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151

artikkel kogumikus

Fault management instrumentation network based on IEEE P1687 IJTAGShibin, Konstantin; Jutman, Artur; Devadze, SergeiEuropean Test Symposium (ETS), 2013, Avignon, France2013

artikkel kogumikus

152

artikkel ajakirjas EST / artikkel ajakirjas ENG

Fault management techniques to enhance the reliability of power electronic converters : an overviewRahimpour, Saeed; Husev, Oleksandr; Vinnikov, Dmitri; Vosoughi Kurdkandi, Naser; Tarzamni, HadiIEEE Access2023 / p. 13432-13446 https://doi.org/10.1109/ACCESS.2023.3242918 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

Seotud publikatsioonid 1

Common-ground energy router structure with enhanced reliability and protection = Ühise nulljuhtmega suurendatud töökindluse ja kaitsega energiaruuter

153

artikkel kogumikus

Fault model and test synthesis for RISC-processorsUbar, Raimund-Johannes; Markus, Antti; Jervan, Gert; Raik, JaanBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 229-232: ill

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154

artikkel kogumikus

Fault modeling and diagnosis in digital systemsUbar, Raimund-JohannesCREDES Summer School : Dependable Systems Design : handouts2011 / p. 91-106 : ill

artikkel kogumikus

155

artikkel kogumikus

Fault path detection using a spectral methodPorwik, PiotrBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 315-318: ill

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156

artikkel kogumikus

Fault prediction in power networkKangilaski, TaivoThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 289-292

artikkel kogumikus

157

dissertatsioon

Fault simulation of digital systems = Digitaalsüsteemide rikete simuleerimineDevadze, Sergei2009 https://digi.lib.ttu.ee/i/?445 https://www.ester.ee/record=b2508727*est

dissertatsioon

158

artikkel kogumikus

Fault simulation with parallel critical path tracing for combinational circuits using structurally synthesized BDDsDevadze, Sergei; Raik, Jaan; Jutman, Artur; Ubar, Raimund-Johannes7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings2006 / p. 97-102 : ill

artikkel kogumikus

159

artikkel kogumikus

Fault simulation with parallel exact critical path tracing in multiple core environmentGorev, Maksim; Ubar, Raimund-Johannes; Devadze, SergeiProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 9-13 March 2015, Grenoble, France2015 / p. 1180-1185 : ill

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160

artikkel kogumikus

Fault-aware performance assessment approach for embedded networksMalburg, Jan; Janson, Karl; Raik, Jaan; Dannemann, Frank2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 4 p. : ill https://doi.org/10.1109/DDECS.2019.8724670

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161

artikkel kogumikus

Fault-resilient NoC router with transparent resource allocationPutkaradze, Tsotne; Azad, Siavoosh Payandeh; Niazmand, Behrad; Raik, Jaan; Jervan, Gert12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill https://doi.org/10.1109/ReCoSoC.2017.8016161 https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8016161

artikkel kogumikus

162

artikkel kogumikus

Faults and fault models for integrated circuits and systems [Electronic resource] : [slides]Ubar, Raimund-JohannesDesign and Test Technology for Dependable Hardware/Software Systems : DEDIS/DAAD Summer Academy : BTU Cottbus, Sept. 1st-12th, 20082008 / [64] p. : ill. [CD-ROM]

artikkel kogumikus

163

raamat

Fehler in Automaten1989 http://www.ester.ee/record=b2015320*est

raamat

164

artikkel ajakirjas

Fehlerbestimmung in kombinatorischen Scaltungen durch Lösung der Booleschen DifferentialgleichungenUbar, Raimund-JohannesNachrichtentechnik, Elektronik : technisch-wissenschaftlishe Zeitschrift für die gesamte elektronische Nachrichtentechnik1978 / p. 330-334 : ill https://www.ester.ee/record=b1550811*est

