Otsing - TalTech teadusportaal

kuva

reasta

301

artikkel kogumikus

Mapping physical defects to logic level for defect oriented testingUbar, Raimund-JohannesSCS 2003 : International Symposium on Signals, Circuits and Systems : July 10-11, 2003, Iasi, Romania : proceedings. Vol. 22003 / p. 453-456 : ill https://ieeexplore.ieee.org/document/5731320

artikkel kogumikus

302

artikkel ajakirjas

Material characterization for laminated glass composite panelVäer, Kaur; Anton, Johan; Klauson, Aleksander; Eerme, Martin; Õunapuu, Erko; Tšukrejev, PavelJournal of achievements in materials and manufacturing engineering2017 / p. 11-17

artikkel ajakirjas

303

artikkel kogumikus

MCM-testMagnhagen, Bengt; Linden, HenricBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 297-304: ill

artikkel kogumikus

304

artikkel kogumikus

Measuring mining influence in the form of students practice in opposition to the emotional environmental impact assessmentRobam, Karin; Väizene, Vivika; Anepaio, Ain; Kolats, Margit; Valgma, Ingo5th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology : Kuressaare, January 14-19, 20082008 / p. 62-65 : ill

artikkel kogumikus

305

artikkel ajakirjas

Meie igapäevane testimineMarkvardt, MailiA & A2010 / 3, lk. 5-11 https://artiklid.elnet.ee/record=b2183723*est

artikkel ajakirjas

306

artikkel kogumikus

A method for crosstalk fault detection in on-chip busesBengtsson, Tomas; Jutman, Artur; Ubar, Raimund-Johannes; Kumar, ShashiNorchip : proceedings : Oulu, Finland, 21-22 November 20052005 / p. 285-288 : ill https://doi.org/10.1109/NORCHP.2005.1597045

artikkel kogumikus

307

artikkel kogumikus

A method for identification dynamic parameters of mixed signal circuitsZagursky, V.; Semyonova, N.; Gertners, A.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 211-215 https://www.ester.ee/record=b2150914*est

artikkel kogumikus

308

artikkel kogumikus

A method for testing dynamic characteristics of analog-digital converters in spectral domainZagursky, V.; Semyonova, N.; Gertners, A.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 207-210 https://www.ester.ee/record=b2150914*est

artikkel kogumikus

309

artikkel kogumikus

Method for testing the brainHinrikus, Hiie; Bachmann, Maie; Lass, Jaanus; Tuulik, Viiu; Ubar, Raimund-Johannes5th European Conference of the International Federation for Medical and Biological Engineering : 14-18 September 2011, Budapest, Hungary2012 / p. 1198-1201 : ill

artikkel kogumikus

310

artikkel kogumikus

Microprocessor-based system test using debug interfaceDevadze, Sergei; Jutman, Artur; Tšertov, Anton; Instenberg, Martin; Ubar, Raimund-Johannes26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings2008 / p. 98-101 : ill http://dx.doi.org/10.1109/NORCHP.2008.4738291

artikkel kogumikus

311

artikkel kogumikus

Microprogrammed test generator for bus oriented devicesSzegi, A.; Feher, B.Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section A. Section M / Tallinn Technical University1992 / p. 88-94: ill

artikkel kogumikus

312

artikkel kogumikus

Mikroelektroonika kiipide testimise tarkvara turbo-tester : kommentaar Eesti Teaduste Akadeemia Bernhard Schmidti preemia pälvinud tööleRaik, JaanTallinna Tehnikaülikooli aastaraamat 20072008 / lk. 275-278

artikkel kogumikus

313

artikkel ajakirjas

Milleks ja kuidas katsetada laevu?Hartikainen, AnniPaat & Meremees2016 / lk. 30 http://www.ester.ee/record=b4471304*est

