Otsing - TalTech teadusportaal

kuva

reasta

376

artikkel kogumikus

On using genetic algorithm for test generationBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 233-236 : ill

artikkel kogumikus

377

dissertatsioon

Optical detection methods for droplet microfluidic applications = Optilised tuvastusmeetodid tilkade mikrofluidiliste rakenduste jaoksPärnamets, Kaiser2023 https://doi.org/10.23658/taltech.31/2023 https://digikogu.taltech.ee/et/Item/ffb85150-fb85-4a7c-b130-0d7f2c3b7fb5 https://www.ester.ee/record=b5569973*est

dissertatsioon

Seotud publikatsioonid 3

378

artikkel kogumikus

Optimierte Steuerung der Fehlersuche auf digitalen LeiterplattenThomä, E.; Ubar, Raimund-JohannesProceedings of the 27th International Conference, Technical University of Ilmenau, October, 19821982 / p. 65-68

artikkel kogumikus

379

dissertatsioon

Optimization of built-in self-test in digital systems = Sisseehitatud enesetestimise optimeerimine digitaalsüsteemidesKruus, Helena2011

dissertatsioon

380

artikkel kogumikus

Optimization of memory-constrained hybrid BIST for testing core-based systemsJervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund-JohannesProceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 20072007 / p. 71-77 https://ieeexplore.ieee.org/document/4297319

artikkel kogumikus

381

artikkel kogumikus

Optimization of memory-constrained hybrid BIST for testing core-based systemsJervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund-JohannesInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 133-136 : ill

artikkel kogumikus

382

artikkel kogumikus

Optimization of the store-and-generate based built-in self-testUbar, Raimund-Johannes; Jervan, Gert; Kruus, Helena; Orasson, Elmet; Aleksejev, IgorBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 199-202 : ill

artikkel kogumikus

383

artikkel ajakirjas EST / artikkel ajakirjas ENG

Out-of-step protection based on discrete angle derivativesTealane, Marko; Kilter, Jako; Bagleybter, Oleg; Heimisson, Birkir; Popov, MarjanIEEE Access2022 / p. 78290-78305 https://doi.org/10.1109/ACCESS.2022.3193390 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

Seotud publikatsioonid 1

Future power system out-of-step protection concept utilizing synchronized phasor measurements = Tuleviku elektrisüsteemi faasimõõtmistel põhinev sünkronismikaotuskaitse kontseptsioon

384

artikkel ajakirjas

Overview about low-level and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 303-324 : ill http://dx.doi.org/10.2298/FUEE1103303U

artikkel ajakirjas

385

artikkel kogumikus

Overview about low-lewel and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesProceedings of the Reed-Muller 2011 Workshop : May 25-26, 2011, Tuusula, Finland2011 / p. 1-10 : ill https://scindeks-clanci.ceon.rs/data/pdf/0353-3670/2011/0353-36701103303U.pdf

artikkel kogumikus

386

artikkel kogumikus

Overview of e-learning environment for web-based study of testing and diagnostics of digital systemsJutman, Artur; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 5th European Workshop on Microelectronics Education, held in Lausanne, Switzerland, April 15-16, 20042004 / p. 253-258 : ill https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41

artikkel kogumikus

387

artikkel kogumikus

Overview of e-learning environment for web-based study of testing and diagnostics of digital systemsJutman, Artur; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich5th European Workshop on Microelectronics Education - EWME 2004, Lausanne, 20042004 / p. 173-176 https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41

artikkel kogumikus

388

artikkel kogumikus

Parallel critical path tracing fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanProceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 20182018 / p. 305-310 : ill https://doi.org/10.23919/MIXDES.2018.8436880

artikkel kogumikus

389

artikkel kogumikus

Parallel exact critical path tracing fault simulation with reduced memory requirementsDevadze, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Jutman, Artur4th International Conference on Design and Technology of Integrated Systems in Nanoscal Era : DTIS'09 : Cairo, Egypt, April 6-9, 20092009 / p. 155-160 : ill https://ieeexplore.ieee.org/document/4938046

artikkel kogumikus

390

artikkel kogumikus EST / artikkel kogumikus ENG

Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

391

artikkel kogumikus

Performance estimation of embedded applications on microcontrollersRuberg, Priit; Lass, Keijo; Liiv, Elvar; Ellervee, Peeter2017 IEEE Nordic Circuits and Systems Conference (NORCAS 2017): NORCHIP and International Symposium of System-on-Chip (SoC 2017) : Linkoping, Sweden, 23-25 October, 20172017 / p. 170-175 : ill http://dx.doi.org/10.1109/NORCHIP.2017.8124964

artikkel kogumikus

392

artikkel kogumikus

Performance testing of frost damage model by hygrothermal simulationIlomets, Simo; Kalamees, Targo; Raado, Lembi-MerikeProceedings of the 5th International Building Physics Conference (IBPC) : Kyoto, Japan, May 28-31, 20122012 / p. 73-80 : ill

artikkel kogumikus

393

artikkel ajakirjas

PilvtestimisestLeis, PaulA & A2010 / 3, lk. 3-4 : ill https://artiklid.elnet.ee/record=b2183722*est

artikkel ajakirjas

394

artikkel kogumikus

Post-silicon validation of IEEE 1687 reconfigurable scan networksDamljanovic, Aleksa; Jutman, Artur; Squillero, Giovanni; Tšertov, Anton2019 IEEE European Test Symposium (ETS) : proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791546

artikkel kogumikus

395

artikkel kogumikus

Precision force and move measurement systems in tribotechnical testing of journal bearingsTamre, MartSympozium naukowe : Mechatronica '92, Warsawa, 19921992

artikkel kogumikus

396

artikkel ajalehes

Prillid eelmisest sajandist viska prügikasti : [TTÜ füüsikalaboris testiti päikeseprille]Heinsoo, EnnÄripäev2006 / 7. juuli, Puhkepäev, lk. 30-31 https://www.aripaev.ee/uudised/2006/07/06/prillid-eelmisest-sajandist-viska-prugikasti

artikkel ajalehes

397

artikkel ajakirjas EST / artikkel ajakirjas ENG

Procedure for implementing new materials to the component additive methodMäger, Katrin Nele; Just, Alar; Schmid, Joachim; Werther, Norman; Klippel, Michael; Brandon, Daniel; Frangi, AndreaFire safety journal2019 / p. 149-160 : ill https://doi.org/10.1016/j.firesaf.2017.09.006 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

398

artikkel kogumikus

Product platform modularization for test adaptersSarkans, Martinš; Roosimölder, LembitOST-03 Symposium on Machine Design2003 / p. 100-106

artikkel kogumikus

399

artikkel kogumikus

Production quality related propagating faults of induction machinesKudelina, Karolina; Asad, Bilal; Vaimann, Toomas; Rassõlkin, Anton; Kallaste, Ants2020 XI International Conference on Electrical Power Drive Systems (ICEPDS), Saint-Petersburg, Russia, October 4-7, 20202020 / p. 311-315 : ill https://doi.org/10.1109/ICEPDS47235.2020.9249355

artikkel kogumikus

Seotud publikatsioonid 1

Artificial intelligence driven approaches for fault prognostics of electrical machines using vibration spectrum analysis = Tehisintellektil põhinevad lähenemisviisid elektrimasinate rikete prognoosimiseks vibratsioonispektri analüüsi abil

400

artikkel kogumikus

Proficiency testing in the area of measuring instruments belonging to verificationKulderknup, Edi; Laaneots, ReinProc. 12th International Metrology Congress : Lyon, France2005 / [6] p

artikkel kogumikus

testimine (märksõna)

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