An approach for verification assertions reuse in RTL test pattern generation
statement of authorship
Maksim Jenihhin, Jaan Raik, Hideo Fujiwara, Raimund Ubar, Taavi Viilukas
source
Digest of papers : IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010, Shanghai, China
location of publication
[Shanghai]
year of publication
pages
p. 107-110 : ill
conference name, date
IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010
conference location
Shanghai, China
subject term
notes
Bibliogr.: 25 ref
language
inglise
Jenihhin, M., Raik, J., Fujiwara, H., Ubar, R., Viilukas, T. An approach for verification assertions reuse in RTL test pattern generation // Digest of papers : IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010, Shanghai, China. [Shanghai], 2010. p. 107-110 : ill.