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126

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Enabling cross-layer reliability and functional safety assessment through ML-based compact modelsAlexandrescu, Dan; Balakrishnan, Aneesh; Lange, Thomas; Glorieux, MaximilienProceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition2020 / 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159750

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Seotud publikatsioonid 1

A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks

127

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Enhancing transmission line reliability : an AI-driven approach to fault identification and classificationShabbir, Noman; Kamran, Daniel; Raja, Hadi AshrafElectronics2024

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128

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Environment for fault simulation acceleration on FPGAEllervee, Peeter; Raik, Jaan; Tihhomirov, ValentinBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 217-220 : ill

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129

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Environment for FPGA-based fault emulationEllervee, Peeter; Raik, Jaan; Tammemäe, Kalle; Ubar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering2006 / 3-2, p. 323-335 : ill

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130

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Environment for the analysis of functional self-test quality in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Kruus, Helena; Aarna, Margit; Devadze, SergeiProceedings of the Estonian Academy of Sciences2014 / p. 151-162 : ill https://artiklid.elnet.ee/record=b2673964*est

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131

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Estimation of complex derivatives and application for fault diagnosisBaraškova, Tatjana; Arjassov, Gennadi; Gornostajev, DmitriAnnals of DAAAM for 2012 & Proceedings of the 23rd International DAAAM Symposium : Intelligent Manufacturing & Automation2012 / p. 0469-0472 : ill. [CD-ROM] https://www.daaam.info/Downloads/Pdfs/proceedings/proceedings_2012/109.pdf

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132

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Estimation of complex derivatives application for fault diagnosisBaraškova, Tatjana; Pascault, D.17th International conference on "Mathematical Modelling and Analysis" : June 6-9, 2012, Tallinn, Estonia : abstracts2012 / p. 19

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133

artikkel ajakirjas EST / artikkel ajakirjas ENG

Evaluating architectural, redundancy, and implementation strategies for radiation hardening of FinFET integrated circuitsPagliarini, Samuel Nascimento; Benites, Luis; Martins, Mayler; Rech, Paolo; Kastensmidt, FernandaIEEE transactions on nuclear science2021 / p. 1045-1053 https://doi.org/10.1109/TNS.2021.3070643 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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134

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Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanInternational journal of microelectronics and computer science2018 / p. 9−18 https://ijmcs.dmcs.pl/web/guest/vol.-9-no.-1 https://ijmcs.dmcs.pl/documents/10630/345460/IJMCS_1_2018_2.pdf

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135

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Experimental performance validation of Z-source DC circuit breaker for high impedance faultsPogulaguntla, Aditya; Naik Banavath, Satish; Chub, Andrii; Vinnikov, Dmitri; Singh, Rajendra2024 IEEE Sixth International Conference on DC Microgrids (ICDCM)2024 / 5 p https://doi.org/10.1109/ICDCM60322.2024.10664702

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136

artikkel ajalehes

Experts: No need to worry about the impact of solar storms todayPiir, Raitnews.err.ee2024 Experts: No need to worry about the impact of solar storms today

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137

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Explainability and transparency of classifiers for air-handling unit faults using explainable artificial intelligence (XAI)Meas, Molika; Machlev, Ram; Köse, Ahmet; Tepljakov, Aleksei; Loo, Lauri; Levron, Yoash; Petlenkov, Eduard; Belikov, JuriSensors2022 / art. 6338 : ill https://doi.org/10.3390/s22176338 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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138

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Exploiting high-level descriptions for circuits fault tolerance assessmentsBenso, A.; Prinetto, Paolo; Rebaudengo, M.; Sonza Reorda, Matteo; Raik, Jaan; Ubar, Raimund-Johannes1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Paris, October 20-22, 19971997 / p. 212-216 https://ieeexplore.ieee.org/document/628327

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139

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Exploring the limits of early predictive maintenance in wind turbines applying an anomaly detection techniqueJankauskas, Mindaugas; Serackis, Artūras; Šapurov, Martynas; Pomarnacki, Raimondas; Baskys, Algirdas; Hyunh, Van Khang; Vaimann, Toomas; Zakis, JanisSensors2023 / art. 5695 https://doi.org/10.3390/s23125695 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

140

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Extended checkers for control part of routers in network-on-chipsHariharan, Ranganathan; Niazmand, Behrad; Hollstein, Thomas; Raik, Jaan; Jervan, GertMEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France2015 / p. 36-39 : ill

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141

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Facebooki katkestus mõjutas nii ettevõtete kui ka riikide toimepidevust [Võrguväljaanne]Pärli, Merilinerr.ee2021 "Facebooki katkestus mõjutas nii ettevõtete kui ka riikide toimepidevust"

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142

artikkel ajalehes

Facebooki, Instagrami ja Whatsappi tabas tohutu ülemaailmne rike [Võrguväljaanne]ohtuleht.ee2021 "Facebooki, Instagrami ja Whatsappi tabas tohutu ülemaailmne rike"

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143

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Failure consequence evaluation of uncontrollable district heating networkMao, Ding; Wang, Peng; Ju, Yuchen; Ni, LongSustainable cities and society2022 / art. 103593, 16 p. : ill https://doi.org/10.1016/j.scs.2021.103593 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

144

artikkel ajakirjas

Failure mechanisms in oil-shale pillarsPastarus, Jüri-RivaldoOil shale1994 / 3, p. 251-257: ill https://kirj.ee/wp-content/plugins/kirj/pub/OS-3-1994-251-257_20230316182205.pdf

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145

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Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668

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146

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Fast fault simulation for extended class of faults in scan-path circuitsUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, ArturProceedings : Fifth IEEE International Symposium on Electronic Design, Test and Applications : DELTA 2010 : 13-15 January 2010, Ho Chi Minh City, Vietnam2010 / p. 14-19 https://ieeexplore.ieee.org/document/5438717

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147

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Fast identification of true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Jürimägi, LembitMicroelectronics reliability2018 / p. 252-261 : ill https://doi.org/10.1016/j.microrel.2017.11.027 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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148

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Fast RTL fault simulation using decision diagrams and bitwise set operationsReinsalu, Uljana; Raik, Jaan; Ubar, Raimund-Johannes; Ellervee, Peeter2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada2011 / p. 164-170 https://ieeexplore.ieee.org/document/6104440

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149

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Fault aliasing of signature analyzersKemnitz, Günter; Kärger, ReinhardBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 339-346: ill

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150

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Fault analysis of manufacturing systems as additional constraint by simulationKaraulova, Tatjana; Papstel, JüriInternational journal of simulation modelling2003 / 1/2, p. 5-13 : ill

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