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301

artikkel kogumikus

Hybrid BIST optimization using reseeding and test set compactionJervan, Gert; Orasson, Elmet; Kruus, Helena; Ubar, Raimund-Johannes10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 596-603 : ill http://dx.doi.org/10.1109/DSD.2007.4341529

artikkel kogumikus

302

artikkel ajakirjas

Hybrid BIST optimization using reseeding and test set compactionJervan, Gert; Orasson, Elmet; Kruus, Helena; Ubar, Raimund-JohannesMicroprocessors and microsystems2008 / 5/6, p. 254-262 : ill https://www.sciencedirect.com/science/article/abs/pii/S0141933108000288

artikkel ajakirjas

303

artikkel kogumikus

Hybrid BIST scheduling for NoC-based SoCsJervan, Gert; Shchenova, Tatjana; Ubar, Raimund-JohannesProceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 20062006 / p. 141-144 : ill https://ieeexplore.ieee.org/document/4126966

artikkel kogumikus

304

artikkel kogumikus

Hybrid BIST time minimization for core-based systems with STUMPS architectureJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, Maksim18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 November 2003, Boston, Massachusetts : proceedings2003 / p. 225-232 : ill https://ieeexplore.ieee.org/document/1250116

artikkel kogumikus

305

dissertatsioon

Hybrid built-in self-test : methods and tools for analysis and optimization of BIST = Sisseehitatud hübriidne isetestimine : meetodid ja vahendid analüüsiks ning optimeerimiseksOrasson, Elmet2007 https://www.ester.ee/record=b2305436*est

dissertatsioon

306

raamat

Hybrid built-in self-test and test generation techniques for digital systemsJervan, Gert2005 https://www.ester.ee/record=b2177537*est

raamat

307

artikkel kogumikus

Hybrid functional BIST for digital systemsMazurova, Natalja; Smahtina, Julia; Ubar, Raimund-JohannesBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 205-208 : ill

artikkel kogumikus

308

artikkel kogumikus

Hydraulic conductivity testing method for all-in aggregates and mining waste materialsŠommet, Julija; Pastarus, Jüri-Rivaldo; Sabanov, Sergei10th International Symposium "Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 10-15, 20112011 / p. 122-126 : ill

artikkel kogumikus

309

artikkel kogumikus

HyFBIST : hybrid functional built-in self-test in microprogrammed data-paths of digital systemsUbar, Raimund-Johannes; Mazurova, Natalja; Smahtina, Julia; Orasson, Elmet; Raik, JaanProceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 20042004 / p. 497-502 : ill

artikkel kogumikus

310

artikkel ajakirjas

Hygrothermal calculations and laboratory tests on timber-framed wall structuresKalamees, Targo; Vinha, JuhaBuilding and environment2003 / 5, p. 689-697 : ill https://www.sciencedirect.com/science/article/pii/S036013230200207X

artikkel ajakirjas

311

artikkel kogumikus EST / artikkel kogumikus ENG

IEEE European Test Symposium (ETS)Eggersgluss, Stephan; Hamdioui, Said; Jutman, Artur; Michael, Maria K.; Raik, Jaan2019 IEEE International Test Conference (ITC)2019 / 4 p https://doi.org/10.1109/ITC44170.2019.9000148 Conference proceeding at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

312

artikkel kogumikus

IEEE P1687 IJTAG demonstrator on FPGAShibin, Konstantin; Aleksejev, Igor; Jutman, Artur; Devadze, SergeiDATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 20122012 / 1 p. : ill https://www.academia.edu/22101517/IEEE_P1687_IJTAG_demonstrator_on_FPGA

artikkel kogumikus

313

artikkel kogumikus

IF filter design for satellite TV FM video modulatorKinks, Priit; Laidvee, Andres; Taklaja, AndresBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 367-370: ill

artikkel kogumikus

314

artikkel kogumikus

Impact of small specimens sampling on durability of in-service power plant componentsKlevtsov, Ivan; Dedov, Andrei; Bogoljubova, ElenaConference Proceedings : 2nd International Conference SSTT : Determination of mechanical properties of materials by small punch and other miniature testing techniques2012 / p. 373-378

