Otsing - TalTech teadusportaal

kuva

reasta

501

artikkel ajalehes

Robot reducing mining industry's environmental impact tested in Estonianews.err.ee2023 Robot reducing mining industry's environmental impact tested in Estonia

artikkel ajalehes

502

artikkel ajakirjas

Role of experimental damage mechanics for the circular economy implementation in cotton industriesHussein, Abrar; Abbas, Muhammad MujtabaJournal of Modern Nanotechnology2021 / 9 p https://doi.org/10.53964/jmn.2021004

artikkel ajakirjas

503

artikkel kogumikus

RT-level identification of potentially testable initialization faultsRaik, Jaan; Fujiwara, Hideo; Krivenko, AnnaThe Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan2008 / [6] p https://www.researchgate.net/publication/234032548_RT-level_identification_of_potentially_testable_initialization_faults

artikkel kogumikus

504

artikkel kogumikus

RT-level test point insertion for sequential circuitsRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings2004 / p. 34-40 : ill https://ieeexplore.ieee.org/document/1428412

artikkel kogumikus

505

artikkel kogumikus

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 385-392 : ill https://doi.org/10.1109/AUTEST.2016.7589627

artikkel kogumikus

506

artikkel ajakirjas

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE instrumentation & measurement magazine2017 / p. 23-30 : ill https://doi.org/10.1109/MIM.2017.8006390

artikkel ajakirjas

507

artikkel ajakirjas EST / artikkel ajakirjas ENG

Safeguarding female reproductive health against endocrine disrupting chemicals-The FREIA projectDuursen, Majorie B.M. van; Boberg, Julie; Christiansen, Sofie; Jääger, Kersti; Salumets, Andres; Velthut-Meikas, AgneInternational journal of molecular sciences2020 / art. 3215 https://doi.org/10.3390/ijms21093215 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

508

artikkel kogumikus

A scalable technique to identify true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, JaanProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 152-157 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

artikkel kogumikus

509

dissertatsioon

Scenario oriented model-based testing = Stsenaariumjuhitud mudelipõhine testimineHalling, Evelin2019 https://digi.lib.ttu.ee/i/?11943

dissertatsioon

510

artikkel kogumikus

Scenario-based Validation for Autonomous Vehicles with Different Fidelity LevelsMalayjerdi, Mohsen; Kaljavesi, Gemb; Diermeyer, Frank; Sell, Raivo2023 IEEE Conference on Intelligent Transportation Systems (ITSC 2023)2023 / 6 p https://doi.org/10.1109/ITSC57777.2023.10422403

artikkel kogumikus

511

dissertatsioon

Scenario-based validation of safety and performance of an autonomous vehicle by a software in loop simulation method = Autonoomse sõiduki ohutuse ja jõudluse stsenaariumipõhine valideerimine tsüklisimulatsiooni meetodi abilMalayjerdi, Mohsen2023 https://doi.org/10.23658/taltech.43/2023 https://digikogu.taltech.ee/et/Item/5d3435ba-8ce1-4da6-8d16-4b279e88c861 https://www.ester.ee/record=b5574240*est

dissertatsioon

Seotud publikatsioonid 5

512

artikkel ajakirjas

Second IEEE East-West Design and Test WorkshopHahanov, Vladimir; Ubar, Raimund-JohannesIEEE journal of design & test of computers2004 / p. 594

artikkel ajakirjas

513

dissertatsioon

Selected issues of modeling, verification and testing of digital systemsJutman, Artur2004 https://www.ester.ee/record=b1989760*est

dissertatsioon

514

dissertatsioon

Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemidKostin, Sergei2012 https://www.ester.ee/record=b2757857*est

dissertatsioon

515

artikkel ajalehes

Self-driving bus to be tested in Mustamäe this summer [online resource]news.err.ee2021 "Self-driving bus to be tested in Mustamäe this summer "

artikkel ajalehes

516

artikkel kogumikus

Self-learning tool for digital testUbar, Raimund-Johannes; Orasson, Elmet; Evartson, TeetProceedings of 2nd International Conference "Distance Learning - Educational Sphere of the XXI Century"2002 / p. 36-38 : ill

artikkel kogumikus

517

artikkel kogumikus

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

artikkel kogumikus

518

artikkel kogumikus

Sequential circuit test generation using decision diagram modelsRaik, Jaan; Ubar, Raimund-JohannesDesign, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings1999 / p. 736-740: ill https://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/1999/date99/pdffiles/11e_1.pdf

artikkel kogumikus

519

artikkel kogumikus

Sequential circuits BIST synthesis from signal specificationsRaik, Jaan; Jenihhin, Maksim; Adelbert, RainProceedings 23rd NORCHIP Conference : Oulu, Finland, 21-22 November 20052005 / p. 196-199 : ill https://ieeexplore.ieee.org/document/1597023

artikkel kogumikus

520

artikkel kogumikus

Sequential circuits BIST with status bit controlRaik, Jaan; Orasson, Elmet; Ubar, Raimund-JohannesProceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 20042004 / p. 507-510 : ill https://pld.ttu.ee/~raiub/files/aaaaa_pulk/MIXDES/jaan.pdf

artikkel kogumikus

521

artikkel kogumikus

Sequential test set compaction in LFSR reseedingJutman, Artur; Aleksejev, Igor; Raik, JaanDesign and test technology for dependable systems-on-chip2011 / p. 476-493 : ill https://ieeexplore.ieee.org/document/4738292

artikkel kogumikus

522

artikkel kogumikus

A set of tools for estimating quality of built-in self-test in digital circuitsJervan, Gert; Markus, Antti; Paomets, Priidu; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the International Symposium on Signals, Circuits and Systems, Iasi (Romania), October 2-3, 19971997 / p. 362-365

artikkel kogumikus

523

artikkel kogumikus

Shift register based TPG for at-speed interconnect BISTJutman, ArturMIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 22004 / p. 751-754 : ill https://ieeexplore.ieee.org/document/1314941?signout=success

artikkel kogumikus

524

artikkel kogumikus

Simulation and automated test development system for digital devicesBirger, AlexanderBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 293-295

artikkel kogumikus

525

artikkel ajakirjas

Simulation of wear in a rolling-sliding contact by a semi-Winkler model and the Archard's wear lawTelliskivi, TanelWear2004 / 7/8, p. 817-831 : ill https://www.sciencedirect.com/science/article/abs/pii/S0043164803005246

artikkel ajakirjas

testimine (märksõna)

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