Otsing - TalTech teadusportaal

kuva

reasta

301

artikkel kogumikus

RT-level test point insertion for sequential circuitsRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings2004 / p. 34-40 : ill https://ieeexplore.ieee.org/document/1428412

artikkel kogumikus

302

dissertatsioon

110 kV õhuliinide isolatsiooni töökindluse analüüs ja töökindluse tõstmise meetodid = The study of 110 kV power grid reliability and the measures to decrease insulation failureTaklaja, Paul2012 http://www.ester.ee/record=b2857612*est

dissertatsioon

303

artikkel ajakirjas

SALSy : security-aware layout synthesisEslami, Mohammad; Perez, Tiago Diadami; Pagliarini, Samuel NascimentoarXiv.org2024 / 13 p. : ill https://doi.org/10.48550/arXiv.2308.06201

artikkel ajakirjas

Seotud publikatsioonid 1

On the use of defensive schemes for hardware security = Kaitseskeemid riistvara turvalisuse tagamiseks

304

artikkel kogumikus

Scalable algorithm for structural fault collapsing in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea2015 / p. 171-176 : ill

artikkel kogumikus

305

artikkel kogumikus

A scalable technique to identify true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, JaanProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 152-157 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

artikkel kogumikus

306

dissertatsioon

Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemidKostin, Sergei2012 https://www.ester.ee/record=b2757857*est

dissertatsioon

307

artikkel kogumikus

Sequential test set compaction in LFSR reseedingJutman, Artur; Aleksejev, Igor; Raik, JaanDesign and test technology for dependable systems-on-chip2011 / p. 476-493 : ill https://ieeexplore.ieee.org/document/4738292

artikkel kogumikus

308

artikkel kogumikus

7-valued algebra for transition delay fault analysisKõusaar, Jaak; Ubar, Raimund-JohannesBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 89-92 : ill

artikkel kogumikus

309

artikkel kogumikus

Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Raik, Jaan2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway2015 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2015.7364406

artikkel kogumikus

310

artikkel kogumikus

Shift register based TPG for at-speed interconnect BISTJutman, ArturMIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 22004 / p. 751-754 : ill https://ieeexplore.ieee.org/document/1314941?signout=success

artikkel kogumikus

311

artikkel ajakirjas

Short-circuit protection circuits for silicon-carbide power transistorsSadik, Diane-Perle; Colmenares, Juan; Tolstoy, Georg; Rabkowski, JacekIEEE transactions on industrial electronics2016 / p. 1995-2004 : ill https://doi.org/10.1109/TIE.2015.2506628

artikkel ajakirjas

312

artikkel kogumikus

Signal processing and machine learning techniques for predictive maintenance of rotor bars in induction machineKudelina, Karolina; Raja, Hadi Ashraf; Rjabtšikov, Viktor; Naseer, Muhammad Usman; Vaimann, Toomas; Kallaste, Ants2023 International Conference on Electrical Drives and Power Electronics (EDPE)2023 / 7 p. : ill https://doi.org/10.1109/EDPE58625.2023.10274030

artikkel kogumikus

Seotud publikatsioonid 1

Artificial intelligence driven approaches for fault prognostics of electrical machines using vibration spectrum analysis = Tehisintellektil põhinevad lähenemisviisid elektrimasinate rikete prognoosimiseks vibratsioonispektri analüüsi abil

313

artikkel ajakirjas

Simple relationship between the breakdown voltage, concentration and junction depth pn diffused junctionsRang, ToomasPhysica status solidi. A, Applied research1982 / p. K117-K119 : tab., joon https://www.ester.ee/record=b1562026*est

artikkel ajakirjas

314

artikkel kogumikus

Software-level TMR approach for on-board data processing in space applicationsJanson, Karl; Treudler, Carl Johann; Hollstein, Thomas; Raik, Jaan; Jenihhin, Maksim; Fey, Goerschwin21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 147-152 : ill https://doi.org/10.1109/DDECS.2018.00033

