Otsing - TalTech teadusportaal

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26

artikkel kogumikus

Evaluation of dual-active bridge converter for DC energy buildingsCarvalho da Silva, Edivan Laercio; Blinov, Andrei; Sidorova, Aleksandra; Chub, Andrii; Vinnikov, Dmitri2023 IEEE 17th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)2023 / 6 p https://doi.org/10.1109/CPE-POWERENG58103.2023.10227460

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artikkel ajakirjas

Evaluation of equivalent cirquit diagrams and transfer functions for modeling of lithium-ion batteriesRahmoun, Ahmad; Biechl, Helmuth; Rosin, ArgoScientific Journal of Riga Technical University. Electrical, control and communication engineering2013 / p. 34-39 : ill

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artikkel kogumikus

Exact static compaction of independent test sequencesRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 315-318 : ill

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artikkel kogumikus

Fast static compaction of tests composed of independent sequences : basic properties and comparison of methodsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesThe 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II2002 / p. 445-448 : ill http://dx.doi.org/10.1109/ICECS.2002.1046190 https://ieeexplore.ieee.org/document/1046190

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30

artikkel ajakirjas

Fast test pattern generation for sequential circuits using decision diagram representationsRaik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2000 / 3, p. 213-226 : ill https://link.springer.com/article/10.1023/A:1008335130158

artikkel ajakirjas

31

artikkel kogumikus

Fault oriented test pattern generation for sequential circuits using genetic algorithmsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 319-320

artikkel kogumikus

32

raamat

Fourier' rida : metoodiline juhend raadiotehiliste ahelate ja signaalide laboratoorse töö sooritamiseks1984 https://www.ester.ee/record=b1245512*est

raamat

33

artikkel kogumikus

Fractional order model identification of receptor-ligand complexes formation by equivalent electrical circuit modelingAtes, Abdullah; Alagoz, Baris Baykant; Tepljakov, Aleksei; Petlenkov, Eduard2019 International Artificial Intelligence and Data Processing Symposium (IDAP)2019 / 5 p. : ill https://doi.org/10.1109/IDAP.2019.8875913

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artikkel kogumikus

Heartwork analysis using bioimpedance methodGordon, RaunoTelekommunikatsioon 2002 : IX rahvusvahelise telekommunikatsioonipäeva materjalid2002 / lk. 8-14 : ill

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artikkel kogumikus

Hierarchical defect-oriented fault simulation for digital circuitsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 151-156 https://ieeexplore.ieee.org/document/873781

artikkel kogumikus

36

artikkel ajakirjas

Hierarchical physical defect reasoning in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Brik, MarinaEstonian journal of engineering2011 / 3, p. 185-200

artikkel ajakirjas

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artikkel ajakirjas

Hierarchical test generation for combinational circuits with real defects coverageCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics reliability2002 / p. 1141-1149 : ill https://www.sciencedirect.com/science/article/pii/S002627140200080X

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38

artikkel kogumikus

Hierarchical timing-critical paths analysis in sequential circuitsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan; Devadze, Sergei; Kostin, Sergei2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS 2018) : 2 – 4 July 2018, Spain2018 / 6 p. : ill https://doi.org/10.1109/PATMOS.2018.8464176

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artikkel kogumikus

Homological modelling of the electric circuitsPaal, Eugen; Umbleja, MärtModuli Operads Dynamics II2014

artikkel kogumikus

40

artikkel kogumikus

How to prove that a circuit is fault-free?Ubar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings : 15th Euromicro Conference on Digital System Design DSD 2012 : 5-8 September 2012, Cesme, Izmir, Turkey2012 / p. 427-430 : ill https://www.researchgate.net/publication/262271409_How_to_Prove_that_a_Circuit_is_Fault-Free

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41

artikkel kogumikus

Identifying NBTI-critical paths in nanoscale logicUbar, Raimund-Johannes; Vargas, Fabian; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei; Bolzani Poehls, Leticia16th Euromicro Conference series on Digital System Design : DSD 2013 : proceedings : 4-6 September 2013, Santander, Spain2013 / p. 136-141 : ill

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artikkel kogumikus

Impedance network impact on the controller design of the QZSI for PV applicationsLiu, Wenjie; Yang, Yongheng; Kerekes, Tamas; Liivik, Elizaveta; Blaabjerg, Frede2020 IEEE 21st Workshop on Control and Modeling for Power Electronics (COMPEL), Aalborg, Denmark, November 9-12, 20202020 / 6 p https://doi.org/10.1109/COMPEL49091.2020.9265708

artikkel kogumikus

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artikkel ajakirjas EST / artikkel ajakirjas ENG

Improved fractional open circuit voltage MPPT methods for PV systemsBaimel, Dmitry; Tapuchi, Saad; Levron, Yoash; Belikov, JuriElectronics2019 / art. 321 https://doi.org/10.3390/electronics8030321 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

44

artikkel ajakirjas

Interaction in power source, load and electrical circuits. Part IJärvik, JaanJournal of international scientific publications : materials, methods & technologies2010 / 2, p. 512-521 : ill

artikkel ajakirjas

45

artikkel kogumikus

ISTOC-2D: system of mixed device-circuit modeling for personal computerPhilatov, N.I.; Nakropin, B.O.; Yakovlev, D.G.Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section S / Tallinn Technical University1992 / p. 95-100: ill

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46

artikkel ajakirjas

Kolmas vaatus - elektronide gümnastika "vedrudel" : ehitame arvutisse sobiva retrohõngulise nivooindikaatoriSinivee, VeljoHorisont2008 / 3, lk. 52-53 : ill http://parsek.yf.ttu.ee/~felc/horisont/elektro3.pdf

artikkel ajakirjas

47

artikkel kogumikus

Large time-step integration method for modeling of oscillating circuitsKukk, VelloProc. IEEE International Symposium on Circuits and Systems2000 / [4] p. [CD-ROM] https://ieeexplore.ieee.org/document/857379

artikkel kogumikus

48

dissertatsioon

LC circuit with parallel and series resonance alternation in switch-mode converters = Paralleel- ja järjestikresonantsi vaheldumisega LC ahel lülitussageduslikes muunduritesŠklovski, Jevgeni2007 https://www.ester.ee/record=b2238343*est

dissertatsioon

49

raamat

Madalpingelised elektripaigaldised. Osa 5-557, Elektriseadmete valik ja paigaldamine. Abiahelad [Võrguteavik] = Low-voltage electrical installations. Part 5-557, Selection and erection of electrical equipment. Auxiliary circuits (IEC 60364-5-55:2011/A1:2012 (Clause 557))2016 http://www.ester.ee/record=b4579708*est

raamat

50

raamat

Madalpingelised elektripaigaldised. Osa 5-557, Elektriseadmete valik ja paigaldamine. Abiahelad [Võrguteavik] = Low-voltage electrical installations. Part 5-557, Selection and erection of electrical equipment. Auxiliary circuits (IEC 60364-5-55:2011/A1:2012 (Clause 557))2015

raamat

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