At-speed testing of inter-die connections of 3D-SICs in the presence of shore logic

autor
Chickermane, Vivek
Keller, Brion
Papameletis, Christos
Marinissen, Erik Jan
vastutusandmed
Konstantin Shibin, Vivek Chickermane, Brion Keller, Christos Papameletis, Erik Jan Marinissen
allikas
2015 Asian Test Symposium : ATS 2015 : 22-25 November 2015, Mumbai, Maharashtra, India : proceedings
ilmumiskoht
Los Alamitos
kirjastus/väljaandja
CPS
ilmumisaasta
leheküljed
p. 79-84 : ill
konverentsi nimetus, aeg
24th Asian Test Symposium ATS 2015, 22-25 November, 2015
konverentsi toimumispaik
Mumbai, India
ISBN
978-1-4673-9739-1
märkused
Bibliogr.: 26 ref
TTÜ struktuuriüksus
keel
inglise
Shibin, K., Chickermane, V., Keller, B., Papameletis, C., Marinissen, E.J. At-speed testing of inter-die connections of 3D-SICs in the presence of shore logic // 2015 Asian Test Symposium : ATS 2015 : 22-25 November 2015, Mumbai, Maharashtra, India : proceedings. Los Alamitos : CPS, 2015. p. 79-84 : ill. http://dx.doi.org/10.1109/ATS.2015.21