Otsing - TalTech teadusportaal

kuva

reasta

576

artikkel ajakirjas

Tehnikaülikoolis on uus katseseade, mis võib välja panna Abramsi tanki kaaluEhitaja2023 / lk. 35 : fot https://www.ester.ee/record=b1072123*est https://artiklid.elnet.ee/record=b2904596*est

artikkel ajakirjas

577

artikkel kogumikus

Temporally extended high-level decision diagrams for PSL assertions simulationJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesProceedings : Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May 2008, Verbania, Italy2008 / p. 61-68 : ill https://ieeexplore.ieee.org/document/4556029

artikkel kogumikus

578

artikkel kogumikus

Tension stiffening model based on test data of RC beamsIdnurm, Siim; Bacinskas, Darius; Gribniak, Viktor; Sokolov, Aleksandr; Kaklauskas, GintarisThe 10th International Conference "Modern Building Materials, Structures and Techniques" : May 19-21, 2010, Lithuania : selected papers2010 / p. 810-814 : ill https://www.researchgate.net/publication/265635200_Tension-stiffening_model_based_on_test_data_of_RC_beams

artikkel kogumikus

579

artikkel ajakirjas

10th IEEE European Test SymposiumUbar, Raimund-Johannes; Prinetto, Paolo; Raik, JaanIEEE journal of design & test of computers2005 / p. 480-481 : phot http://dx.doi.org/10.1109/MDT.2005.106

artikkel ajakirjas

580

artikkel kogumikus

"Tervis ruudus", ehk, Tippkeskuse CEBE luguUbar, Raimund-JohannesTeadusmõte Eestis (X). Tehnikateadused. 3 : [artiklikogumik]2019 / lk. 200-215 : ill., fot https://www.ester.ee/record=b5208765*est

artikkel kogumikus

581

artikkel kogumikus

Test cost minimization for hybrid BISTJervan, Gert; Peng, Zebo; Ubar, Raimund-JohannesIEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings2000 / p. 283-298 : ill https://ieeexplore.ieee.org/abstract/document/887168

artikkel kogumikus

582

artikkel kogumikus

Test development and deployment tool-set for mixed-signal and digital devicesMellik, Andres; Raik, JaanBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 163-166 : ill

artikkel kogumikus

583

artikkel kogumikus

Test driven domain modellingPiho, Gunnar; Tepandi, Jaak; Parman, Marko; Puusep, Viljam; Roost, MartMIPRO 2011 : 34th International Convention on Information and Communication Technology, Electronics and Microelectronics : May 23-27, 2011, Opatija, Croatia : proceedings2011 / p. 576-581 https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5967121

artikkel kogumikus

584

artikkel kogumikus

Test generation for control faults in digital systemsDušina, Julia; Brik, MarinaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 325-330: ill

artikkel kogumikus

585

artikkel kogumikus

Test generation for digital systemsUbar, Raimund-JohannesDigest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy1983 / p. 374-377

artikkel kogumikus

586

artikkel kogumikus

Test generation for digital systems at functional levelUbar, Raimund-Johannes; Kuchcinski, Ktzysztof; Peng, Z.Research report LiTH-IDA-R-90-06, Linköping University, Sweden1990 / p. 1-21

artikkel kogumikus

587

artikkel kogumikus

Test generation for finite state machinesUbar, Raimund-Johannes; Brik, MarinaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 233-236: ill

artikkel kogumikus

588

artikkel kogumikus

Test generation for microprocessor control mechanismsLohuaru, Tõnu; Ubar, Raimund-JohannesFTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)1987 / p. 305-311

artikkel kogumikus

589

artikkel kogumikus

Test generation for microprocessors on alternative graphsAlango, Villem; Kont, Toomas; Ubar, Raimund-Johannes33. Internationales Wissenschaftliches Kolloquium : 24.-28.10.1988. H.3 Vortragsreihe B, technische und angewandte Informatik/Computertechnik1988 / p. 11-14

artikkel kogumikus

590

artikkel kogumikus

Test generation for sequential digital systems based on symbolic simulationSkobtsov, Vadim; Skobtsov, Yu.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 341-344: ill

artikkel kogumikus

591

artikkel kogumikus

Test generation techniques and algorithmsUbar, Raimund-Johannes; Gramatova, Elena; Fisherova, MariaHandbook of testing electronic systems2005 / p. 99-173 : ill

artikkel kogumikus

592

artikkel kogumikus

Test generation with structurally synthesized BDD modelsRaik, Jaan; Ubar, Raimund-JohannesProceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 19981998 / p. 66-68

artikkel kogumikus

593

artikkel kogumikus

Test method for determining radiation absorptivity and emissivity coefficients of ACSR conductorsKiitam, Ivar18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]2019 / p. 185-186 : ill https://www.ester.ee/record=b5183874*est

artikkel kogumikus

594

artikkel ajakirjas

Test method for the total content of non-volatile phenols in wastewaterJohannes, Ille; Mölder, Leevi; Tiikma, LaineOil shale1998 / 3, p. 232-238

artikkel ajakirjas

595

artikkel kogumikus

Test pattern generation at the behavioral level from VHDL circuit description containing several processesGramatova, Elena; Bezakova, Jana; Cibakova, TatianaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 145-148

artikkel kogumikus

596

dissertatsioon

Test program generation for microprocessor systemsDušina, Julia1993 https://www.ester.ee/record=b2090526*est

dissertatsioon

597

artikkel kogumikus

Test scenario generator learning for model-based testing of mobile robotsKanter, Gert; Liibert, Marti IngmarSystem assurances : modeling and management2022 / p. 67-84 https://doi.org/10.1016/B978-0-323-90240-3.00005-9

artikkel kogumikus

598

artikkel ajakirjas EST / artikkel ajakirjas ENG

Test scenario specification language for model-based testingHalling, Evelin; Vain, Jüri; Boyarchuk, Artem; Illiashenko, OlegInternational Journal of Computing2019 / p. 408-421 : ill http://www.computingonline.net/computing/article/view/1611 https://doi.org/10.47839/ijc.18.4.1611 Journal metrics at Scopus Article at Scopus

artikkel ajakirjas EST / artikkel ajakirjas ENG

599

artikkel kogumikus

Test set minimization using bipartite graphsMarkus, Antti; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 175-178: ill

artikkel kogumikus

600

artikkel kogumikus

Test strategy for a 486 computer multichip moduleMagnhagen, BengtBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 339-340: ill

artikkel kogumikus

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