artikkel kogumikus

315

artikkel kogumikus

Sonda tektooniline rike Põhja-Kiviõli karjäärisSõstra, Ülo; Vaher, ReinXV aprillikonverentsi "Geoloogilise kaardistamise poolsajand" teesid : [30. märts 2007, Tallinn]2007 / lk. 37-39 : ill

artikkel kogumikus

316

artikkel kogumikus EST / artikkel kogumikus ENG

Special session: approximation and fault resiliency of DNN acceleratorsAhmadilivani, Mohammad Hasan; Barbareschi, Mario; Barone, Salvatore; Bosio, Alberto; Daneshtalab, Masoud; Torca, Salvatore Della; Gavarini, Gabriele; Jenihhin, Maksim; Raik, Jaan; Taheri, MahdiProceedings 2023 IEEE 41st VLSI Test Symposium (VTS)2023 / 10 p. : ill https://doi.org/10.1109/VTS56346.2023.10140043 Conference proceeding at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

317

artikkel kogumikus

Spectrum analysis additional vibrations of Cartesian robot by different control modesAutsou, Siarhei; Vaimann, Toomas; Rassõlkin, Anton; Kudelina, Karolina2022 18th Biennial Baltic Electronics Conference (BEC)2022 / 5 l. https://doi.org/10.1109/BEC56180.2022.9935595

artikkel kogumikus

318

artikkel kogumikus

Stator voltage analysis of frequency converter fed induction generator with broken rotor barsVaimann, Toomas; Belahcen, Anouar; Martinez, Javier; Kilk, Aleksander13th International Symposium "Topical Problems in the Field of Electrical and Power Engineering." Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 14-19, 20132013 / p. 249-251 : ill

artikkel kogumikus

319

artikkel kogumikus

Studing the impact of gearbox faults on the operations of the cartesian robotAutsou, Siarhei22nd International Symposium “Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology III : Pärnu, Estonia, August 23-26, 20232023 / p. 17-18 : ill https://www.ester.ee/record=b5570906*est

artikkel kogumikus

320

artikkel kogumikus

Study of overvoltages upon single-phase ground fault initialisation and arcing processes on MV networks with isolated neutralKütt, Lauri; Järvik, Jaan; Sepping, EinoThe 4th International Conference Electric Power Quality and Supply Reliability : August 29...31, 2004, Pedase, Estonia : proceedings2004 / p. 139-143 : ill

artikkel kogumikus

321

artikkel kogumikus

Study of transformer overvoltages under single-phase earth faults in 6...35 kV networks with insulated neutral point [Electronic resource]Janson, Kuno; Järvik, Jaan; Kalda, Heljut; Külm, Evald; Šklovski, JevgeniElectric Power Engineering 2003 : 5th International Scientific Conference : January 28-29, 2003, Beskydy Pension, Visalaje, Czech Republic : held by occasion of 25th Anniversary of Department of Electrical2003 / [17] p. : ill. [CD-ROM]

artikkel kogumikus

322

artikkel kogumikus

Suppression of voltage flicker by saturable reactor operating under forced magnetization [Electronic resource]Bolgov, Viktor; Järvik, JaanEUROCON 2007 : the International Conference on Computer as a Tool : September 9-12, 2007, Warsaw, Poland : proceedings2007 / p. 1417-1422 : ill. [CD-ROM] https://ieeexplore.ieee.org/document/4400513

artikkel kogumikus

323

artikkel ajakirjas

A survey of broken rotor bar fault diagnostic methods of induction motorAsad, Bilal; Vaimann, Toomas; Rassõlkin, Anton; Kallaste, Ants; Belahcen, AnouarScientific Journal of Riga Technical University. Electrical, control and communication engineering2018 / p. 117–124 : ill https://doi.org/10.2478/ecce-2018-0014

artikkel ajakirjas

324

artikkel ajakirjas EST / artikkel ajakirjas ENG

A survey on UAV computing platforms : a hardware reliability perspectiveAhmed, Foisal; Jenihhin, MaksimSensors2022 / art. 6286 https://doi.org/10.3390/s22166286 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

325

artikkel kogumikus

Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE2013 / p. 36-41 : ill [CD-ROM]

artikkel kogumikus

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