Hierarchical test generation for complex digital systems with control and data processing parts
author
statement of authorship
R. Ubar, J. Raik
location of publication
[S.l.]
publisher
year of publication
pages
p. 43-52
subject term
language
inglise
Ubar, R., Raik, J. Hierarchical test generation for complex digital systems with control and data processing parts // "Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999. [S.l.] : SEMI, 1999. p. 43-52.