artikkel kogumikus

315

artikkel kogumikus

Impact wear tester for the s[t]udy of abrasive erosion and milling processesTarbe, Riho; Kulu, PriitProceedings of the 6th International Conference of DAAAM Baltic "Industrial Engineering" : 24-26th April 2008, Tallinn, Estonia. [2]2008 / p. 561-566 : ill http://innomet.ttu.ee/daaam08/online/Materials%20Engineering/Tarbe-rev.pdf

artikkel kogumikus

316

artikkel kogumikus

Implementation-independent functional test for transition delay faults in microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia2020 / p. 646-650 https://doi.org/10.1109/DSD51259.2020.00105

artikkel kogumikus

317

artikkel kogumikus

Implementation-independent functional test generation for RISC microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 82-87 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920323

artikkel kogumikus

318

artikkel kogumikus

An improved estimation methodology for hybrid BIST cost calculationJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Korelina, OlgaProceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 20042004 / p. 297-300 : ill https://ieeexplore.ieee.org/document/1423882

artikkel kogumikus

319

artikkel kogumikus

An improved estimation technique for hybrid BIST test set generationJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Korelina, OlgaDDECS : 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 13-16, 2005, Sopron, Hungary : proceedings2005 / p. 182-185 : ill https://www.ida.liu.se/labs/eslab/publications/pap/db/ddecs05.pdf

artikkel kogumikus

320

artikkel kogumikus

Improved modeling of audio signals by modifying transient locationsVafin, Renat; Heusdens, Richard; Par, Steven van de; Kleijn, W. BastiaanProceedings of the 2001 IEEE Workshop on Applications of Signal Processing to Audio and Acoustics : October 21-24,2001, Mohonk Mountain House, New Paltz, New York, USA2001 / p. 143-143 : ill https://ieeexplore.ieee.org/document/969563

artikkel kogumikus

321

artikkel kogumikus

Improving embedded software testingSavimaa, RaulSCI 2004 : the 8th World Multi-Conference on Systemics, Cybernetics and Informatics : July 18-21, 2004, Orlando, Florida, USA. Volume 1, Information Systems, Technologies and Applications : proceedings2004 / p. 270-274

artikkel kogumikus

322

artikkel kogumikus EST / artikkel kogumikus ENG

Inductive and coinductive predicate liftings for effectful programsVeltri, Niccolò; Voorneveld, Niels F.W.Proceedings 37th Conference on Mathematical Foundations of Programming SemanticsHybrid: Salzburg, Austria and Online, 30th August - 2nd September, 20212021 / p. 260-277 https://doi.org/10.4204/EPTCS.351.16 Conference proceeding at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

323

artikkel kogumikus

Instrument-free Lab-on-a-Chip DNA amplification test for pathogen detection [Online resource]Pardy, Tamas; Rang, Toomas; Kremer, Clemens; Tulp, IndrekBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p. : ill https://doi.org/10.1109/BEC.2018.8600991

artikkel kogumikus

324

artikkel kogumikus

Integrated design and test generation under Internet based environment MOSCITOSchneider, Andre; Ivask, Eero; Ubar, Raimund-JohannesEuromicro Symposium on Digital System Design : Architectures, Methods and Tools : September 4-6, 2002, Dortmund, Germany : proceedings2002 / p. 187-194 : ill http://dx.doi.org/10.1109/DSD.2002.1115368

artikkel kogumikus

325

artikkel ajakirjas EST / artikkel ajakirjas ENG

Integrated self-regulating resistive heating for isothermal nucleic acid amplification tests (NAAT) in Lab-on-a-Chip (LoC) devicesPardy, Tamas; Tulp, Indrek; Kremer, Clemens; Rang, Toomas; Stewart, RayPLoS ONE2017 / p. 1-11 : ill https://doi.org/10.1371/journal.pone.0189968 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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