artikkel ajakirjas

314

artikkel ajakirjas

Milline on parim hiir? : [TTÜ tootearenduse tudengid testisid arvutihiiri]Toon, Triin; Matsi, Birthe; Otto, TaunoArvutikasutaja2005 / 8, lk. 34-37 : ill https://artiklid.elnet.ee/record=b1050729*est

artikkel ajakirjas

315

artikkel ajalehes

Milline pann osta? Kas odav pann teeb töö ära sama hästi kui kallis?Arndt-Kalju, Margit; Kirikal, Siiri; Skuin, Mari; Tarkmeel, Krõõtdelfi.ee2023 Milline pann osta? Kas odav pann teeb töö ära sama hästi kui kallis?

artikkel ajalehes

316

artikkel kogumikus

Minimization of the high-level fault model for microprocessor control parts [Online resource]Ubar, Raimund-Johannes; Oyeniran, Adeboye Stephen; Medaiyese, OlusijiBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p.: ill https://doi.org/10.1109/BEC.2018.8600980

artikkel kogumikus

317

artikkel ajalehes

Mis on head ja halba Bioestis? : [prof. Anti Viikna TTÜ teadlaste korraldatud testist]Viikna, Anti; Luts, EvaPostimees1996 / 12. nov., Kasu, lk. 3

artikkel ajalehes

318

artikkel kogumikus

Mixed-level defect simulation in data-paths of digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, Marina23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 617-620 : ill https://ieeexplore.ieee.org/document/1003333

artikkel kogumikus

319

artikkel kogumikus EST / artikkel kogumikus ENG

Model based approach for testing: distributed real-time systems augmented with online monitorsPal, Deepak; Vain, JüriDatabases and Information Systems : 13th International Baltic Conference, DB&IS 2018, Trakai, Lithuania, July 1-4, 2018 : proceedings2018 / p. 142-157 https://doi.org/10.1007/978-3-319-97571-9_13 Conference proceedings at Scopus Article at Scopus

artikkel kogumikus EST / artikkel kogumikus ENG

320

artikkel kogumikus

Model based framework for testing distributed systemsPal, Deepak; Vain, JüriProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 91-94 : ill

artikkel kogumikus

321

artikkel kogumikus

Model based testing of distributed time critical systemsVain, Jüri; Kanter, Gert; Srinivasan, Seshadhri2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO 2017) : Noida, India 20-22 September 20172017 / p. 99-105 : ill https://doi.org/10.1109/ICRITO.2017.8342406

artikkel kogumikus

322

artikkel kogumikus

Model of fracture micromechanism of Cu-Cr-Zr system by "in-situ" test in SEMBesterci, Michal; Ivan, Jozef; Kulu, Priit; Arensburger, Daniil; Velgosova, OksanaProceedings of 9th International Scientific Conference "Adhievements in Mechanical & Materials Engineering" : Gliwice, Poland, 11.-14.10.20002000 / p. 59-62 https://doiserbia.nb.rs/img/doi/1450-5339/2003/1450-53390304499B.pdf

artikkel kogumikus

323

dissertatsioon

Model synthesis from VHDL for the functional test generation systemKrupnova, Helena1993 https://www.ester.ee/record=b2090509*est

dissertatsioon

324

artikkel kogumikus

Model-based integration testing of ROS packages : a mobile robot case studyErnits, Juhan-Peep; Halling, Evelin; Kanter, Gert; Vain, Jüri2015 European Conference on Mobile Robots : Lincoln, United Kingdom, September 2-4, 2015 : conference proceedings2015 / [7] p. : ill http://dx.doi.org/10.1109/ECMR.2015.7324210

artikkel kogumikus

325

artikkel kogumikus

Model-based synthesis of reactive planning on-line testers for non-deterministic embedded systemsKääramees, Marko; Vain, Jüri; Raiend, KulloBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 189-192 : ill

artikkel kogumikus

testimine (märksõna)

teaviku laadid

märksõna 1

võtmesõna 1