Otsing - TalTech teadusportaal

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reasta

376

artikkel kogumikus

A method for crosstalk fault detection in on-chip busesBengtsson, Tomas; Jutman, Artur; Ubar, Raimund-Johannes; Kumar, ShashiNorchip : proceedings : Oulu, Finland, 21-22 November 20052005 / p. 285-288 : ill https://doi.org/10.1109/NORCHP.2005.1597045

artikkel kogumikus

377

artikkel kogumikus

A method for identification dynamic parameters of mixed signal circuitsZagursky, V.; Semyonova, N.; Gertners, A.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 211-215 https://www.ester.ee/record=b2150914*est

artikkel kogumikus

378

artikkel kogumikus

A method for testing dynamic characteristics of analog-digital converters in spectral domainZagursky, V.; Semyonova, N.; Gertners, A.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 207-210 https://www.ester.ee/record=b2150914*est

artikkel kogumikus

379

artikkel kogumikus

Method for testing the brainHinrikus, Hiie; Bachmann, Maie; Lass, Jaanus; Tuulik, Viiu; Ubar, Raimund-Johannes5th European Conference of the International Federation for Medical and Biological Engineering : 14-18 September 2011, Budapest, Hungary2012 / p. 1198-1201 : ill

artikkel kogumikus

380

artikkel kogumikus

Microprocessor-based system test using debug interfaceDevadze, Sergei; Jutman, Artur; Tšertov, Anton; Instenberg, Martin; Ubar, Raimund-Johannes26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings2008 / p. 98-101 : ill http://dx.doi.org/10.1109/NORCHP.2008.4738291

artikkel kogumikus

381

artikkel kogumikus

Microprogram automation : design for testabilityKeevallik, Andres; Kruus, Margus; Lensen, HarriBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 171-174

artikkel kogumikus

382

artikkel kogumikus

Microprogrammed test generator for bus oriented devicesSzegi, A.; Feher, B.Automation, simulation & measurement. Section A, Automation. Section M, Measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991 = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 88-94: ill

artikkel kogumikus

383

artikkel kogumikus

Mikroelektroonika kiipide testimise tarkvara turbo-tester : kommentaar Eesti Teaduste Akadeemia Bernhard Schmidti preemia pälvinud tööleRaik, JaanTallinna Tehnikaülikooli aastaraamat 20072008 / lk. 275-278

artikkel kogumikus

384

artikkel ajakirjas

Milleks ja kuidas katsetada laevu?Hartikainen, AnniPaat & Meremees2016 / lk. 30 http://www.ester.ee/record=b4471304*est

artikkel ajakirjas

385

artikkel ajakirjas

Milline on parim hiir? : [TTÜ tootearenduse tudengid testisid arvutihiiri]Toon, Triin; Matsi, Birthe; Otto, TaunoArvutikasutaja2005 / 8, lk. 34-37 : ill https://artiklid.elnet.ee/record=b1050729*est

artikkel ajakirjas

386

artikkel ajalehes

Milline pann osta? Kas odav pann teeb töö ära sama hästi kui kallis?Arndt-Kalju, Margit; Kirikal, Siiri; Skuin, Mari; Tarkmeel, Krõõtdelfi.ee2023 Milline pann osta? Kas odav pann teeb töö ära sama hästi kui kallis?

artikkel ajalehes

387

artikkel kogumikus

Minimization of the high-level fault model for microprocessor control parts [Online resource]Ubar, Raimund-Johannes; Oyeniran, Adeboye Stephen; Medaiyese, OlusijiBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p.: ill https://doi.org/10.1109/BEC.2018.8600980

artikkel kogumikus

388

artikkel ajalehes

Mis on head ja halba Bioestis? : [prof. Anti Viikna TTÜ teadlaste korraldatud testist]Viikna, Anti; Luts, EvaPostimees1996 / 12. nov., Kasu, lk. 3

