Otsing - TalTech teadusportaal

kuva

reasta

601

artikkel kogumikus

Test method for determining radiation absorptivity and emissivity coefficients of ACSR conductorsKiitam, Ivar18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]2019 / p. 185-186 : ill https://www.ester.ee/record=b5183874*est

artikkel kogumikus

602

artikkel ajakirjas

Test method for the total content of non-volatile phenols in wastewaterJohannes, Ille; Mölder, Leevi; Tiikma, LaineOil shale1998 / 3, p. 232-238

artikkel ajakirjas

603

artikkel kogumikus

Test pattern generation at the behavioral level from VHDL circuit description containing several processesGramatova, Elena; Bezakova, Jana; Cibakova, TatianaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 145-148

artikkel kogumikus

604

dissertatsioon

Test program generation for microprocessor systemsDušina, Julia1993 https://www.ester.ee/record=b2090526*est

dissertatsioon

605

artikkel kogumikus

Test scenario generator learning for model-based testing of mobile robotsKanter, Gert; Liibert, Marti IngmarSystem assurances : modeling and management2022 / p. 67-84 https://doi.org/10.1016/B978-0-323-90240-3.00005-9

artikkel kogumikus

606

artikkel ajakirjas EST / artikkel ajakirjas ENG

Test scenario specification language for model-based testingHalling, Evelin; Vain, Jüri; Boyarchuk, Artem; Illiashenko, OlegInternational Journal of Computing2019 / p. 408-421 : ill http://www.computingonline.net/computing/article/view/1611 https://doi.org/10.47839/ijc.18.4.1611 Journal metrics at Scopus Article at Scopus

artikkel ajakirjas EST / artikkel ajakirjas ENG

607

artikkel kogumikus

Test set minimization using bipartite graphsMarkus, Antti; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 175-178: ill

artikkel kogumikus

608

artikkel kogumikus

Test strategy for a 486 computer multichip moduleMagnhagen, BengtBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 339-340: ill

artikkel kogumikus

609

artikkel kogumikus

Test synthesis from register-transfer level descriptionsRaik, Jaan; Paomets, PriiduBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 311-314: ill

artikkel kogumikus

610

artikkel ajakirjas

Test time minimization for hybrid BIST of core-based systemsJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, MaksimJournal of computer science and technology2006 / 6, p. 907-912 : ill https://link.springer.com/article/10.1007/s11390-006-0907-x

artikkel ajakirjas

611

artikkel kogumikus

Test time minimization for hybrid BIST of core-based systemsJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, Maksim12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China2003 / p. 318-325 : ill https://link.springer.com/article/10.1007/s11390-006-0907-x

artikkel kogumikus

612

artikkel kogumikus

Test time minimization for hybrid BIST with test pattern broadcastingUbar, Raimund-Johannes; Jenihhin, Maksim; Jervan, Gert; Peng, ZeboIEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings2003 / p. 112-116 : ill https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf

artikkel kogumikus

613

artikkel kogumikus

Testability analysis for efficient register-transfer level test generation [Electronic resource]Nõmmeots, Tanel; Raik, Jaan; Ubar, Raimund-Johannes9th International Conference MIXDES 2002 : Mixed Design of Integrated Circuits and Systems, Wroclaw, Poland, 20-22 June 20022002 / [4] p. [CD-ROM]

artikkel kogumikus

614

artikkel kogumikus

Testability analysis of digital design verificationHahanov, V.; Kaminska, M.; Fomina, JelenaBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 171-174 : ill

artikkel kogumikus

615

artikkel kogumikus

Testability calculation for digital circuits with decision diagramsUbar, Raimund-Johannes3rd IEEE Latin American Test Workshop : LATW'02, Montevideu, Uruguay, February 10-13, 2002 : digest of papers2002 / p. 137-143 : ill https://dblp.org/rec/conf/latw/Ubar02.html

artikkel kogumikus

616

artikkel kogumikus

Testability guided hierarchical test generation with decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Nõmmeots, Tanel20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 20022002 / p. 265-271 https://www.semanticscholar.org/paper/Testability-Guided-Hierarchical-Test-Generation-Ubar-Raik/c6301ac35d003c92f3867f26e2e75b87e1ad9b47

artikkel kogumikus

617

artikkel kogumikus

Testentwurf für digitale Geräte mit Hilfe der AlternativgraphenVoolaine, Andrus; Pall, Martin; Plakk, MariFehler in Automaten1989 / S. 31-44 : Ill

artikkel kogumikus

618

artikkel kogumikus

Tester partitioning and synchronization algorithm for testing real-time distributed systemsPal, Deepak; Vain, JüriProceedings of the 10th Junior Researcher Workshop on Real-Time Computing : JRWRTC 2016 : Brest, France, October 19-21, 20162016 / p. 13-16 : ill http://jrwrtc2016.gforge.inria.fr/

artikkel kogumikus

619

raamat

Testid harjutamiseksTeichmann, Mare; Anton, Riina1997

raamat

620

artikkel kogumikus

Testieren der kommunikativen SprachkompetenzSerwuta, A.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 92-94

artikkel kogumikus

621

artikkel ajakirjas EST / artikkel ajakirjas ENG

Testing a method for evaluating the performance of coatings on end mills in semi-industrial conditionsLeemet, Tõnu; Allas, Jaanus; Madissoo, Marten; Adoberg, Eron; Saar, RandoAgronomy research2014 / p. 263-268 : ill https://www.cabidigitallibrary.org/doi/pdf/10.5555/20143184842 Journal metrics at Scopus Article at Scopus

artikkel ajakirjas EST / artikkel ajakirjas ENG

622

artikkel kogumikus

Testing as a means of consolidation of students' knowledgeShaymardanova, Sh.Kh.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 94-95

artikkel kogumikus

623

artikkel kogumikus

Testing beyond the SoCs in a lego styleTšertov, Anton; Jutman, Artur; Devadze, SergeiProceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 20102010 / p. 334-338 : ill https://ieeexplore.ieee.org/document/5742052

artikkel kogumikus

624

artikkel kogumikus

Testing different power system out-of-step detection algorithmsTealane, Marko18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]2019 / p. 199-200 : ill https://www.ester.ee/record=b5183874*est

artikkel kogumikus

625

artikkel kogumikus

Testing English for specific purposesTsaturova, I.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 100-102

artikkel kogumikus

testimine (märksõna)

teaviku laadid

märksõna 1

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