Otsing - TalTech teadusportaal

kuva

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701

artikkel kogumikus

Variability of high voltage circuit breaker performance parameters for condition monitoringAsefi, Sajjad; Kiitam, Ivar; Manninen, Henri; Kilter, Jako; Tealane, Marko; Landsberg, MartInternational Conference on Condition Monitoring, Diagnosis and Maintenance 2023 - CMDM 2023 (7th edition), Bucharest, Romania, October 31th - November 2nd, 2023 : proceedings2023 / p. 1-10

artikkel kogumikus

702

raamat

Water hammer and column separation due to accidential simultaneous closure of control valves in a large scale two-phase flow experimental test rigBergant, Anton; Westende, Jos M.C.van't; Koppel, Tiit; Gale, Janez; Hou, Qingzhi; Pandula, Zoltan; Tijsseling, Arris S.2010 https://www.researchgate.net/publication/280624441_Water_hammer_and_column_separation_due_to_accidental_simultaneous_closure_of_control_valves_in_a_large-scale_two-phase_flow_experimental_test_rig

raamat

703

artikkel kogumikus

Water hammer and column separation due to accidential simultaneous closure of control valves in a large scale two-phase flow experimental test rigBergant, Anton; Westende, Jos M.C.van't; Koppel, Tiit; Gale, Janez; Hou, Qingzhi; Pandula, Zoltan; Tijsseling, Arris S.Proceedings of the ASME 2010 Pressure Vessels & Piping Division/K-PVP Conference : PVP2010 : July 18-22, 2010, Bellevue, Washington, USA2010 / [10] p.: ill https://www.researchgate.net/publication/280624441_Water_hammer_and_column_separation_due_to_accidental_simultaneous_closure_of_control_valves_in_a_large-scale_two-phase_flow_experimental_test_rig

artikkel kogumikus

704

artikkel kogumikus

Ways for board and system test to benefit from FPGA embedded instrumentationEhrenberg, Heiko; Odintsov, Sergei; Devadze, Sergei; Jutman, Artur; Aleksejev, Igor; Wenzel, Thomas2019 IEEE AUTOTESTCON2019 / 10 p : ill https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057

artikkel kogumikus

705

artikkel kogumikus

Web based tools for synthesis and testing of digital devicesDevadze, Sergei; Jutman, Artur; Kruus, Margus; Sudnitsõn, Aleksander; Ubar, Raimund-JohannesProceedings of the International Conference on Computer Systems and Technologies (e-Learning) : CompSysTech'2002, Sofia, Bulgaria, 20-21 June2002 / p. 1.9-1 - 1.9-6 : ill https://www.researchgate.net/publication/250738271_Web_Based_Tools_for_Synthesis_and_Testing_of_Digital_Devices

artikkel kogumikus

706

artikkel kogumikus

Web services testing in e-learning environmentsÕunapuu, Enn; Tepandi, JaakSecond International Conference on Multimedia and Information & Communication Technologies in Education (m-ICTE 2003) : Badajoz, Spain, 20032003 / p. 1170-1177

artikkel kogumikus

707

artikkel kogumikus

Web-based environment for digital electronics test toolsIvask, Eero; Raik, Jaan; Ubar, Raimund-Johannes; Schneider, AndreVirtual Enterprises and collaborative networks : IFIP 18th World Computer Congress [and] TC5/WG5.5 - 5th Working Conference on Virtual Enterprises : 22-27 August 2004, Toulouse, France2004 / p. 435-442 : ill https://link.springer.com/chapter/10.1007/1-4020-8139-1_46

artikkel kogumikus

708

artikkel kogumikus

Web-based framework for parallel distributed test [Electronic resource]Ivask, Eero; Raik, Jaan; Ubar, Raimund-Johannes2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 20082008 / p. 271-274 : ill. [CD-ROM] https://ieeexplore.ieee.org/document/4538800

artikkel kogumikus

709

artikkel ajalehes

WebTT - digitaalskeemide testimine ja diagnostikaalaste õppelaborite e-keskkond : [TTÜ arvutitehnika instituut esitles e-Ülikooli konverentsil kolme õppetöös kasutatavat süsteemi]Robal, Tarmo; Orasson, ElmetMente et Manu2005 / 5. mai, lk. 5 : fot https://www.ester.ee/record=b1242496*est

