Otsing - TalTech teadusportaal

Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English

Publikatsioonid

Publikatsioonid

Otsing

Valitud kirjed 0

critical path identification (võtmesõna)

—

—

—

—

Lisa tingimus Liitotsing filter

Tühista

teaviku laadid

raamat ..

artikkel ajakirjas ..

artikkel ajalehes ..

artikkel kogumikus ..

dissertatsioon ..

Open Access ..

Teaduspublikatsioon ..

aasta

Toon andmeid..

Toon andmeid..

TTÜ struktuuriüksus

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Tühista

Kirjeid leitud 4
Vaata veel.. (1/126)
Ekspordi

ekspordi kõik päringu tulemused (4)
Salvesta TXT fail

prindi
Märgitud kirjetega toimetamiseks ava valitud kirjed

kuva

reasta
1

artikkel kogumikus

Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

artikkel kogumikus
2

artikkel ajakirjas EST / artikkel ajakirjas ENG

Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuitsJenihhin, Maksim; Squillero, Giovanni; Tihhomirov, Valentin; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2016 / p. 273-289 : ill https://doi.org/10.1007/s10836-016-5589-x Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG
3

artikkel kogumikus

Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPGPalermo, N.; Tihhomirov, Valentin; Copetti, Thiago; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102405

artikkel kogumikus
4

artikkel kogumikus EST / artikkel kogumikus ENG

Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programsPellerey, Francesco; Jenihhin, Maksim; Squillero, Giovanni; Raik, Jaan; Sonza Reorda, Matteo; Tihhomirov, Valentin; Ubar, Raimund-Johannes2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan2016 / p. 304-309 : ill https://doi.org/10.1109/ATS.2016.57 Conference Proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

Kirjeid leitud 4, kuvan 1 - 4

1. critical path identification
2. critical path
3. critical path fault tracing
4. critical path method
5. critical path tracing
6. fault simulation with critical path tracing
7. NBTI-critical path
8. Parallel Fault Simulation with Critical Path Backtracing
9. timing-critical path
10. path identification
11. critical area identification
12. control and data path tests
13. deformation path
14. development path
15. feasible path generation
16. Growth path
17. helical path separation
18. human path rehabilitation
19. mean free path
20. minimal path
21. multi-path
22. NBTI-induced path delay estimation
23. path analyses
24. path dependency
25. path loss model
26. path planning
27. reaction path
28. shortest path
29. shortest-path
30. test path synthesis
31. tracking path
32. anatase critical particle size
33. critical communication
34. critical communications
35. critical computing
36. critical contextual empiricism
37. critical control points
38. critical data studies
39. critical disclosure analysis
40. critical discourse analysis
41. critical elements
42. Critical employees
43. critical evaluation
44. critical frequencies
45. critical health conditions
46. critical information infrastructure
47. critical infrastructure
48. critical infrastructure management
49. critical infrastructure protection
50. critical infrastructures
51. critical laboratory results
52. critical metals
53. critical micelle concentration
54. critical nodes
55. critical political economy
56. critical psychology
57. critical ratsionalism
58. Critical Raw Materials
59. Critical realism
60. critical research
61. critical review
62. critical Reynolds number
63. critical situations
64. critical success factors
65. critical success factors (CSF)
66. critical theory of technology
67. critical thinking
68. critical thinking in IT
69. critical-sized bone defects
70. critical-sized defects
71. lifecritical services
72. minor critical metals
73. mixed-critical system
74. NBTI-critical gate
75. optimized routing approach for critical and emergency networks
76. optimized routing approach for critical and emergency networks simulations
77. safety critical systems
78. safety-critical
79. safety-critical applications
80. safety-critical system
81. timing-critical paths
82. Automatic identification system
83. automatic identification system (AIS)
84. Autonomous Identification System (AIS)
85. brand community identification
86. brand identification
87. brand origin identification
88. change point identification
89. closed-loop identification
90. defect identification
91. digital identification
92. electronic identification
93. eyewitness identification
94. identification
95. identification cards
96. identification of military objects
97. identification of unbalance voltage source
98. identification of voltage unbalance sources
99. identification patterns
100. identification problems
101. identification via heteroskedasticity
102. language identification
103. medicinal product identification
104. message identification
105. metaverse identification
106. model identification
107. mould identification
108. nonlinear model identification
109. parameter identification
110. patient identification techniques
111. phase identification
112. radio frequency identification
113. root identification
114. Satellite Autonomous Identification System (SAIS)
115. seismic signal identification
116. self-identification
117. speaker identification
118. species identification
119. structural identification
120. sustem identification
121. system identification
122. taxonomical identification
123. thermal behavior identification
124. threat identification
125. vehicle identification
126. yeast identification

vaste

reasta

Otsing
Valikud 0

ilmumisaasta

autor

TTÜ struktuuriüksus

märksõna

seeria-sari

tema kohta

võtmesõna

TalTech Raamatukogu

Akadeemia tee 1

13519

TalTech koduleht TalTech Raamatukogu koduleht Digikogu Digiteek Teadusandmed

6203551

data@taltech.ee

TalTech Raamatukogu