Otsing - TalTech teadusportaal

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101

raamat

Raadiotehnilised ahelad : õppeabimaterjal. 2, Harmooniliste signaalide genereerimineHeinrichsen, Vladimir1974 https://www.ester.ee/record=b1294101*est

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102

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Raadiotehnilised ahelad ja signaalidHeinrichsen, Vladimir1991 https://www.ester.ee/record=b1450227*est

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103

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Raadiotehnilised ahelad ja signaalidHeinrichsen, Vladimir1991 https://www.ester.ee/record=b1191459*est

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104

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Raadiotehnilised ahelad ja signaalidHeinrichsen, Vladimir; Ratassepp, Jaak1991 https://www.ester.ee/record=b1164574*est

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105

artikkel kogumikus

Raadiotehniliste ahelate ja signaalide kursuse põhijooniHeinrichsen, Vladimir; Martverk, PeepÕppemetoodika küsimusi ; 121975 / lk. 40-44 https://www.ester.ee/record=b1346720*est

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106

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RC-ostsillaator : metoodiline juhend raadiotehniliste ahelate ja signaalide laboratoorse töö sooritamiseks1984 https://www.ester.ee/record=b1245517*est

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107

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RC-осциллятор : методическое пособие к лабораторной работе по курсу "Радиотехнические цепи и сигналы"1988 https://www.ester.ee/record=b1232560*est

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108

artikkel ajakirjas EST / artikkel ajakirjas ENG

Reactive power injection capability of buck-boost inverter with unfolding circuitRoncero-Clemente, Carlos; Husev, Oleksandr; Matiushkin, Oleksandr; Vinnikov, Dmitri; Blaabjerg, FredeIEEE transactions on power electronics2022 / p. 11876-11886 https://doi.org/10.1109/TPEL.2022.3179784 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

109

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Removing design errors from digital circuitsUbar, Raimund-JohannesProc. of the 4th International Conference on New Information Technologies. Vol. 12000 / p. 118-125

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110

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Research and training environment for digital design and testUbar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of the Eighth IASTED International Conference on Computers and Advanced Technology in Education : August 29-31, 2005, Oranjestad, Aruba2005 / p. 232-237 : ill https://ieeexplore.ieee.org/document/1408779

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111

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RT-level test point insertion for sequential circuitsRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings2004 / p. 34-40 : ill https://ieeexplore.ieee.org/document/1428412

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112

artikkel kogumikus

Sequential circuit test generation using decision diagram modelsRaik, Jaan; Ubar, Raimund-JohannesDesign, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings1999 / p. 736-740: ill https://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/1999/date99/pdffiles/11e_1.pdf

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113

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Sequential circuits BIST synthesis from signal specificationsRaik, Jaan; Jenihhin, Maksim; Adelbert, RainProceedings 23rd NORCHIP Conference : Oulu, Finland, 21-22 November 20052005 / p. 196-199 : ill https://ieeexplore.ieee.org/document/1597023

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114

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Sequential circuits BIST with status bit controlRaik, Jaan; Orasson, Elmet; Ubar, Raimund-JohannesProceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 20042004 / p. 507-510 : ill https://pld.ttu.ee/~raiub/files/aaaaa_pulk/MIXDES/jaan.pdf

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115

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A set of tools for estimating quality of built-in self-test in digital circuitsJervan, Gert; Markus, Antti; Paomets, Priidu; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the International Symposium on Signals, Circuits and Systems, Iasi (Romania), October 2-3, 19971997 / p. 362-365

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116

raamat

Sisemise tagasisidega ostsillaator : metoodiline juhend raadiotehniliste ahelate ja signaalide laboratoorse töö sooritamiseks1984 https://www.ester.ee/record=b1245521*est

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117

artikkel kogumikus

SPADE как инструментальная система для разработки пакетов программ проектирования электронных схемVendelin, JelenaАнализ и синтез сложных систем и цепей с помощью ЭВМ1985 / с. 69-77

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118

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SSBDDs and double topology for multiple fault reasoningUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 20122012 / p. 23-28 https://www.semanticscholar.org/paper/SSBDDs-and-Double-Topology-for-Multiple-Fault-Ubar-Kostin/8ba04611a41768f0c277a4ba46ca666132fc2f65

artikkel kogumikus

119

artikkel kogumikus

Structurally synthesized multiple input BDDs for speeding up logic-level simulation of digital circuitsMironov, Dmitri; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, Artur13th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : DSD 2010 : Lille, France, 1-3 September 2010 : proceedings2010 / p. 658-663 : ill https://ieeexplore.ieee.org/document/5615526

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120

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Survey of harmonic emission of electrical vehicle chargers in the European marketCollin, A. J.; Xu, Xiao; Djokic, S. Z.; Möller, F.; Meyer, Jan; Kütt, Lauri; Lehtonen, MattiSPEEDAM 2016 - proceedings : International Symposium on Power Electronics, Electrical Drives, Automation and Motion : Capri (Italy), 22nd-24th June 20162016 / p. 1208-1213 : ill https://doi.org/10.1109/SPEEDAM.2016.7526005

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121

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Synthesis and implementation of hierarchical finite state machines with implicit modulesSklyarov, Valery; Skliarova, Iouliia; Mihhailov, Dmitri; Sudnitsõn, Aleksander2010 International Conference on Reconfigurable Computing and FPGAs (ReConFig 2010) : Cancun, Mexico, December 13-15, 20102010 / p. 436-441 : ill https://www.researchgate.net/publication/221437255_Synthesis_and_Implementation_of_Hierarchical_Finite_State_Machines_with_Implicit_Modules

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122

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Test pattern generation at the behavioral level from VHDL circuit description containing several processesGramatova, Elena; Bezakova, Jana; Cibakova, TatianaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 145-148

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123

artikkel kogumikus

Towards artificial intelligence based automatic adaptive response analyzer for high frequency analog BISTPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesCIMSA 2008 : IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : Istanbul, Turky, July 14-16, 20082008 / p. 99-104 : ill https://ieeexplore.ieee.org/document/4595841

artikkel kogumikus

124

raamat

Схемы замещения индуктивно связанных цепей и их параметрыVoldek, Aleksander1952 https://www.ester.ee/record=b1397542*est https://digikogu.taltech.ee/et/Item/348d194d-2234-4202-830c-e6e6f8bc89b8

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125

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2023 IEEE Nordic Circuits and Systems Conference (NORCAS) : 31 October-November 1, 2023 Aalborg, Denmark : proceedings in IEEE Xplore2023 https://researchr.org/publication/norcas-2023

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