tööriistad ja meetodid elektrimasinate diagnostikaks

56

artikkel kogumikus

Condition monitoring of electrical machinesVaimann, Toomas; Kallaste, Ants11th International Symposium "Topical Problems in the Field of Electrical and Power Engineering." Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 16-21, 20122012 / p. 209-212 : ill

artikkel kogumikus

57

artikkel kogumikus

Condition monitoring of electrical machines and its relation to industrial internetBelahcen, Anouar; Gyftakis, Konstantinos N.; Martinez, Javier; Climente-Alarcon, Vicente; Vaimann, Toomas2015 IEEE Workshop on Electrical Machines Design, Control and Diagnosis (WEMDCD) : proceedings : Castello del Valentino, Torino, Italy, 26-27 March, 20152015 / p. 233-241 : ill http://dx.doi.org/10.1109/WEMDCD.2015.7194535

artikkel kogumikus

58

artikkel kogumikus

Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]Jürimägi, Lembit; Ubar, Raimund-JohannesBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p. : ill https://doi.org/10.1109/BEC.2018.8600967

artikkel kogumikus

59

artikkel ajakirjas

Construction of the tests of combinational circuit failures by analyzing the orthogonal disjunctive normal forms represented by the alternative graphsMatrosova, A.Yu.; Pleshkov, A.G.; Ubar, Raimund-JohannesAutomation and remote control2005 / p. 313-327 : ill http://dx.doi.org/10.1007/s10513-005-0054-9

artikkel ajakirjas

60

dissertatsioon

Cost-effective concurrent hardware checkers for network on chip based system on chip = Kulutõhusad süsteemiga paralleelsed rikkemonitorid kiipvõrkudel põhinevatele kiipsüsteemideleHariharan, Ranganathan2019 https://digi.lib.ttu.ee/i/?12854 https://www.ester.ee/record=b5243161*est

dissertatsioon

61

artikkel kogumikus

Cost-efficient real-time condition monitoring and fault diagnostics system for BLDC motor using IoT and Machine learningRaja, Hadi Ashraf; Raval, Hardik; Vaimann, Toomas; Kallaste, Ants; Rassõlkin, Anton; Belahcen, AnouarDiagnostika '22 : 2022 International Conference on Diagnostics in Electrical Engineering : conference proceedings2022 / 4 p. https://doi.org/10.1109/Diagnostika55131.2022.9905102

artikkel kogumikus

Seotud publikatsioonid 1

IoT based tools and methods for electrical machine diagnostics = Asjade interneti põhised tööriistad ja meetodid elektrimasinate diagnostikaks

62

artikkel kogumikus

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan2014 17th Euromicro Conference on Digital System Design : DSD 2014 : 27-29 August 2014, Verona, Italy : proceedings2014 / p. 108-113 : ill

artikkel kogumikus

63

artikkel kogumikus

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, JaanProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 61-66 : ill

artikkel kogumikus

64

dissertatsioon

Cross-layer dependability management in network on chip based system on chip = Kiipvõrkudel põhinevate süsteemide kihtideülene usaldatavuse haldusAzad, Siavoosh Payandeh2018 https://digi.lib.ttu.ee/i/?9948 https://www.ester.ee/record=b5056143*est

dissertatsioon

65

artikkel kogumikus

Data-driven cross-layer fault management architecture for sensor networksVihman, Lauri; Kruusmaa, Maarja; Raik, Jaan16th European Dependable Computing Conference : EDCC 2020 : Virtual Conference, Munich, Germany, 7-10 September 2020 : proceedings2020 / art. 20094188, p. 33-40 https://doi.org/10.1109/EDCC51268.2020.00015

artikkel kogumikus

Seotud publikatsioonid 1

Data-driven fault-resilient cross-layer sensor network architecture = Andmepõhine tõrkekindel kihtideülene sensorvõrgu arhitektuur

66

dissertatsioon

Data-driven fault-resilient cross-layer sensor network architecture = Andmepõhine tõrkekindel kihtideülene sensorvõrgu arhitektuurVihman, Lauri2024 https://www.ester.ee/record=b5657135*est https://digikogu.taltech.ee/et/Item/00a93258-dc0f-4a4d-822f-099fff757224 https://doi.org/10.23658/taltech.7/2024

dissertatsioon

Seotud publikatsioonid 5

67

artikkel kogumikus

DECIDER : a decision diagram based hierarchical test generation systemJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Szczyrk, Poland, September 2-4, 19981998 / p. 269-273 https://www.ida.liu.se/labs/eslab/publications/pap/db/DDECS98.pdf

artikkel kogumikus

68

artikkel kogumikus

Deductive fault simulation on structurally synthesized BDDsAarna, Margit; Ubar, Raimund-Johannes; Raik, JaanBEC 2004 : Baltic Electronics Conference : Post-Graduate Student Session : Tallinn University of Technology, October 3-6, 2004, Tallinn, Estonia2004 / p. 11 : ill

artikkel kogumikus

69

artikkel ajakirjas

DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN acceleratorsTaheri, Mahdi; Riazati, Mohamad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjödin, Mikael; Lisper, BjörnarXiv.org2023 / 8 p. : ill https://doi.org/10.48550/arXiv.2303.08226

artikkel ajakirjas

70

artikkel kogumikus

Defect oriented fault coverage of 100stuck-at fault test setsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 20002000 / p. 511-516 : ill https://repo.pw.edu.pl/info.seam?ps=20&id=WUT7e20f35d67ae45d3b2d1264d7a4ba722&lang=en&pn=1&cid=156607

artikkel kogumikus

71

artikkel kogumikus

Defect-oriented fault simulation and test generation in digital circuitsKuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California2001 / p. 365-371 https://ieeexplore.ieee.org/document/915257

artikkel kogumikus

72

artikkel ajakirjas

Defect-oriented mixed-level fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaFacta Universitatis [Niš]. Series electronics and energetics2002 / 1, April, p. 123-136 : ill

artikkel ajakirjas

73

artikkel kogumikus

Defect-oriented modul-level fault diagnosis in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanProceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 / p. 81-86

artikkel kogumikus

74

artikkel kogumikus

Defect-oriented test generation and fault simulation in the environment of MOSCITOSchneider, Andre; Diener, Karl-Heinz; Gramatova, Elena; Fisherova, Maria; Ivask, Eero; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Kuzmicz, W.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 303-306 : ill

artikkel kogumikus

75

artikkel kogumikus

Defect-oriented test generation using probabilistic estimationCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 20002001 / p. 131-136 : ill

artikkel kogumikus

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