A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs
                                            author
                                    
                                    
                                
                                            statement of authorship
                                    
                                    
A.Benso, P.Prinetto, M.Rebaudengo, M.Sonza, R.Ubar
                                                    
                                            
                                            source
                                    
                                    
Proceedings IEEE European Design & Test Conference, Paris, March 17-20, 1997
                                                    
                                            
                                            location of publication
                                    
                                    
[S.l.]
                                                    
                                            
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
p. 560-565
                                                    
                                            
                                            language
                                    
                                    
inglise
                                                    
                                            
                            Benso, A., Prinetto, P., Rebaudengo, M., Sonza, M., Ubar, R. A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs // Proceedings IEEE European Design & Test Conference, Paris, March 17-20, 1997. [S.l.], 1997. p. 560-565.  https://ieeexplore.ieee.org/document/582417