artikkel ajalehes

389

artikkel kogumikus

Mixed bottom-up/top-down hierarchical test generation for digital systemsUbar, Raimund-JohannesProceedings of the 9th European Workshop on Dependable Computing, Gdansk, Poland, May 14-16, 19981998 / p. 37-40

artikkel kogumikus

390

artikkel kogumikus

Mixed-level defect simulation in data-paths of digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, Marina23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 617-620 : ill https://ieeexplore.ieee.org/document/1003333

artikkel kogumikus

391

artikkel kogumikus EST / artikkel kogumikus ENG

Model based approach for testing: distributed real-time systems augmented with online monitorsPal, Deepak; Vain, JüriDatabases and Information Systems : 13th International Baltic Conference, DB&IS 2018, Trakai, Lithuania, July 1-4, 2018 : proceedings2018 / p. 142-157 https://doi.org/10.1007/978-3-319-97571-9_13 Conference proceedings at Scopus Article at Scopus

artikkel kogumikus EST / artikkel kogumikus ENG

392

artikkel kogumikus

Model based framework for testing distributed systemsPal, Deepak; Vain, JüriProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 91-94 : ill

artikkel kogumikus

393

artikkel kogumikus

Model based testing of distributed time critical systemsVain, Jüri; Kanter, Gert; Srinivasan, Seshadhri2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO 2017) : Noida, India 20-22 September 20172017 / p. 99-105 : ill https://doi.org/10.1109/ICRITO.2017.8342406

artikkel kogumikus

394

artikkel kogumikus

Model driven engineering in automatic test generationDomiczi, E.; Vain, JüriProceedings of the NWUML'2005 : The Nordic Workshop on UML and Software Modeling2005 / p. 208-216

artikkel kogumikus

395

artikkel kogumikus

Model of fracture micromechanism of Cu-Cr-Zr system by "in-situ" test in SEMBesterci, Michal; Ivan, Jozef; Kulu, Priit; Arensburger, Daniil; Velgosova, OksanaProceedings of 9th International Scientific Conference "Adhievements in Mechanical & Materials Engineering" : Gliwice, Poland, 11.-14.10.20002000 / p. 59-62 https://doiserbia.nb.rs/img/doi/1450-5339/2003/1450-53390304499B.pdf

artikkel kogumikus

396

dissertatsioon

Model synthesis from VHDL for the functional test generation systemKrupnova, Helena1993 https://www.ester.ee/record=b2090509*est

dissertatsioon

397

artikkel kogumikus

Model-based integration testing of ROS packages : a mobile robot case studyErnits, Juhan-Peep; Halling, Evelin; Kanter, Gert; Vain, Jüri2015 European Conference on Mobile Robots : Lincoln, United Kingdom, September 2-4, 2015 : conference proceedings2015 / [7] p. : ill http://dx.doi.org/10.1109/ECMR.2015.7324210

artikkel kogumikus

398

artikkel kogumikus

Model-based synthesis of reactive planning on-line testers for non-deterministic embedded systemsKääramees, Marko; Vain, Jüri; Raiend, KulloBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 189-192 : ill

artikkel kogumikus

399

dissertatsioon

Model-based testing framework for autonomous multi-robot systems = Mudelipõhine testimisraamistik autonoomsetele multirobotsüsteemideleKanter, Gert2020 https://digikogu.taltech.ee/et/Item/575133f2-f94a-49d4-a7c9-0615b54ae139 https://doi.org/10.23658/taltech.19/2020

dissertatsioon

400

artikkel kogumikus

Model-based testing of a web-based positioning applicationRoo, Rivo; Ernits, Juhan-Peep20th Nordic Workshop on Programming Theory : NWPT 2008 : Tallinn, Estonia, 19-21 November 2008 : abstracts2008 / p. 75-77 : ill https://link.springer.com/chapter/10.1007/978-3-642-05031-2_14

artikkel kogumikus

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