Structural fault collapsing by superposition of BDDs for test generation in digital circuits
author
Ubar, Raimund-Johannes
Mironov, Dmitri
Raik, Jaan
Jutman, Artur
statement of authorship
R. Ubar, D.Mironov, J.Raik, A.Jutman
source
Proceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA
location of publication
Los Alamitos
publisher
IEEE Computer Society Press
year of publication
2010
pages
p. 250-257 : ill
conference name, date
11th International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010
conference location
San Jose, California USA
url
https://ieeexplore.ieee.org/document/5450451
subject term
digitaalintegraallülitused
testimine
vead
diagnostika (tehnika)
otsustusdiagrammid
ISBN
978-1-4244-6454-8
notes
Bibliogr.: 30 ref
language
inglise