artikkel ajalehes

710

artikkel kogumikus

Verification of new 1000 [degree] C tester designed for investigation of wear-corrosion properties of advanced materials for high temperature applicationsAntonov, Maksim; Hussainova, Irina; Kimmari, Eduard; Juhani, KristjanProceedings of the 6th International Conference of DAAAM Baltic "Industrial Engineering" : 24-26th April 2008, Tallinn, Estonia. [2]2008 / p. 395-399 : ill http://innomet.ttu.ee/daaam08/online/Materials%20Engineering/Antonov.pdf

artikkel kogumikus

711

artikkel kogumikus

Verification of the test qualityMatrosova, Anjela; Bochun, TatianaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 307-310: ill

artikkel kogumikus

712

artikkel kogumikus

Verification, testing and validation of rule-based expert systemsTepandi, JaakPreprints 11th IFAC World Congress "Automatic Control in the Service of Mankind" : Tallinn, Estonia, USSR, August 13-17, 1990. Vol. 71990 / p. 162-167

artikkel kogumikus

713

artikkel kogumikus

VHDL based test generation systemJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 19981998 / p. 145-148

artikkel kogumikus

714

artikkel kogumikus

VHDL design debug framework based on zamiaCADTihhomirov, Valentin; Tšepurov, Anton; Saif Abrar, Syed; Jenihhin, Maksim; Raik, JaanDATE 2013 : Design Automation and Test in Europe, March 18-22, 2013, Grenoble, France2013 / [1] p. : ill

artikkel kogumikus

715

artikkel kogumikus

VILAB test generation tools running under the MOSCITO systemSchneider, Andre; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesVILAB User Forum : Györ, Hungary, 20012001 / [12] p

artikkel kogumikus

716

artikkel ajalehes

Õpilastele tarnib kiirteste uus firmaHussar, KaroliinaEesti Päevaleht2021 / Lk. 7 https://dea.digar.ee/article/eestipaevaleht/2021/11/24/7.5

artikkel ajalehes

717

artikkel ajakirjas

Über einige Probleme der Testsatzanalyse für digitale SystemeUbar, Raimund-JohannesWissenschaftliche Zeitschrift1976 / p. 447-449 https://www.ester.ee/record=b1516616*est

artikkel ajakirjas

718

artikkel ajakirjas

Über einige Probleme der Testsatzanalyse für digitale SystemeUbar, Raimund-JohannesNachrichtentechnik, Elektronik : technisch-wissenschaftlishe Zeitschrift für die gesamte elektronische Nachrichtentechnik1977 / p. 149-150 https://www.ester.ee/record=b1550811*est

artikkel ajakirjas

719

artikkel kogumikus

Алгоритм оценки качества вероятностного тестирования цифровых схемGrigorjeva, KsenjaМашинное проектирование электронных устройств и систем1989 / с. 97-103

artikkel kogumikus

720

artikkel ajakirjas

Анализ диагностических тестов для комбинационных цифровых схем методом обратного прослеживания неисправностейUbar, Raimund-JohannesАвтоматика и телемеханика1977 / с. 168-176 https://www.ester.ee/record=b1515055*est

artikkel ajakirjas

721

artikkel kogumikus

Анализ методов тестирования микропроцессоровToomsalu, ArvoСинтез и диагностика цифровых устройств и систем1982 / с. 53-62 : илл https://www.ester.ee/record=b1328194*est https://digikogu.taltech.ee/et/Item/febd586e-d7fa-4fbd-bf41-40576a75f94b

artikkel kogumikus

722

artikkel ajalehes

В волости Раэ тестируют беспилотные автобусыStolitsa.ee2023 В волости Раэ тестируют беспилотные автобусы

artikkel ajalehes

723

artikkel ajalehes

В Ласнамяэ до 29 апреля можно прокатиться на беспилотном автобусе [Online resource]rus.err.ee2022 "В Ласнамяэ до 29 апреля можно прокатиться на беспилотном автобусе"

artikkel ajalehes

724

artikkel kogumikus

Вероятностное тестирование цифровых схем и альтернативные графыUbar, Raimund-JohannesМашинное проектирование электронных устройств и систем1989 / с. 89-96

artikkel kogumikus

725

artikkel kogumikus

Генерирование групповых тестов для цифровых схем на модели альтернативных графовKivi, E.; Ubar, Raimund-JohannesТезисы докладов XXXI студенческой научно-технической конференции1980 / с. 52-55 https://www.ester.ee/record=b1319482*est

artikkel kogumikus

testimine (märksõna)

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