artikkel ajakirjas

165

artikkel kogumikus

Finite element analysis based technique implementation for fault diagnostic of electrical machinesAkbar, Siddique22nd International Symposium “Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology III : Pärnu, Estonia, August 23-26, 20232023 / p. 103-104 https://www.ester.ee/record=b5570906*est

artikkel kogumikus

166

artikkel kogumikus

First results on load model estimation using digital fault recorder measurementsLeinakse, Madis; Sarnet, Tanel; Kangro, Triin; Kilter, Jako16th International Symposium "Topical Problems in the Field of Electrical and Power Engineering. Doctoral School of Energy and Geotechnology III" : Pärnu, Estonia, January 16-21, 20172017 / p. 101-105 : ill http://www.ester.ee/record=b4650094*est

artikkel kogumikus

167

artikkel kogumikus

FPGA based fault emulation of synchronous sequential circuitsEllervee, Peeter; Raik, Jaan; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 20042004 / p. 59-62 https://ieeexplore.ieee.org/abstract/document/1423822

artikkel kogumikus

168

artikkel ajakirjas

FPGA-based fault emulation of synchronous sequential circuitsEllervee, Peeter; Raik, Jaan; Tammemäe, Kalle; Ubar, Raimund-JohannesIET computers and digital techniques2007 / 2, p. 70-76 : ill https://ieeexplore.ieee.org/abstract/document/1423822

artikkel ajakirjas

169

artikkel kogumikus

A framework for combining concurrent checking and online embedded test for low-latency fault detection in NoC routersSaltarelli, Pietro; Niazmand, Behrad; Raik, Jaan; Govind, Vineeth; Hollstein, Thomas; Jervan, Gert; Hariharan, RanganathanNOCS '15 : International Symposium on Networks-on-Chip : Vancouver, BC, Canada, September 28-30, 20152015 / [8] p. : ill http://dx.doi.org/10.1145/2786572.2788713

artikkel kogumikus

170

artikkel kogumikus

From online fault detection to fault management in network-on-chips : a ground-up approachAzad, Siavoosh Payandeh; Niazmand, Behrad; Janson, Karl; Nevin, George; Oyeniran, Adeboye Stephen; Putkaradze, Tsotne; Apneet Kaur; Raik, Jaan; Jervan, Gert; Ubar, Raimund-Johannes; Hollstein, ThomasProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 48-53 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

artikkel kogumikus

171

artikkel kogumikus

Guardbands in random testingKemnitz, GünterBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 85-88: ill

artikkel kogumikus

172

artikkel kogumikus

Handling of SETs on NoC links by exploitation of inherent redundancy in circular input buffers [Online resource]Janson, Karl; Pihlak, Rene; Azad, Siavoosh Payandeh; Niazmand, Behrad; Jervan, Gert; Raik, JaanBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p.: ill https://doi.org/10.1109/BEC.2018.8600989

artikkel kogumikus

173

artikkel kogumikus

Harmonic spectrum analysis of induction motor with broken rotor bar faultAsad, Bilal; Vaimann, Toomas; Kallaste, Ants; Belahcen, Anouar59th Annual International Scientific Conference on Power and Electrical Engineering : November 12, 13, 2018, Riga Technical University (RTUCON) : conference proceedings2018 / 7 p. : ill https://doi.org/10.1109/RTUCON.2018.8659842

artikkel kogumikus

174

artikkel ajakirjas EST / artikkel ajakirjas ENG

Health management for self-aware SoCs based on IEEE 1687 infrastructureShibin, Konstantin; Devadze, Sergei; Jutman, Artur; Grabmann, Martin; Pricken, RobinIEEE Design & Test2017 / p. 27-35 : ill https://doi.org/10.1109/MDAT.2017.2750902 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

175

artikkel ajakirjas

Hierarchical approaches to test generation and fault simulationUbar, Raimund-JohannesRadioelectronics and informatics2003 / p. 204

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