prindi

DefSim: measurement environment for CMOS defects

autor
Borejko, Tomasz
Jutman, Artur
Pleskacz, Witold A.
Ubar, Raimund-Johannes
vastutusandmed
T.Borejko, A.Jutman, W.A.Pleskacz, R.Ubar
allikas
2006 25th International Conference on Microelectronics : Belgrade, Serbia and Montenegro, 14-17 May 2006 : proceedings. Volume 2
ilmumiskoht
[Niš]
ilmumisaasta
2006
leheküljed
p. 679-682
leitav
https://ieeexplore.ieee.org/document/1651048
märksõna
integraallülitused
testimine
mõõtmine
vead
mikroelektroonika
keel
inglise
Borejko, T., Jutman, A., Pleskacz, W.A., Ubar, R.-J. DefSim: measurement environment for CMOS defects // 2006 25th International Conference on Microelectronics : Belgrade, Serbia and Montenegro, 14-17 May 2006 : proceedings. Volume 2. [Niš], 2006. p. 679-682. https://ieeexplore.ieee.org/document/1651048